JPS6217192B2 - - Google Patents
Info
- Publication number
- JPS6217192B2 JPS6217192B2 JP55134605A JP13460580A JPS6217192B2 JP S6217192 B2 JPS6217192 B2 JP S6217192B2 JP 55134605 A JP55134605 A JP 55134605A JP 13460580 A JP13460580 A JP 13460580A JP S6217192 B2 JPS6217192 B2 JP S6217192B2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- insulation
- electrical equipment
- partial discharge
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Relating To Insulation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55134605A JPS5759178A (en) | 1980-09-26 | 1980-09-26 | Method for detecting dielectric breakdown of electric apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP55134605A JPS5759178A (en) | 1980-09-26 | 1980-09-26 | Method for detecting dielectric breakdown of electric apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5759178A JPS5759178A (en) | 1982-04-09 |
| JPS6217192B2 true JPS6217192B2 (de) | 1987-04-16 |
Family
ID=15132301
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP55134605A Granted JPS5759178A (en) | 1980-09-26 | 1980-09-26 | Method for detecting dielectric breakdown of electric apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5759178A (de) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5402074A (en) * | 1993-05-13 | 1995-03-28 | Seagate Technology, Inc. | Thin film magnetic head having electrical connection to core |
| CN110749809B (zh) * | 2019-11-11 | 2021-07-27 | 深圳供电局有限公司 | Gis故障检测装置及系统 |
| CN115616360B (zh) * | 2022-10-28 | 2023-10-31 | 天蔚蓝电驱动科技(江苏)有限公司 | 一种定子槽部绝缘性能的检测方法及装置 |
-
1980
- 1980-09-26 JP JP55134605A patent/JPS5759178A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5759178A (en) | 1982-04-09 |
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