JPS6199471A - Infrared image pickup device - Google Patents
Infrared image pickup deviceInfo
- Publication number
- JPS6199471A JPS6199471A JP59219845A JP21984584A JPS6199471A JP S6199471 A JPS6199471 A JP S6199471A JP 59219845 A JP59219845 A JP 59219845A JP 21984584 A JP21984584 A JP 21984584A JP S6199471 A JPS6199471 A JP S6199471A
- Authority
- JP
- Japan
- Prior art keywords
- scanning
- data
- picture elements
- sensitivity
- array
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000035945 sensitivity Effects 0.000 claims abstract description 18
- 230000003287 optical effect Effects 0.000 claims abstract description 15
- 238000012937 correction Methods 0.000 claims abstract description 12
- 238000001514 detection method Methods 0.000 claims description 20
- 230000004044 response Effects 0.000 claims description 5
- 230000003321 amplification Effects 0.000 claims 2
- 238000003199 nucleic acid amplification method Methods 0.000 claims 2
- 238000003491 array Methods 0.000 abstract description 3
- 238000000034 method Methods 0.000 description 7
- 238000003384 imaging method Methods 0.000 description 5
- 238000003331 infrared imaging Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- 230000002238 attenuated effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000009877 rendering Methods 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
Landscapes
- Transforming Light Signals Into Electric Signals (AREA)
Abstract
Description
【発明の詳細な説明】
（産業上の利用分野）
本発明は赤外線検出素子アレイを用いる走査方式の赤外
線撮像装置に関する。DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a scanning-type infrared imaging device using an array of infrared detection elements.
（従来の技術）
一般に、多数の赤外線検出素子を配列した検出索子アレ
イを用いて光電変換を行う赤外線撮像装置においては、
各検出素子ごとに光電変換効率の不均一性が大きいため
、この感度差を補正しなければ再生画像の信頼性は低い
。(Prior Art) Generally, in an infrared imaging device that performs photoelectric conversion using a detection probe array in which a large number of infrared detection elements are arranged,
Since there is great non-uniformity in photoelectric conversion efficiency for each detection element, the reliability of reproduced images is low unless this sensitivity difference is corrected.
従来、赤外線検出素子アレイの感度のばらつきを補正す
る方法として黒体炉等の基準光源を用い各素子に対応す
るアンプの利得を調整することにより見掛上感度を均一
にする方法がとられている。Conventionally, a method of correcting variations in sensitivity of an infrared detection element array has been to make the apparent sensitivity uniform by using a reference light source such as a blackbody furnace and adjusting the gain of the amplifier corresponding to each element. There is.
しかしこの方法では、信頼性の高い基準光源を用意しな
ければならず１ｇ子ごとに感度を補正するのは面倒であ
り、さらに、正確な感度補正を行っても素子アンプ系の
応答による再生画像のにじみ等を防止することはできな
いという欠点があった。However, with this method, a highly reliable reference light source must be prepared, and it is troublesome to correct the sensitivity for each gram.Furthermore, even with accurate sensitivity correction, the reproduced image is affected by the response of the element amplifier system. This method has a disadvantage in that it is not possible to prevent smearing and the like.
（発明の目的）
本発明の目的は、このような欠点を除くため、検査素子
アレイで水平走査と垂直走査を行い各走食データを比較
すること罠より、基準光源を用いずに走査段階で各素子
の感度補正ができ、さらに再生画像のにじみも防止した
赤外線撮像装置を提供することにある。(Object of the Invention) In order to eliminate such drawbacks, an object of the present invention is to perform horizontal scanning and vertical scanning with a test element array and compare the respective scanning data. It is an object of the present invention to provide an infrared imaging device that can correct the sensitivity of each element and also prevent blurring of reproduced images.
（発明の構成）
本発明の赤外線撮像装置は、一方向あるいはこの方向お
よびその直交方向の二方向に配列された赤外線検出素子
アレイと、この赤外線検出素子アレイ上に被撮像物から
の水平方向および垂直方向の光像を光学的に走査する光
走査手段と、この光走亙手段によって前記アレイから得
られた前記水平および垂直走査のデータを比較処理し前
記アレイの感度を補正する第１の補正手段と、前記アレ
イからの各出力を増幅する増幅手段と、これら増幅手段
の各出力を比較処理してその周波数応答による各出力の
差を補正する第２の補正手段とを含み構成される。(Structure of the Invention) The infrared imaging device of the present invention includes an infrared detection element array arranged in one direction or in two directions, this direction and a direction perpendicular to the infrared detection element array, and an infrared detection element array arranged on the infrared detection element array in the horizontal direction and from the object to be imaged. a light scanning means for optically scanning a vertical light image; and a first correction for correcting the sensitivity of the array by comparing and processing the horizontal and vertical scanning data obtained from the array by the light scanning means. an amplifying means for amplifying each output from the array; and a second correcting means for comparing and processing the respective outputs of these amplifying means and correcting a difference between the respective outputs due to their frequency responses.
（発明の原理）
本発明においては、赤外線検出素子アレイの構造として
、水平・垂直両方向（Ｌ字型もしくはＴ字型）に配列し
た構造のアレイと、光学系を改良して１次元に配列した
検出素子アレイを水平、垂直両方向に走査する構造のも
のと２種類考えられる。これらどちらかの構造によって
、水平走査と垂直走査を行い、たとえば垂直方向に配列
した素子アレイで検出した縦１素子分のデータと、同一
の外景を１素子で％直方向に走査したデータを比較する
ことにより、演出素子アレイの感度を補正し、又夕走査
領域にわたって目標物の温度勾配の激しい部分の周囲に
生じる再生Ｉｔｌｊ像のにじみを補正することができる
。(Principle of the Invention) In the present invention, the structure of the infrared detecting element array is an array arranged in both horizontal and vertical directions (L-shape or T-shape) and a one-dimensional array by improving the optical system. There are two types of structures that scan the detection element array both horizontally and vertically. Using either of these structures, horizontal scanning and vertical scanning are performed, and for example, data for one vertical element detected by an element array arranged vertically is compared with data obtained by scanning the same external scene in the perpendicular direction with one element. By doing so, it is possible to correct the sensitivity of the rendering element array and also to correct the blurring of the reproduced Itlj image that occurs around a portion of the target object with a large temperature gradient over the evening scanning region.
（実施例） 次に本発明の実施例について図面を参照して説明する。(Example) Next, embodiments of the present invention will be described with reference to the drawings.
第１図は本発明の第１の実施例のブロック図である。図
において、１は画素、２はアフォーカル光学系、３，４
は走査鏡、５は固定鏡、６．７は結像光学系、８は７レ
ーム、９は赤外線検出素子アレイ、１０は前前増幅器、
１１は主増幅器、１２はバイアス回路、１３は走査鏡駆
動部、１４はマルチプレクサ、１５．１６はメモリ、１
７は制御処理回路、１８はＣＲＴ１９の駆動回路である
。図における赤外＋Ｗ検出素子アレイ９は、−次元に素
子が配列されたもので、その各素子に対応する目標物の
画素１をり、と表し、その垂直方向をｘ（ｘ＝１〜ｍ）
とし、水平方向をｙ（ｙ＝１〜ル）とする。FIG. 1 is a block diagram of a first embodiment of the present invention. In the figure, 1 is a pixel, 2 is an afocal optical system, 3, 4
is a scanning mirror, 5 is a fixed mirror, 6.7 is an imaging optical system, 8 is a 7 beam, 9 is an infrared detection element array, 10 is a front amplifier,
11 is a main amplifier, 12 is a bias circuit, 13 is a scanning mirror driver, 14 is a multiplexer, 15.16 is a memory, 1
7 is a control processing circuit, and 18 is a drive circuit for the CRT 19. The infrared +W detection element array 9 in the figure has elements arranged in a negative dimension, and the pixel 1 of the target object corresponding to each element is expressed as , and the vertical direction is x (x = 1 to m )
Let the horizontal direction be y (y=1~ru).
又、垂直方向に配列した赤外線検出素子（９）をｄ１〜
ｄ−、とする。これらｍ 、ｒＬｆｐ ｐの関係でイン
ターレースの比率により決定さ、れる。まず、目標物の
画素１かう瀞射される赤外線は、アフォーカル光学系２
により絞られた平行光束にされ、透過率と反射率が等し
い走査鏡３に入射する。In addition, the infrared detection elements (9) arranged in the vertical direction are
d-. The relationship between m, rLfp and p is determined by the interlace ratio. First, the infrared rays emitted by the target pixel 1 are transmitted through the afocal optical system 2.
The light beam is focused into a collimated beam and enters the scanning mirror 3, which has equal transmittance and reflectance.
ここで水平走査の場合、入射光は水平走査を行う走査鏡
３で反射され、結像光学系６，７を通して検出素子アレ
イ９に集光される。また、垂直走査の場合、走査鏡３で
透過した入射光は走査鏡４で垂直走査され、固定鏡５で
画像を９０°回転して結像光学系６，７を通り検出素子
アレイ９に集光される。これら走査鏡４及び固定鏡５で
光が減衰するときは、走査鏡３の透過率、を調整する。In the case of horizontal scanning, the incident light is reflected by the scanning mirror 3 that performs horizontal scanning, and is focused on the detection element array 9 through the imaging optical systems 6 and 7. In the case of vertical scanning, the incident light transmitted by the scanning mirror 3 is vertically scanned by the scanning mirror 4, the image is rotated by 90 degrees by the fixed mirror 5, passes through the imaging optical system 6, 7, and is focused on the detection element array 9. be illuminated. When the light is attenuated by the scanning mirror 4 and fixed mirror 5, the transmittance of the scanning mirror 3 is adjusted.
この検出素子アレイ９からの信号は、前置増幅器１０、
主増幅器１１で増幅された後、マルチプレクサ１４によ
りシリアル信号に変換される。The signal from this detection element array 9 is transmitted to a preamplifier 10,
After being amplified by the main amplifier 11, it is converted into a serial signal by the multiplexer 14.
また、走査鏡駆動部１３からの信号もマルチプレクサ１
４に送られ、水平走査のデータはメモリ１５に、垂直走
査のデータはメモリ１６に送られて記憶される。同一画
素に対するメモリ１５及びメモリ１６上のデータは制御
処理回路１７に送られ、素子の感度補正及びオーツ（−
シュート、ストリーキング等の補正を行ったｆｉｃＲＴ
駆動回路１８を通してＣＲＴ１９が表示される。Further, the signal from the scanning mirror drive section 13 is also sent to the multiplexer 1.
4, the horizontal scanning data is sent to the memory 15, and the vertical scanning data is sent to the memory 16 and stored therein. The data on the memory 15 and memory 16 for the same pixel is sent to the control processing circuit 17, which corrects the sensitivity of the element and performs automatic (-
ficRT with corrections for shooting, streaking, etc.
The CRT 19 is displayed through the drive circuit 18.
ここで赤外線検出素子の感度補正の方法としては、例え
ばｉ＋！ｉｉ素ＤＩｌ〜Ｄ浴ｓ、Ｄｓ＋〜Ｄ１愕に対し
て感度補正を行う場合、画素ＤｓＩ−Ｄ鴨−，Ｄｘｓ−
，＝Ｄｓ％に目標物からの輻射光が入射しないように、
桔イ象光学系６，７に温度の均一なフレーム８を置く。Here, as a method for correcting the sensitivity of the infrared detection element, for example, i+! ii When performing sensitivity correction for pixels DIl to D bath s, Ds+ to D1 shock, pixels DsI-D duck-, Dxs-
, = Ds% so that the radiation light from the target does not enter,
A frame 8 having a uniform temperature is placed between the optical systems 6 and 7.
まず画素Ｄ１１ ｙＤ ｓｔの場合、素子アレイｄ、ｌ
〜ｄ、 の水平走査の一端のデータと１素子の垂直走査
のデータは共にフレーム８上の同−位電に対するデータ
であるので、１ぶ子で走査したデータを基準にして両デ
ータが一致するようにアンプ系１０．１１の利得を制御
処理回路１７で自動的に調整すれば、良好な感度補正を
容易に行うことができる。画素Ｄｏ〜Ｄｓ＊ の場合も
同様に行う。ここで結像光学系６．７にフレーム８を置
いたのは、目標物に激しい温度勾配がある場合、感度補
正に誤差が生じるのを防ぐためである。さらに、画素Ｄ
２纂〜Ｄ−（１＝２〜ｓ）は、素子アレイｄ−１−ｊ
ｐ の水平走査と、素子ｄｊ（／＝１〜Ｐ）の垂直走
査の両走査で検出でき、画素Ｉ）Ｈ−Ｄｉｓ （＊ ＝
２〜−＞ は素子ｔｉ ／ （／＝１−ｐ ）の水平
走査と素子アレイｔＬ １−ｃＬ ｐの垂直走査の両走
査で検出できる。First, in the case of pixel D11 yD st, element arrays d, l
Since the data at one end of the horizontal scan and the data at the vertical scan of one element of ~d are both data for the same potential electric potential on frame 8, both data match based on the data scanned by one button. If the gain of the amplifier system 10.11 is automatically adjusted by the control processing circuit 17 as shown in FIG. The same process is performed for pixels Do to Ds*. The reason why the frame 8 is placed in the imaging optical system 6.7 is to prevent an error from occurring in the sensitivity correction when the target object has a severe temperature gradient. Furthermore, pixel D
2nd line~D-(1=2~s) is element array d-1-j
It can be detected by both horizontal scanning of p and vertical scanning of element dj (/=1 to P), and pixel I)
2 to -> can be detected by both horizontal scanning of the element ti/(/=1-p) and vertical scanning of the element array tL1-cLp.
また、アンダーシェード、ストリーキング現象等の補正
方法としては、たとえば、画素りりに高い温度の目標物
がある場合、同一走査線上の他の画、ｔＤ ２ ／ −
Ｄｓ ｊ 、Ｄ番２〜Ｄｉｓ（Ｄりを除く）社アンプ系
１０．１１の周波数応答等の影響により出力に誤差を生
じる。そこでＤ ２ Ｊ −ＤｆＩａ ｊ （Ｄりを除
く）に対しては素子Ｃｔｔ、ａ、の水平走査のデータを
使用し、Ｄｔｚ〜Ｄｉ％（Ｄりを除く）に対しては素子
ｄ１〜ｄ。In addition, as a correction method for undershading, streaking, etc., for example, when there is a high temperature target near the pixel, other images on the same scanning line, tD 2 / -
Ds j , an error occurs in the output due to the influence of the frequency response of D2 to Dis (excluding D) amplifier system 10.11. Therefore, for D 2 J -DfIa j (excluding D), horizontal scanning data of element Ctt,a is used, and for Dtz~Di% (excluding D), elements d1~d are used.
の垂直走査のデータを使用するように制御処理回路１７
で処理をするので、アンダーシェード、ストリーキング
等の現象を防止することができる。The control processing circuit 17 uses the vertical scanning data of
Since this process is performed, phenomena such as undershading and streaking can be prevented.
第２図は本発明の第２の実施例のブロック図である。本
実施例は、第１図に対して固定鏡５をなくした代りに、
赤外線検出素子アレイ９′ として垂直方向の素子アレ
イｄＨ〜ｄＰ１ と水平方向の素子アレイｄｌｌ〜ｔ
１ｇ とをＬ字形に配列したものである。このため装
置構成の一部が若干具ってた構成となっている（３’、
１０’、 １１’、 １２’、 １３’、 １４’。FIG. 2 is a block diagram of a second embodiment of the invention. In this embodiment, instead of eliminating the fixed mirror 5 from FIG.
The infrared detecting element array 9' includes a vertical element array dH~dP1 and a horizontal element array dll~t.
1g arranged in an L-shape. For this reason, some of the device configurations are slightly different (3',
10', 11', 12', 13', 14'.
１５’、１６’および１７′）。目標物（１）から輻射
された赤外線は、アフォーカル光学系２を通り走査鏡３
′ に入射する。水平走査の場合、走査鏡３′ で水平
走査し走査鏡４を固定して素子アレイ９′ の１１４１
１−ｊｐｌ に反射させる。また、垂直走査の場合、
走査鏡３′ を固定し走査鏡４で垂直走査し、素子アレ
イ９′のｇｏ〜ｃＬ１ｑ に反射させる。この素子ア
レイ９′の感度補正及びアンダーシェード、ストリーキ
ング現象等の補正は第１の実施例と同様にして行う。15', 16' and 17'). The infrared rays radiated from the target object (1) pass through the afocal optical system 2 and reach the scanning mirror 3.
′ is incident on . In the case of horizontal scanning, the scanning mirror 3' scans horizontally, the scanning mirror 4 is fixed, and 1141 of the element array 9' is scanned horizontally.
Reflect to 1-jpl. Also, in the case of vertical scanning,
The scanning mirror 3' is fixed, the scanning mirror 4 performs vertical scanning, and the light is reflected to go to cL1q of the element array 9'. Sensitivity correction of this element array 9' and correction of undershading, streaking phenomena, etc. are performed in the same manner as in the first embodiment.
（発明の効果）
以上説明したように、本発明は走査光学系又は素子の配
列を改良することにより、水平走査と垂直走査を行い、
各々のデータを比較、処理して基準光源を用いずに容易
に素子アレイの感度補正ができ、又アンプ系の周波数応
答に起因するアンダーシュート、ストリーキング現象等
を補正することができる。(Effects of the Invention) As explained above, the present invention improves the scanning optical system or arrangement of elements to perform horizontal scanning and vertical scanning.
By comparing and processing each data, it is possible to easily correct the sensitivity of the element array without using a reference light source, and it is also possible to correct undershoot, streaking, etc. caused by the frequency response of the amplifier system.
第１図および第２図は本発明の第１および第２の実施例
のブロック図である。図において、１・・・・・・画素
、２・・・・・・アフォーカル光学系、３，４゜３′・
・・・・・足ｆ鏡、５・・・・・・固定鏡、６，７・・
・・・・結像光学系、８・・・・・・７レーム、９．９
’・・・・・・赤外線検出素子アレイ、１０．１０’・
・・・・・前置増幅器、１１．１１’・・・・・・主増
幅器、１２．１２’・・・・・・バイアス回路、１３゜
１３′・・・・・・走肴鏡駆動部、１４．１４’・・・
・・・マルチプレクサ、１５，１６．１５’、１６’・
・・・・・メモリ、１７，１７′・・・・・・制御処理
回路、１８・・・・・・ＣＲＴ駆動回路、１９・・・・
・・ＣＲＴである。
代理人 弁理士 内 原 晋 ；〜１、・？・
、。
ノユ
ミン1 and 2 are block diagrams of first and second embodiments of the present invention. In the figure, 1... pixel, 2... afocal optical system, 3,4°3'.
...Foot f mirror, 5...Fixed mirror, 6,7...
...Imaging optical system, 8...7 beams, 9.9
'...Infrared detection element array, 10.10'・
...Preamplifier, 11.11'... Main amplifier, 12.12'... Bias circuit, 13゜13'... Traveling mirror drive section , 14.14'...
...Multiplexer, 15, 16.15', 16'・
...Memory, 17, 17'... Control processing circuit, 18... CRT drive circuit, 19...
...It is a CRT. Agent Patent Attorney Susumu Uchihara ;~1,・?・
,. Noyumin
Claims (1)
配列された赤外線検出素子アレイと、この赤外線検出素
子アレイ上に被撮像物からの水平方向および垂直方向の
光像を光学的に走査する光走査手段と、この光走査手段
によって前記アレイから得られた前記水平および垂直走
査のデータを比較処理し前記アレイの感度を補正する第
１の補正手段と、前記アレイからの各出力を増幅する増
幅手段と、これら増幅手段の各出力を比較処理してその
周波数応答による各出力の差を補正する第２の補正手段
とを含む赤外線撮像装置。An infrared detection element array arranged in one direction or in two directions, this direction and the orthogonal direction, and optical scanning that optically scans a horizontal and vertical light image from an imaged object on this infrared detection element array. means, first correction means for comparing and processing the horizontal and vertical scanning data obtained from the array by the optical scanning means to correct the sensitivity of the array, and amplification means for amplifying each output from the array. and a second correction means for comparing and processing the respective outputs of these amplification means and correcting the difference between the respective outputs due to their frequency responses.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59219845A JPS6199471A (en) | 1984-10-19 | 1984-10-19 | Infrared image pickup device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59219845A JPS6199471A (en) | 1984-10-19 | 1984-10-19 | Infrared image pickup device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6199471A true JPS6199471A (en) | 1986-05-17 |
Family
ID=16741959
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59219845A Pending JPS6199471A (en) | 1984-10-19 | 1984-10-19 | Infrared image pickup device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6199471A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109060146A (en) * | 2018-06-28 | 2018-12-21 | 湖北久之洋红外系统股份有限公司 | A scanning galvanometer control system for area array infrared wide-area imaging |
-
1984
- 1984-10-19 JP JP59219845A patent/JPS6199471A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109060146A (en) * | 2018-06-28 | 2018-12-21 | 湖北久之洋红外系统股份有限公司 | A scanning galvanometer control system for area array infrared wide-area imaging |
| CN109060146B (en) * | 2018-06-28 | 2020-04-21 | 湖北久之洋红外系统股份有限公司 | A scanning galvanometer control system for area-array infrared wide-area imaging |
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