JPS6190246U - - Google Patents
Info
- Publication number
- JPS6190246U JPS6190246U JP17611584U JP17611584U JPS6190246U JP S6190246 U JPS6190246 U JP S6190246U JP 17611584 U JP17611584 U JP 17611584U JP 17611584 U JP17611584 U JP 17611584U JP S6190246 U JPS6190246 U JP S6190246U
- Authority
- JP
- Japan
- Prior art keywords
- chip
- wafer
- probe card
- hairline
- aligning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第1図aとbは本考案実施例の平面図と正面図
、第2図はプローバ、テスター、マーカーの配置
を示すブロツク図、第3図はウエハの模式的平面
図、第4図はプローバの分解図、第5図aとbは
マーカーとウエハの相対位置を示す平面図と正面
図である。
図中、11はプローブカード、12はプローブ
カードの基板、13は針、14はガラス板、15
はヘアライン、16はウエハ、17はチツプ、1
8はパツド、をそれぞれ示す。
Figures 1a and b are a plan view and a front view of an embodiment of the present invention, Figure 2 is a block diagram showing the arrangement of a prober, tester, and marker, Figure 3 is a schematic plan view of a wafer, and Figure 4 is a prober. Figures 5a and 5b are top and front views showing the relative positions of the marker and wafer. In the figure, 11 is a probe card, 12 is a substrate of the probe card, 13 is a needle, 14 is a glass plate, 15
is hairline, 16 is wafer, 17 is chip, 1
8 indicates pads, respectively.
Claims (1)
ハのチツプの寸法に対応するヘアラインを設け、
チツプとプローブカードとの位置合せをチツプの
コーナーへヘアラインとを合致させることによつ
てなす構成としたことを特徴とする集積回路試験
装置。 The probe card used for wafer testing has a hairline that corresponds to the size of the wafer chip.
An integrated circuit testing device characterized in that a chip and a probe card are aligned by aligning a hairline with a corner of the chip.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1984176115U JPH0621242Y2 (en) | 1984-11-20 | 1984-11-20 | Integrated circuit test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1984176115U JPH0621242Y2 (en) | 1984-11-20 | 1984-11-20 | Integrated circuit test equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6190246U true JPS6190246U (en) | 1986-06-12 |
| JPH0621242Y2 JPH0621242Y2 (en) | 1994-06-01 |
Family
ID=30733712
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1984176115U Expired - Lifetime JPH0621242Y2 (en) | 1984-11-20 | 1984-11-20 | Integrated circuit test equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0621242Y2 (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57110946A (en) * | 1980-12-27 | 1982-07-10 | Seiko Epson Corp | Heating device for specimen |
| JPS5939934A (en) * | 1982-08-27 | 1984-03-05 | Yamaha Motor Co Ltd | Small-sized engine driven generator |
-
1984
- 1984-11-20 JP JP1984176115U patent/JPH0621242Y2/en not_active Expired - Lifetime
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57110946A (en) * | 1980-12-27 | 1982-07-10 | Seiko Epson Corp | Heating device for specimen |
| JPS5939934A (en) * | 1982-08-27 | 1984-03-05 | Yamaha Motor Co Ltd | Small-sized engine driven generator |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0621242Y2 (en) | 1994-06-01 |
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