JPS6212802U - - Google Patents
Info
- Publication number
- JPS6212802U JPS6212802U JP10440685U JP10440685U JPS6212802U JP S6212802 U JPS6212802 U JP S6212802U JP 10440685 U JP10440685 U JP 10440685U JP 10440685 U JP10440685 U JP 10440685U JP S6212802 U JPS6212802 U JP S6212802U
- Authority
- JP
- Japan
- Prior art keywords
- measured
- insulator
- thick film
- dial gauge
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000012212 insulator Substances 0.000 claims description 5
- 239000004020 conductor Substances 0.000 claims description 2
- 239000000523 sample Substances 0.000 claims description 2
Landscapes
- A Measuring Device Byusing Mechanical Method (AREA)
Description
第１図はこの考案における厚膜測定装置の斜視
図、第２図はこの考案における測定手段を示した
正面図である。
図において、１はダイヤルゲージテスター、２
は測定用触子、５は被測定物、５ａは絶縁体部分
、５ｂは導体部分、８はブロツクゲージである。
尚、図中同一符号は同一、又は相当部分を示す。
FIG. 1 is a perspective view of a thick film measuring device according to this invention, and FIG. 2 is a front view showing a measuring means according to this invention. In the figure, 1 is a dial gauge tester, 2
5 is a measuring probe, 5 is an object to be measured, 5a is an insulator portion, 5b is a conductor portion, and 8 is a block gauge.
Note that the same reference numerals in the figures indicate the same or equivalent parts.
Claims (1)
置において、ダイヤルゲーシテスターと、このダ
イヤルゲージテスターに取り付けられ、基準値に
設定される測定用触子とを備え、上記測定用触子
を上記被測定物の絶縁体に突き刺し、上記被測定
物の導体部に接したときの値と上記基準値を換算
して上記被測定物の絶縁体の厚膜を測定するよう
にしたことを特徴とする厚膜測定装置。 A thick film measuring device for measuring a thick film of an insulator of an object to be measured is equipped with a dial gauge tester and a measuring probe attached to the dial gauge tester and set to a reference value. The thick film of the insulator of the object to be measured is measured by piercing the insulator into the insulator of the object to be measured, and converting the value when it comes into contact with the conductor part of the object to be measured with the reference value. A thick film measuring device featuring:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10440685U JPS6212802U (en) | 1985-07-08 | 1985-07-08 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10440685U JPS6212802U (en) | 1985-07-08 | 1985-07-08 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6212802U true JPS6212802U (en) | 1987-01-26 |
Family
ID=30977869
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10440685U Pending JPS6212802U (en) | 1985-07-08 | 1985-07-08 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6212802U (en) |
-
1985
- 1985-07-08 JP JP10440685U patent/JPS6212802U/ja active Pending