JPS62141756U - - Google Patents

Info

Publication number
JPS62141756U
JPS62141756U JP2827386U JP2827386U JPS62141756U JP S62141756 U JPS62141756 U JP S62141756U JP 2827386 U JP2827386 U JP 2827386U JP 2827386 U JP2827386 U JP 2827386U JP S62141756 U JPS62141756 U JP S62141756U
Authority
JP
Japan
Prior art keywords
flaw detection
magnetic field
rotating magnetic
field type
type flaw
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2827386U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2827386U priority Critical patent/JPS62141756U/ja
Publication of JPS62141756U publication Critical patent/JPS62141756U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
JP2827386U 1986-02-28 1986-02-28 Pending JPS62141756U (it)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2827386U JPS62141756U (it) 1986-02-28 1986-02-28

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2827386U JPS62141756U (it) 1986-02-28 1986-02-28

Publications (1)

Publication Number Publication Date
JPS62141756U true JPS62141756U (it) 1987-09-07

Family

ID=30831081

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2827386U Pending JPS62141756U (it) 1986-02-28 1986-02-28

Country Status (1)

Country Link
JP (1) JPS62141756U (it)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015155877A1 (ja) * 2014-04-10 2015-10-15 株式会社日立製作所 検査プローブ、検査システム、及び検査方法
KR200492382Y1 (ko) * 2020-06-11 2020-09-29 (주)아이텍기술 듀얼타입 자분탐상검사장치

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4979584A (it) * 1972-12-07 1974-08-01
JPS5420786A (en) * 1977-07-15 1979-02-16 Nippon Steel Corp Magnetizing device for magnetic inspecter

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4979584A (it) * 1972-12-07 1974-08-01
JPS5420786A (en) * 1977-07-15 1979-02-16 Nippon Steel Corp Magnetizing device for magnetic inspecter

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015155877A1 (ja) * 2014-04-10 2015-10-15 株式会社日立製作所 検査プローブ、検査システム、及び検査方法
JPWO2015155877A1 (ja) * 2014-04-10 2017-04-13 株式会社日立製作所 検査プローブ、検査システム、及び検査方法
KR200492382Y1 (ko) * 2020-06-11 2020-09-29 (주)아이텍기술 듀얼타입 자분탐상검사장치

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