JPS61225625A - 表面温度計測法 - Google Patents
表面温度計測法Info
- Publication number
- JPS61225625A JPS61225625A JP6813185A JP6813185A JPS61225625A JP S61225625 A JPS61225625 A JP S61225625A JP 6813185 A JP6813185 A JP 6813185A JP 6813185 A JP6813185 A JP 6813185A JP S61225625 A JPS61225625 A JP S61225625A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- temperature
- diffracted
- solid material
- intensity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
- G01K11/30—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using measurement of the effect of a material on X-radiation, gamma radiation or particle radiation
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6813185A JPS61225625A (ja) | 1985-03-29 | 1985-03-29 | 表面温度計測法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6813185A JPS61225625A (ja) | 1985-03-29 | 1985-03-29 | 表面温度計測法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61225625A true JPS61225625A (ja) | 1986-10-07 |
| JPH0545128B2 JPH0545128B2 (da) | 1993-07-08 |
Family
ID=13364878
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6813185A Granted JPS61225625A (ja) | 1985-03-29 | 1985-03-29 | 表面温度計測法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61225625A (da) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4995493B2 (ja) * | 2006-06-06 | 2012-08-08 | 一般財団法人電力中央研究所 | 温度測定装置、温度測定方法および電子顕微鏡 |
| JP5256334B2 (ja) * | 2011-10-11 | 2013-08-07 | 一般財団法人電力中央研究所 | 温度測定装置、温度測定方法および電子顕微鏡 |
-
1985
- 1985-03-29 JP JP6813185A patent/JPS61225625A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0545128B2 (da) | 1993-07-08 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US5588995A (en) | System for monitoring the growth of crystalline films on stationary substrates | |
| US3718757A (en) | Temperature monitoring | |
| US5880823A (en) | Method and apparatus for measuring atomic vapor density in deposition systems | |
| GB2238868A (en) | Silicon wafer temperature measurement by optical transmission monitoring. | |
| Bhusari et al. | Traveling wave method for measurement of thermal conductivity of thin films | |
| US3623813A (en) | Method for monitoring temperature variations of radiation-permeable substrates for supporting thin coatings applied by vacuum deposition | |
| US20050037499A1 (en) | Apparatus and method for determining temperatures at which properties of materials change | |
| CN103196773A (zh) | 一种在线测量pld薄膜化学计量比及各成分质量的装置 | |
| JPH0545128B2 (da) | ||
| JPS5992998A (ja) | 分子線結晶成長方法 | |
| US5122222A (en) | Frequency-domain analysis of RHEED data | |
| JP3600873B2 (ja) | 基板温度測定ユニット | |
| JPH01114727A (ja) | 放射温度測定装置 | |
| JPH10507834A (ja) | サファイア光学鏡を有する循環式冷却鏡露点湿度計 | |
| JP2001066197A (ja) | 顕微ラマン分光光度計を用いた温度測定方法 | |
| JP2734242B2 (ja) | ガス濃度モニタ方法及び装置 | |
| Hsu et al. | A high temperature fibre-optical displacement probe | |
| JPS6135516A (ja) | 半導体の熱処理制御方法 | |
| JPS63159740A (ja) | レ−ザフラツシユ法熱定数測定装置 | |
| JPH04239742A (ja) | 半導体装置製造における膜厚測定方法 | |
| JPH09138167A (ja) | 表面温度測定装置及びその測定方法 | |
| RU1806358C (ru) | Устройство дл определени температур фазовых превращений | |
| RU2024826C1 (ru) | Устройство для измерения коэффициентов поглощения и рассеяния ик-излучения | |
| JPH1019690A (ja) | 基板温度モニタ | |
| JPS61163192A (ja) | 真空蒸着装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |