JPS62150681U - - Google Patents
Info
- Publication number
- JPS62150681U JPS62150681U JP3877286U JP3877286U JPS62150681U JP S62150681 U JPS62150681 U JP S62150681U JP 3877286 U JP3877286 U JP 3877286U JP 3877286 U JP3877286 U JP 3877286U JP S62150681 U JPS62150681 U JP S62150681U
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- ics
- endless
- view
- tank
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986038772U JPH0514219Y2 (lt) | 1986-03-17 | 1986-03-17 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986038772U JPH0514219Y2 (lt) | 1986-03-17 | 1986-03-17 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62150681U true JPS62150681U (lt) | 1987-09-24 |
| JPH0514219Y2 JPH0514219Y2 (lt) | 1993-04-15 |
Family
ID=30851329
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1986038772U Expired - Lifetime JPH0514219Y2 (lt) | 1986-03-17 | 1986-03-17 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0514219Y2 (lt) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5984893U (ja) * | 1982-11-29 | 1984-06-08 | 株式会社アドバンテスト | Ic試験装置のマガジンエスケ−プ機構 |
| JPS6112508A (ja) * | 1984-06-26 | 1986-01-20 | Daifuku Co Ltd | 検査設備 |
-
1986
- 1986-03-17 JP JP1986038772U patent/JPH0514219Y2/ja not_active Expired - Lifetime
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5984893U (ja) * | 1982-11-29 | 1984-06-08 | 株式会社アドバンテスト | Ic試験装置のマガジンエスケ−プ機構 |
| JPS6112508A (ja) * | 1984-06-26 | 1986-01-20 | Daifuku Co Ltd | 検査設備 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0514219Y2 (lt) | 1993-04-15 |
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