JPS6121994A - Vapor growth device - Google Patents
Vapor growth deviceInfo
- Publication number
- JPS6121994A JPS6121994A JP59139887A JP13988784A JPS6121994A JP S6121994 A JPS6121994 A JP S6121994A JP 59139887 A JP59139887 A JP 59139887A JP 13988784 A JP13988784 A JP 13988784A JP S6121994 A JPS6121994 A JP S6121994A
- Authority
- JP
- Japan
- Prior art keywords
- gas
- reactor
- growth
- substrate
- raw material
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B23/00—Single-crystal growth by condensing evaporated or sublimed materials
- C30B23/02—Epitaxial-layer growth
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
産業上の利用分野
本発明は、熱分解反応を利用し、多層成長層を得るため
の気相成長装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention relates to a vapor phase growth apparatus for obtaining multi-layered growth layers using a thermal decomposition reaction.
従来例の構成とその問題点
半導体装置を製作する上で必要な半導体結晶のエピタキ
シャル成長技術として、原料ガスの熱分解を利用した気
相成長法がある。たとえば、S s H4(モノシンン
)を用いたSi の気相成長法や、有機金Jli(アル
キル化物)を用いて化合物半導体結晶を成長する有機金
總気相成長法(MOCVD法)などである。これらの気
相成長装置においては、一般に基板を載置しているサセ
プターを加熱して、成長温度に保っている。そして原料
ガスは、基板表面上で熱分解反応して結晶が成長する。Conventional Structures and Problems There is a vapor phase growth method that utilizes thermal decomposition of raw material gas as an epitaxial growth technique for semiconductor crystals necessary for manufacturing semiconductor devices. Examples include a Si vapor phase epitaxy method using S s H4 (monosynthene), and an organic gold vapor phase epitaxy method (MOCVD method) for growing a compound semiconductor crystal using organic gold Jli (alkylated compound). In these vapor phase growth apparatuses, a susceptor on which a substrate is placed is generally heated and maintained at a growth temperature. Then, the source gas undergoes a thermal decomposition reaction on the substrate surface to grow crystals.
一方、半導体装置の複雑化に伴い、また半導体レーザな
どの光デバイスの作製上、異なる電気伝碑型の結晶層や
エネルギーギャップや屈M[などの特性の異なる結晶層
を多層にエピタキシャル成長する工程が必要となってき
た。例えば、India。On the other hand, as semiconductor devices become more complex, and in the production of optical devices such as semiconductor lasers, the process of epitaxially growing multiple layers of crystal layers with different electrolytic patterns, and crystal layers with different characteristics such as energy gap and bending M[ is required. It has become necessary. For example, India.
AsP四元混晶を活性層としたレーザでは、クラッド層
として、InGaAsP よりエネルギーギャップが
広く、屈折率の小さいInP層が用いられるため、In
P層とInGaAtzP 層の積層が必要となる。In a laser with an AsP quaternary mixed crystal active layer, an InP layer with a wider energy gap and lower refractive index than InGaAsP is used as the cladding layer.
A stack of a P layer and an InGaAtzP layer is required.
また、最近注目を集めている超格子構造デバイスでは、
一層の厚みが数十〜数百人の多層エピタキシャル成長が
必要不可欠である。例えばGaAs系多層量子井戸レー
ザをMOqVD法で作製する場合、GaAs層層とI’
J、GaAs層を交互に積層す°るため、従来はMの原
料であるトリエチルアルミニウム(TMA)の供給パル
プを開閉することによって成長層を切替えていた。しか
し、供給ノ(ルプからガス導入口までの距離があるため
、ガスの残留やガスの切替え後、供給量が安定するまで
時間を要することから、異なる成長結晶層の界面の急峻
性が得られなかった。超格子構造デバイスにとっては、
一層の厚みが数十〜数百人であるため、界面の急峻性は
数十Å以下、必要となってくる。In addition, superlattice structure devices, which have recently attracted attention,
Multilayer epitaxial growth with a thickness of several tens to hundreds of layers is essential. For example, when manufacturing a GaAs-based multilayer quantum well laser using the MOqVD method, the GaAs layer and I'
In order to stack the J and GaAs layers alternately, conventionally the growth layers were switched by opening and closing the supply pulp of triethylaluminum (TMA), which is the raw material for M. However, due to the distance from the supply nozzle to the gas inlet, it takes time for the gas to remain or for the supply amount to stabilize after switching the gas, making it difficult to obtain a steep interface between different growing crystal layers. No. For superlattice structure devices,
Since the thickness of one layer is several tens to hundreds of layers, the steepness of the interface must be several tens of angstroms or less.
そこで、第1図に示すような、2つの成長室をもつ気相
成長装置(特開昭57−27016号)が考えられた。Therefore, a vapor phase growth apparatus (Japanese Unexamined Patent Publication No. 57-27016) having two growth chambers as shown in FIG. 1 was devised.
すなわち、それぞれの成長室100.2oOで、異なる
結晶が成長するように原料ガスを常に流しておき、基板
3ooを回転させて、2つの成長室100,200を往
来きさせる仁とによシ、多層エピタキシャル成長を行う
ものである。That is, in each growth chamber 100.2oO, a raw material gas is constantly flowed so that different crystals grow, and the substrate 3oo is rotated to move back and forth between the two growth chambers 100, 200. This method performs multilayer epitaxial growth.
ところがこの気相成長装置では、成長室が成長結晶の種
類の数取上に必要となるため、反応炉が複雑、かつ大型
化してしまう。更に、竿導体結晶の気相成長に用いられ
る原料ガスの大部分は有毒、危険性の強いものであるた
め、反応炉の複雑、かつ大型化Fi、危険度を増すこと
になる。However, in this vapor phase growth apparatus, a growth chamber is required depending on the number of types of crystals to be grown, so the reactor becomes complicated and large. Furthermore, most of the raw material gases used in the vapor phase growth of the rod conductor crystal are poisonous and highly dangerous, which increases the complexity and size of the reactor and increases the degree of danger.
発明の目的
本発明は、異なる結晶成長用原料ガスを反応炉のガス流
方向にずらして反応炉に供給するとともに、原料ガスを
ずらして反応炉に供給している各々のガス導入口付近に
、基板を移動させて置くことにより、原料ガスを常に安
定に反応炉に供給でき、界面の急峻な多層構造のエピタ
キシャル成長結晶を得ることを目的とする。Purpose of the Invention The present invention provides a method for supplying different raw material gases for crystal growth to a reactor while being shifted in the gas flow direction of the reactor, and to supply gas inlet ports near each gas inlet that supplies the raw material gases to the reactor while shifting the raw material gases to the reactor. By moving the substrate, the raw material gas can be constantly and stably supplied to the reactor, and the purpose is to obtain an epitaxially grown crystal with a multilayer structure with steep interfaces.
発明の構成
本発明は、結晶成長用原料ガスを反応炉内に供給するた
めの複数個のガス導入管のガス導入口を反応炉内のガス
流方向にずらして設けるとともに、基板をガス流方向に
自存に動かすことができ、また各々のガス導入口付近で
、そのガス導入口よりも下流側のガス導入口から供給さ
れている原料ガ設けである気相成長装置である。Structure of the Invention The present invention provides gas inlet ports of a plurality of gas inlet pipes for supplying raw material gas for crystal growth into a reactor so as to be shifted in the gas flow direction in the reactor, and also provides a substrate in the gas flow direction. This is a vapor phase growth apparatus in which a raw material gas is supplied near each gas inlet and is supplied from a gas inlet downstream of the gas inlet.
実施例の説明
第1図に示すような本発明の一実施例であるMOCVD
装置を用いて、InP−InGaAsP多層量子井戸レ
ーザ作製する場合でもって本発明を詳述する。DESCRIPTION OF EMBODIMENTS MOCVD which is an embodiment of the present invention as shown in FIG.
The present invention will be described in detail with reference to a case where an InP-InGaAsP multilayer quantum well laser is manufactured using the apparatus.
まず、InP 基板1を載置した黒鉛製のサセプター2
を、Inの原料ガスであるトリエチルインジウム(TE
I )、及びPの原料ガスであるボスフィン(PH3
)を反応炉3に供給するガス導入管4のガス導入口5よ
りも上流側の図中の(ハ)の位置に置き、高周波加熱コ
イル6で、黒鉛製のサセプター2と共にInP基板1を
高周波加熱して結晶成長温度にまで昇温し、保温する。First, a graphite susceptor 2 on which an InP substrate 1 is placed
, triethyl indium (TE
I ), and bosfin (PH3
) is placed at the position (c) in the figure on the upstream side of the gas inlet 5 of the gas inlet pipe 4 that supplies the reactor 3, and the InP substrate 1 is heated together with the graphite susceptor 2 by the high frequency heating coil 6. Heat to raise the temperature to crystal growth temperature and keep warm.
次に基板操作具7でもってサセプター2と共にInP基
板1をガス導入口5付近の図中の(B)の位置にまで移
動させ、導入管9が設けてあシ、Ga の原料ガスであ
るトリエチルガリウム(TEG)、及びAsの原料ガス
であるアルシン(A s H3)が反応炉3に供給され
ている。これらガス導入口8から供給されるガスが、図
中中)の位置でのInP成長に影響を及ぼさない様にガ
ス導入口5と8の間隔(数(7)以上)を元号あけ、か
つ供給された原料ガスが反応炉a内を逆流しない様充分
なキャリアガス(不活性ガ入主に水素)をガス導入管1
0から供給しておくことが必要である。Next, the InP substrate 1 and the susceptor 2 are moved to the position (B) in the figure near the gas inlet 5 using the substrate handling tool 7, and the inlet pipe 9 is installed. Gallium (TEG) and arsine (As H3), which is a raw material gas for As, are supplied to the reactor 3. In order that the gases supplied from these gas inlet ports 8 do not affect the InP growth at the position shown in the middle of the figure, the gap between the gas inlet ports 5 and 8 (several (7) or more) is spaced apart, and Sufficient carrier gas (mainly hydrogen containing inert gas) is supplied to gas inlet pipe 1 so that the supplied raw material gas does not flow back inside reactor a.
It is necessary to supply from 0.
さて、InP層を成長後、基板操作具7でもってサセプ
ター2と共に基板1をガス導入口8付近の図中の(qの
位置にまで移動させて、InGaAsP層全約300層
成約300人成長、再び基板操作具7でもって基板1を
(B)の位置へ戻してInP層を約200人成長させる
。次にまた基板1を(qの位置に移してInGaAsP
Nを成長させる。・以上の工程を繰シ返してI nP
−I nGaAsP層の超格子構造を形成する。Now, after growing the InP layer, use the substrate handling tool 7 to move the substrate 1 together with the susceptor 2 to the position (q) in the figure near the gas inlet 8, and grow a total of about 300 InGaAsP layers. Return the substrate 1 to the position (B) using the substrate handling tool 7 again and grow about 200 InP layers. Next, move the substrate 1 again to the position (q) and grow an InGaAsP layer.
Grow N.・Repeat the above steps to obtain InP
- Form a superlattice structure of the InGaAsP layer.
この基板1の(B)と(qの位置の移動を高速に行なえ
ば、それたけ界面が急峻な積層を得ることができる。な
お反応後の排ガスは排気管11で排気される。If the positions (B) and (q) of the substrate 1 are moved at high speed, a laminated layer with a steeper interface can be obtained.The exhaust gas after the reaction is exhausted through the exhaust pipe 11.
このような本発明の一実施例である気相成長装置を用い
て異なる結晶成長用ガスを反応炉へ反応炉内のガス流方
向にずらして供給し、基板をそれぞれの原料ガスのガス
導入口付近に移動させて結晶成長を行なうことを高速に
くり返すことによって、界面の急峻な多層成長が、比較
的間車な装置で行なえる。Using such a vapor phase growth apparatus which is an embodiment of the present invention, different crystal growth gases are supplied to the reactor while being shifted in the gas flow direction in the reactor, and the substrate is connected to the gas inlet of each raw material gas. By repeating the process of moving the crystal nearby and growing the crystal at high speed, multilayer growth with a steep interface can be performed using relatively small equipment.
更に第3図は本発明の他の実施例として、縦型の反応炉
をもつMOCVD装置である。図中の各番号は第1図と
全く同じ機能を有するものである。Furthermore, FIG. 3 shows an MOCVD apparatus having a vertical reactor as another embodiment of the present invention. Each number in the figure has exactly the same function as in FIG. 1.
また、これまでInP−InGaAsP超格子構造のた
めの多層成長でもって不発明を説明したが、他にもGa
As−AQGaAsなどのような超格子構造や積層成長
を行なう気相成長装置にも、本発明を適用できる。また
、基板の加熱方式は、抵抗加熱、ランプ加熱方式でも構
わない。In addition, although the invention has been explained by multilayer growth for an InP-InGaAsP superlattice structure, there are also other GaAsP superlattice structures.
The present invention can also be applied to a superlattice structure such as As-AQGaAs or a vapor phase growth apparatus that performs stacked growth. Further, the substrate heating method may be a resistance heating method or a lamp heating method.
発明の効果
本発明による気相成長装置は、結晶成長用ガスを反応炉
へ、反応炉のガス流方向にずらして供給でき、基板をそ
れぞれの原料ガスのガス導入口付近に移動させて結晶成
長を行なうことができるため、基板の移動を高速にする
ことによって、界面が急峻な積層成長が比較的間車な装
置で行なえる。Effects of the Invention The vapor phase growth apparatus according to the present invention can supply the crystal growth gas to the reactor while being shifted in the gas flow direction of the reactor, and can perform crystal growth by moving the substrate near the gas inlet of each raw material gas. Therefore, by moving the substrate at high speed, laminated growth with a steep interface can be performed using relatively compact equipment.
また、基板の移動をくり返すことによって超格子構造の
作製にも応用できる。したがって半導体レーザのように
積層を必要とする素子や、超格子構造をもつ素子、例え
ば多層量子井戸し〜ザの結晶成長に本発明は用いられ、
特性の向上に効果がある。It can also be applied to the fabrication of superlattice structures by repeatedly moving the substrate. Therefore, the present invention can be used for crystal growth of devices such as semiconductor lasers that require lamination, and devices with a superlattice structure, such as multilayer quantum wells.
Effective in improving characteristics.
第1図は従来の2成長室をもつMOCV D装置の反応
炉部概略構造断面図、第2図は本発明の一実施例である
MOCVD装置の水平型反応炉部の概略構造断面図、第
3図は本発明の他の実施例である縦型の反応炉をもつM
OCVD装置の反応炉部概略構造断面図である。FIG. 1 is a schematic cross-sectional view of the reactor section of a conventional MOCVD apparatus having two growth chambers, and FIG. 2 is a schematic cross-sectional view of the horizontal reactor section of an MOCVD apparatus according to an embodiment of the present invention. Figure 3 shows M with a vertical reactor, which is another embodiment of the present invention.
FIG. 2 is a schematic cross-sectional view of the reactor section of the OCVD apparatus.
Claims (1)
のガス導入管のガス導入口を、前記反応炉内のガス流方
向にずらして設けるとともに、基板をガス流方向に自在
に動かすことができ、また各々の前記ガス導入口付近で
、前記ガス導入口よりも下流側のガス導入口から供給さ
れている原料ガスの影響を受けずに結晶成長できる位置
に止めることができる基板操作具を設けてなることを特
徴とする気相成長装置。Gas inlets of a plurality of gas inlet pipes for supplying raw material gas for crystal growth into the reactor are provided to be shifted in the gas flow direction in the reactor, and the substrate is freely moved in the gas flow direction. and can be stopped near each of the gas inlets at a position where crystal growth is possible without being affected by raw material gas supplied from a gas inlet downstream of the gas inlet. A vapor phase growth apparatus characterized by being provided with.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59139887A JPS6121994A (en) | 1984-07-05 | 1984-07-05 | Vapor growth device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59139887A JPS6121994A (en) | 1984-07-05 | 1984-07-05 | Vapor growth device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6121994A true JPS6121994A (en) | 1986-01-30 |
Family
ID=15255902
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59139887A Pending JPS6121994A (en) | 1984-07-05 | 1984-07-05 | Vapor growth device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6121994A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH033228A (en) * | 1989-05-30 | 1991-01-09 | Fujitsu Ltd | Semiconductor manufacturing apparatus |
| JPH05111546A (en) * | 1991-06-06 | 1993-05-07 | S T Chem Co Ltd | Halogen scavenger |
-
1984
- 1984-07-05 JP JP59139887A patent/JPS6121994A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH033228A (en) * | 1989-05-30 | 1991-01-09 | Fujitsu Ltd | Semiconductor manufacturing apparatus |
| JPH05111546A (en) * | 1991-06-06 | 1993-05-07 | S T Chem Co Ltd | Halogen scavenger |
| US5503768A (en) * | 1991-06-06 | 1996-04-02 | S.T. Chemical Co., Ltd. | Halogen scavengers |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Soga et al. | MOCVD growth of GaAs on Si substrates with AlGaP and strained superlattice layers | |
| JPH02283084A (en) | Manufacture of semiconductor laser | |
| JPS6121994A (en) | Vapor growth device | |
| JP3875298B2 (en) | Semiconductor light emitting device and manufacturing method thereof | |
| Scholz | MOVPE of Group‐III Heterostructures for Optoelectronic Applications | |
| CN1209861C (en) | Method for mixing organic gallium source selective zone growing indium-gallium-arsenic-phosphor multiple quantum well | |
| Olsen et al. | Double-barrel III-V compound vapor-phase epitaxy systems. | |
| JPH01175727A (en) | Selective buried growth of iii-v compound semiconductor | |
| US6245144B1 (en) | Doping control in selective area growth (SAG) of InP epitaxy in the fabrication of solid state semiconductor lasers | |
| US6627472B2 (en) | Semiconductor laser producing method | |
| JPH06140712A (en) | Manufacture of compound semiconductor device | |
| JPH08264886A (en) | Semiconductor laser device and manufacturing method thereof | |
| KR101996424B1 (en) | Laser diode and manufacturing method thereof | |
| JPS63102222A (en) | Epitaxial growth method | |
| JPH02188912A (en) | Selective growth method of iii-v compound semiconductor | |
| JP4862749B2 (en) | Method for fabricating III-V compound semiconductor optical device | |
| JPS621224A (en) | Semiconductor element structure | |
| JPS6179281A (en) | Manufacture of semiconductor laser | |
| JPH04369830A (en) | Compound semiconductor single crystal epitaxial substrate and growing method | |
| JP2001114592A (en) | Epitaxial growth method and wafer for film formation | |
| JPH0430578A (en) | Manufacture of semiconductor quantum box structure | |
| JPS60113420A (en) | Device for manufacturing semiconductor crystal | |
| JPS6355993A (en) | Manufacture of semiconductor light emitting device | |
| JPS63228787A (en) | Manufacture of semiconductor laser | |
| JPS63186418A (en) | Manufacture of compound semiconductor crystal layer |