JPS6165367U - - Google Patents

Info

Publication number
JPS6165367U
JPS6165367U JP15069784U JP15069784U JPS6165367U JP S6165367 U JPS6165367 U JP S6165367U JP 15069784 U JP15069784 U JP 15069784U JP 15069784 U JP15069784 U JP 15069784U JP S6165367 U JPS6165367 U JP S6165367U
Authority
JP
Japan
Prior art keywords
output
burn
board
address counter
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15069784U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP15069784U priority Critical patent/JPS6165367U/ja
Publication of JPS6165367U publication Critical patent/JPS6165367U/ja
Pending legal-status Critical Current

Links

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  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案の一実施例の構成を示すブロ
ツク図と検査方法の説明図、第2図は第1図にお
ける探針機の拡大側面図、第3図は第1図におけ
る所要部の出力を示す波形図、第4図は第1図に
おけるコネクタとICソケツトとの配線対応図、
第5図a,bはこの考案の検査対象物品であるバ
ーンイン基板の平面図と側面図、第6図はバーン
イン基板の部分拡大図、第7図はICソケツトの
拡大斜視図、第8図は従来の検査装置を用いたバ
ーンイン基板の検査方法の説明図、第9図はバー
ンイン基板における短絡、断線の説明図である。 図中、1はバーンイン基板、2はICソケツト
、3はコネクタ、6はコネクタ端子、21は発振
回路、22はアドレスカウンタ、23はマルチプ
レクサ、24はラインドライバ、25はメモリ、
26は比較回路、27はストロボ回路、28は判
定回路、30は探針機、31は探針である。なお
、各図中の同一符号は同一または相当部分を示す
。
Fig. 1 is a block diagram showing the configuration of an embodiment of this invention and an explanatory diagram of the inspection method, Fig. 2 is an enlarged side view of the probe in Fig. 1, and Fig. 3 shows the relevant parts in Fig. 1. A waveform diagram showing the output, Figure 4 is a wiring correspondence diagram between the connector and IC socket in Figure 1,
Figures 5a and 5b are a plan view and a side view of a burn-in board, which is the object to be inspected in this invention, Figure 6 is a partially enlarged view of the burn-in board, Figure 7 is an enlarged perspective view of an IC socket, and Figure 8 is a FIG. 9 is an explanatory diagram of a burn-in board inspection method using a conventional inspection device, and FIG. 9 is an explanatory diagram of short circuits and disconnections in the burn-in board. In the figure, 1 is a burn-in board, 2 is an IC socket, 3 is a connector, 6 is a connector terminal, 21 is an oscillation circuit, 22 is an address counter, 23 is a multiplexer, 24 is a line driver, 25 is a memory,
26 is a comparison circuit, 27 is a strobe circuit, 28 is a determination circuit, 30 is a probe, and 31 is a probe. Note that the same reference numerals in each figure indicate the same or corresponding parts.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] バーイン基板のICソケツトの各接触子に接触
する探針を備えた探針機と、発振回路により駆動
されるアドレスカウンタと、このアドレスカウン
タの出力に応じあらかじめ定めた出力を出すマル
チプレクサと、このマルチプレクサの出力を前記
バーンイン基板のコネクタに印加するラインドラ
イバと、あらかじめ前記バーンイン基板のコネク
タとICソケツトとの配線対応パターンを記憶し
、前記アドレスカウンタの出力に応じた配線対応
パターンを出力するメモリと、前記探針機で得ら
れる出力と前記メモリの出力とを比較する比較回
路と、この比較回路の出力から前記バーンイン基
板の良否を判定する判定回路とからなることを特
徴とするバーンイン基板用検査装置。
A probe equipped with a probe that contacts each contact of an IC socket on a burn-in board, an address counter driven by an oscillation circuit, a multiplexer that outputs a predetermined output according to the output of this address counter, and this multiplexer. a line driver that applies the output of the address counter to the connector of the burn-in board; a memory that stores in advance a wiring correspondence pattern between the burn-in board connector and the IC socket and outputs a wiring correspondence pattern according to the output of the address counter; A burn-in board inspection device comprising: a comparison circuit that compares the output obtained by the probe with the output of the memory; and a determination circuit that determines the quality of the burn-in board based on the output of the comparison circuit. .
JP15069784U 1984-10-03 1984-10-03 Pending JPS6165367U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15069784U JPS6165367U (en) 1984-10-03 1984-10-03

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15069784U JPS6165367U (en) 1984-10-03 1984-10-03

Publications (1)

Publication Number Publication Date
JPS6165367U true JPS6165367U (en) 1986-05-06

Family

ID=30708838

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15069784U Pending JPS6165367U (en) 1984-10-03 1984-10-03

Country Status (1)

Country Link
JP (1) JPS6165367U (en)

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