JPS6160179U - - Google Patents

Info

Publication number
JPS6160179U
JPS6160179U JP14514484U JP14514484U JPS6160179U JP S6160179 U JPS6160179 U JP S6160179U JP 14514484 U JP14514484 U JP 14514484U JP 14514484 U JP14514484 U JP 14514484U JP S6160179 U JPS6160179 U JP S6160179U
Authority
JP
Japan
Prior art keywords
test device
lead
conductive rubber
attached
device body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14514484U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14514484U priority Critical patent/JPS6160179U/ja
Publication of JPS6160179U publication Critical patent/JPS6160179U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の1実施例を分離した形で示す
斜視図、第2図は側断面図、第3図はDIP型I
Cの斜視図、第4図は従来の試験具の側断面図で
ある。 図において、1はDIP型、2はIC本体、3
は外部リード、4は試験具、5,15は試験具本
体、6は試験具蓋、7,19,20は端子、7a
,19a,20aは端子座、7A,18はリード
支持溝、8,23はピン、16はIC装着凹部、
21,27は導電性ゴム板、25は押圧蓋をそれ
ぞれ示す。
Fig. 1 is a perspective view showing an embodiment of the present invention in separated form, Fig. 2 is a side sectional view, and Fig. 3 is a DIP type I
C is a perspective view, and FIG. 4 is a side sectional view of a conventional test device. In the figure, 1 is the DIP type, 2 is the IC body, and 3
is an external lead, 4 is a test device, 5 and 15 are test device bodies, 6 is a test device lid, 7, 19, and 20 are terminals, 7a
, 19a, 20a are terminal seats, 7A, 18 are lead support grooves, 8, 23 are pins, 16 is an IC mounting recess,
21 and 27 are conductive rubber plates, and 25 is a press lid, respectively.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 上面中央部にIC装着凹部を有する合成樹脂よ
りなる試験具本体は、該試験具本体の下面より垂
直に突出し、DIP型ICの外部リードの並列ピ
ツチに等しいピツチで並列した端子と、該IC装
着凹部の両側のリード支持部のそれぞれに、櫛形
に形成されたリード支持溝と、下面が該端子の上
部に接続する如くに該リード挿入溝内に固着され
た導電性ゴム板とを備え、該試験具本体に該DI
P型ICを装着した状態で、それぞれの該リード
支持部の上面を覆う如くに該試験具本体の外側方
向より回動可能に、該試験具本体に装着された合
成樹脂よりなる押圧蓋には、該外部リードのそれ
ぞれを、上方より圧接する導電性ゴム板が装着さ
れてなり、上下に対向した一対の該導電性ゴム板
が、それぞれの該外部リードを挟着するよう構成
されてなることを特徴とするDIP型ICの試験
具。
A test device main body made of synthetic resin having an IC mounting recess in the center of the upper surface protrudes vertically from the bottom surface of the test device main body, and has terminals arranged in parallel at a pitch equal to the parallel pitch of the external leads of a DIP type IC, and a terminal for mounting the IC. Each of the lead support parts on both sides of the recess is provided with a lead support groove formed in a comb shape, and a conductive rubber plate fixed in the lead insertion groove so that the lower surface is connected to the upper part of the terminal. The corresponding DI on the test device body
A pressing lid made of synthetic resin attached to the test device body is rotatable from the outside of the test device body so as to cover the top surface of each lead support when a P-type IC is attached. , a conductive rubber plate is attached that presses each of the external leads from above, and a pair of vertically opposed conductive rubber plates is configured to sandwich each external lead. A DIP type IC test device featuring:
JP14514484U 1984-09-26 1984-09-26 Pending JPS6160179U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14514484U JPS6160179U (en) 1984-09-26 1984-09-26

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14514484U JPS6160179U (en) 1984-09-26 1984-09-26

Publications (1)

Publication Number Publication Date
JPS6160179U true JPS6160179U (en) 1986-04-23

Family

ID=30703401

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14514484U Pending JPS6160179U (en) 1984-09-26 1984-09-26

Country Status (1)

Country Link
JP (1) JPS6160179U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007042372A (en) * 2005-08-02 2007-02-15 Smk Corp IC socket

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007042372A (en) * 2005-08-02 2007-02-15 Smk Corp IC socket

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