JPS6230701B2 - - Google Patents

Info

Publication number
JPS6230701B2
JPS6230701B2 JP55176032A JP17603280A JPS6230701B2 JP S6230701 B2 JPS6230701 B2 JP S6230701B2 JP 55176032 A JP55176032 A JP 55176032A JP 17603280 A JP17603280 A JP 17603280A JP S6230701 B2 JPS6230701 B2 JP S6230701B2
Authority
JP
Japan
Prior art keywords
conductor
common terminal
emitter
wiring
main electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55176032A
Other languages
Japanese (ja)
Other versions
JPS5797661A (en
Inventor
Yoshitaka Ju
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP55176032A priority Critical patent/JPS5797661A/en
Publication of JPS5797661A publication Critical patent/JPS5797661A/en
Publication of JPS6230701B2 publication Critical patent/JPS6230701B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W44/00Electrical arrangements for controlling or matching impedance
    • H10W44/20Electrical arrangements for controlling or matching impedance at high-frequency [HF] or radio frequency [RF]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W44/00Electrical arrangements for controlling or matching impedance
    • H10W44/20Electrical arrangements for controlling or matching impedance at high-frequency [HF] or radio frequency [RF]
    • H10W44/226Electrical arrangements for controlling or matching impedance at high-frequency [HF] or radio frequency [RF] for HF amplifiers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/075Connecting or disconnecting of bond wires
    • H10W72/07541Controlling the environment, e.g. atmosphere composition or temperature
    • H10W72/07551Controlling the environment, e.g. atmosphere composition or temperature characterised by changes in properties of the bond wires during the connecting
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/541Dispositions of bond wires
    • H10W72/5445Dispositions of bond wires being orthogonal to a side surface of the chip, e.g. parallel arrangements
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/541Dispositions of bond wires
    • H10W72/547Dispositions of multiple bond wires
    • H10W72/5473Dispositions of multiple bond wires multiple bond wires connected to a common bond pad

Landscapes

  • Bipolar Integrated Circuits (AREA)
  • Bipolar Transistors (AREA)

Description

【発明の詳細な説明】 この発明は一枚の基板に複数個の半導体素子チ
ツプを取り付け、これらの半導体素子チツプを並
列に接続して大容量化を図つた半導体装置の改良
に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an improvement in a semiconductor device in which a plurality of semiconductor element chips are attached to a single substrate and these semiconductor element chips are connected in parallel to increase the capacity.

第1図はこの種の半導体装置の従来例を示す斜
視図、第2図はその回路接続図である。図におい
て、1aおよび1bはトランジスタチツプ、2は
両トランジスタチツプ1aおよび1bのコレクタ
に接続されたコレクタ共通端子、3は同様のエミ
ツタ共通端子、4はベース共通端子、5は両トラ
ンジスタ1aおよび1bのエミツタ間接続導体、
6は絶縁板、7は基板、8はエミツタ間接続導体
5が有する寄生インダクタンスである。
FIG. 1 is a perspective view showing a conventional example of this type of semiconductor device, and FIG. 2 is a circuit connection diagram thereof. In the figure, 1a and 1b are transistor chips, 2 is a common collector terminal connected to the collectors of both transistor chips 1a and 1b, 3 is a similar common emitter terminal, 4 is a common base terminal, and 5 is a common terminal of both transistors 1a and 1b. Connecting conductor between emitters,
6 is an insulating plate, 7 is a substrate, and 8 is a parasitic inductance possessed by the emitter-to-emitter connection conductor 5.

このような従来装置では、コレクタ共通端子2
とエミツタ共通端子3との間に負荷抵抗に直流電
源とを直列に接続し、ベース共通端子4にベース
信号を入力して動作させるのが通常であり、以下
スイツチング動作の場合を例にとつて説明する。
In such a conventional device, collector common terminal 2
Normally, a DC power supply is connected in series with a load resistor between the terminal and the emitter common terminal 3, and a base signal is input to the base common terminal 4 to operate the switch. explain.

図示のように並列接続されたnpn形トランジス
タのベース共通端子4に正のベース信号を供給し
て両トランジスタ1aおよび1bをオン状態にす
ると、両トランジスタ1aおよび1bのコレクタ
電流の立上りに不平衡が生じる。第3図はこの不
平衡を示す波形図である。同図において、ica
よびicbはそれぞれトランジスタ1aおよび1b
のコレクタ電流である。すなわち、トランジスタ
1a,1bがオンしたとき、A点とB点との間に
は電位差VLSが生じる。該電位差VLSは、トラン
ジスタ1aのコレクタ電流の立上りをdica/dt、
寄生インダクタンス8をLsとすると、 VLS=LS×dica/dt となり、A点の電位はB点よりVLSだけ高くな
る。このため、トランジスタ1a,1bのベース
電位は同じではあるが、ベース電流はトランジス
タ1aよりトランジスタ1bの方に多く流れ込む
こととなり、コレクタ電流icbはコレクタ電流i
caより大きくなる。従つて、コレクタ電流ica
その立上りが遅れることとなる。
When a positive base signal is supplied to the base common terminal 4 of the npn transistors connected in parallel as shown in the figure to turn both transistors 1a and 1b on, an imbalance occurs in the rise of the collector currents of both transistors 1a and 1b. arise. FIG. 3 is a waveform diagram showing this imbalance. In the figure, i ca and i cb are transistors 1a and 1b, respectively.
is the collector current of . That is, when transistors 1a and 1b are turned on, a potential difference VLS occurs between point A and point B. The potential difference V LS is the rise of the collector current of the transistor 1a as di ca /dt,
If the parasitic inductance 8 is L s , then V LS =L s × di ca /dt, and the potential at point A is higher than point B by V LS . Therefore, although the base potentials of transistors 1a and 1b are the same, more base current flows into transistor 1b than transistor 1a, and the collector current i cb becomes smaller than the collector current i
becomes larger than ca. Therefore, the rise of the collector current i ca is delayed.

このように従来装置では、ベース入力に即応し
た所要の(並列トランジスタ数に対応した)出力
電流を得ることができず、しかもトランジスタ1
bにのみ大きな責務がかかり、破壊しやすいとい
う欠点があつた。
In this way, with the conventional device, it is not possible to obtain the required output current (corresponding to the number of parallel transistors) in response to the base input.
It had the disadvantage that a large responsibility was placed only on b, and it was easy to destroy.

この発明は以上のような点に鑑みてなされたも
ので、各半導体素子チツプの主電極が接続される
導体配線を、上記主電極をこれに接続するための
主電極接続配線部と、該配線部に近接してこれと
平行に設けられ、一端が上記共通端子設置側とは
反対側の上記配線部端部に接続され、他端が上記
共通端子に接続された折返し配線部とにより構成
することにより、上記主電極接続配線部の寄生イ
ンダクタンスを打消して、並列接続された半導体
素子の主電流の立上りに差が生じるのを防止で
き、さらには立上り時点から平等に平衡した電流
を流すことができる半導体装置を提供することを
目的としている。
This invention has been made in view of the above points, and includes a conductor wiring to which the main electrode of each semiconductor element chip is connected, a main electrode connection wiring part for connecting the main electrode to the conductor wiring, and the wiring. and a folded wiring section that is provided close to and parallel to the common terminal, one end of which is connected to the end of the wiring section opposite to the common terminal installation side, and the other end of which is connected to the common terminal. By doing so, it is possible to cancel out the parasitic inductance of the main electrode connection wiring section, prevent differences in the rise of the main currents of semiconductor elements connected in parallel, and furthermore, it is possible to flow evenly balanced currents from the point of rise. The purpose is to provide a semiconductor device that can perform

第4図はこの発明の一実施例による半導体装置
を示す斜視図、第5図はその回路接続図であり、
図において、従来例と同一部分は同一符号で示
し、その説明を省略する。9はエミツタ間接続導
体5に近接してこれと平行に設けられ、一端がエ
ミツタ共通端子3設置側とは反対側の上記エミツ
タ間接続導体5の端部に接続され、他端が上記共
通端子3に接続された折返し導体、8aは該折返
し導体9の寄生インダクタンスである。
FIG. 4 is a perspective view showing a semiconductor device according to an embodiment of the present invention, and FIG. 5 is a circuit connection diagram thereof.
In the figure, the same parts as in the conventional example are indicated by the same reference numerals, and the explanation thereof will be omitted. 9 is provided close to and parallel to the emitter-to-emitter connecting conductor 5, one end is connected to the end of the emitter-to-emitter connecting conductor 5 on the opposite side to the side where the emitter common terminal 3 is installed, and the other end is connected to the common terminal. The folded conductor 8a connected to the folded conductor 3 is the parasitic inductance of the folded conductor 9.

このような構成になる本実施例装置では、エミ
ツタ間接続導体5と折返し導体9との相互インダ
クタンスをM、折返し導体9に流れる電流をi
c、寄生インダクタンス8aをLs′とすると、 VM=M×dic/dt (ここで、M=k√SS′、 aはLS′に流れる電流/LSに流れる電流、 kは結合係数であり、−1k+1である。) なる起電力VMが発生し、該起電力VMはエミツタ
間接続導体5に発生する電位差VLSとは逆方向で
あるので、該電位差VLSを打ち消すように働く。
すなわち、 VLS−VM となつてA−B点間の電位差は減少することとな
る。従つて、両トランジスタ1a,1bの主電流
の立上りに差が生じるのを防止することができ、
さらに、上記折返し導体9をエミツタ間接続導体
5に対し適当な間隔を持つよう配置することによ
つて上記相互インダクタンスMを適切に設定する
ことにより、A−B間の電位は等しくなり、ベー
ス電流はトランジスタ1a,1bに均等に流れ込
み、両トランジスタ1aおよび1bには立上り時
点からコレクタ電流が均等に流れることとなり、
並列接続の効果を完全に達成することができる。
In the device of this embodiment having such a configuration, the mutual inductance between the emitter-to-emitter connecting conductor 5 and the folded conductor 9 is M, and the current flowing through the folded conductor 9 is i.
c , and let parasitic inductance 8a be Ls', V M = M × di c / dt (here, M = k√ SS ', a is the current flowing in L S '/current flowing in L S , and k is (The coupling coefficient is -1k+1.) An electromotive force V M is generated, and since this electromotive force V M is in the opposite direction to the potential difference V LS generated in the emitter-to-emitter connecting conductor 5, the potential difference V LS can be expressed as It works to cancel it out.
That is, VLS - VM , and the potential difference between points A and B decreases. Therefore, it is possible to prevent a difference in the rise of the main currents of both transistors 1a and 1b.
Furthermore, by arranging the folded conductor 9 with an appropriate spacing from the emitter-to-emitter connecting conductor 5 and thereby appropriately setting the mutual inductance M, the potentials between A and B become equal, and the base current flows equally into transistors 1a and 1b, and the collector current flows equally into both transistors 1a and 1b from the time of rising.
The effect of parallel connection can be fully achieved.

第6図および第7図はそれぞれ3個以上のトラ
ンジスタ1a,1b,………1nが並列接続され
たときの従来例及びこの発明の他の実施例を示す
回路接続図で、この場合も上述の場合と同様、エ
ミツタ間接続導体5の寄生インダクタンスの影響
は折返し導体9によつて打ち消され、並列接続の
効果は完全に発揮されることとなる。
6 and 7 are circuit connection diagrams respectively showing a conventional example and another embodiment of the present invention when three or more transistors 1a, 1b, . . . 1n are connected in parallel; As in the case of , the effect of the parasitic inductance of the emitter-to-emitter connection conductor 5 is canceled by the folded conductor 9, and the effect of the parallel connection is fully exhibited.

なお、上記実施例では、トランジスタを用いた
場合について説明したが、この発明は、他の半導
体スイツチング素子を用いる場合にも適用でき、
同様の効果を奏する。
Although the above embodiments have been described using transistors, the present invention can also be applied to cases where other semiconductor switching elements are used.
It has a similar effect.

以上詳述したように、この発明の半導体装置に
よれば、複数個の半導体素子チツプを同一基板上
に配置して並列接続するものにおいて、上記各半
導体チツプの主電極が接続される導体配線を、上
記主電極をこれに接続するための主電極接続配線
部と、該配線部に近接してこれと平行に設けら
れ、一端が上記共通端子設置側とは反対側の上記
配線部端部に接続され、他端が上記共通端子に接
続された折返し配線部とにより構成するようにし
たので、接続導体の有する寄生インダクタンスの
悪影響を解消して、複数個の半導体素子の主電流
の立上りに差が生じるのを防止でき、さらには、
主電流の立上り時点から各半導体素子に均等に電
流を流し、並列接続の効果を完全に達成すること
ができる効果がある。
As detailed above, according to the semiconductor device of the present invention, in a device in which a plurality of semiconductor element chips are arranged on the same substrate and connected in parallel, the conductor wiring to which the main electrode of each semiconductor chip is connected is , a main electrode connection wiring part for connecting the main electrode thereto, and a main electrode connecting wiring part provided close to and parallel to the wiring part, one end of which is located at the end of the wiring part on the opposite side from the common terminal installation side. Since the wiring is connected to the folded wiring section and the other end is connected to the common terminal, the negative effect of the parasitic inductance of the connecting conductor is eliminated, and there is no difference in the rise of the main current of the plurality of semiconductor elements. can be prevented from occurring, and furthermore,
This has the effect of allowing current to flow equally through each semiconductor element from the time the main current rises, thereby fully achieving the effect of parallel connection.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の半導体装置の一例を示す斜視
図、第2図はその回路接続図、第3図は上記従来
例における電流の不平衡を示す波形図、第4図は
この発明の一実施例による半導体装置を示す斜視
図、第5図はその回路接続図、第6図は従来の半
導体装置の他の例を示す回路接続図、第7図は第
6図の従来例に対応するこの発明の他の実施例に
よる半導体装置を示す回路接続図である。 図において、1a,1b,………1nはトラン
ジスタ(半導体素子)、3はエミツタ共通端子、
5はエミツタ間接続導体(導体配線)、6は絶縁
板、7は基板、8,8aは寄生インダクタンス、
9は折返し導体である。なお、図中同一符号は同
一又は相当部分を示す。
FIG. 1 is a perspective view showing an example of a conventional semiconductor device, FIG. 2 is a circuit connection diagram thereof, FIG. 3 is a waveform diagram showing current imbalance in the conventional example, and FIG. 4 is an embodiment of the present invention. A perspective view showing a semiconductor device according to an example, FIG. 5 is a circuit connection diagram thereof, FIG. 6 is a circuit connection diagram showing another example of a conventional semiconductor device, and FIG. FIG. 7 is a circuit connection diagram showing a semiconductor device according to another embodiment of the invention. In the figure, 1a, 1b,...1n are transistors (semiconductor elements), 3 is an emitter common terminal,
5 is an emitter-to-emitter connection conductor (conductor wiring), 6 is an insulating plate, 7 is a substrate, 8 and 8a are parasitic inductances,
9 is a folded conductor. Note that the same reference numerals in the figures indicate the same or equivalent parts.

Claims (1)

【特許請求の範囲】 1 一枚の基板に複数個の半導体素子チツプを取
り付け、これらの半導体素子チツプの各対応電極
を上記基板上に形成された各導体配線に順次接続
し、その一方の端部側に当該対応電極の共通端子
を設け、上記半導体素子チツプを並列接続してな
る半導体装置において、 上記各半導体素子チツプの主電流路を構成する
主電極が接続される上記導体配線は、上記主電極
をこれに接続するための主電極接続配線部と、 該配線部に近接してこれと平行に設けられ、一
端が上記共通端子設置側とは反対側の上記配線部
端部に接続され、他端が上記共通端子に接続され
た折返し配線部とからなるものであることを特徴
とする半導体装置。
[Claims] 1. A plurality of semiconductor element chips are mounted on a single substrate, each corresponding electrode of these semiconductor element chips is sequentially connected to each conductor wiring formed on the substrate, and one end of the corresponding electrode is connected to each conductor wiring formed on the substrate. In a semiconductor device in which the semiconductor element chips are connected in parallel with a common terminal of the corresponding electrodes provided on the side thereof, the conductor wiring to which the main electrode constituting the main current path of each of the semiconductor element chips is connected is a main electrode connection wiring section for connecting the main electrode thereto; and a main electrode connection wiring section provided close to and parallel to the wiring section, one end of which is connected to the end of the wiring section on the opposite side from the common terminal installation side. , and a folded wiring portion whose other end is connected to the common terminal.
JP55176032A 1980-12-10 1980-12-10 Semiconductor device Granted JPS5797661A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55176032A JPS5797661A (en) 1980-12-10 1980-12-10 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55176032A JPS5797661A (en) 1980-12-10 1980-12-10 Semiconductor device

Publications (2)

Publication Number Publication Date
JPS5797661A JPS5797661A (en) 1982-06-17
JPS6230701B2 true JPS6230701B2 (en) 1987-07-03

Family

ID=16006527

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55176032A Granted JPS5797661A (en) 1980-12-10 1980-12-10 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS5797661A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5984457A (en) * 1982-11-04 1984-05-16 Mitsubishi Electric Corp Gate turn off thyristor
JPH0747872Y2 (en) * 1985-12-19 1995-11-01 富士電機株式会社 Semiconductor device
US4907068A (en) * 1987-01-21 1990-03-06 Siemens Aktiengesellschaft Semiconductor arrangement having at least one semiconductor body

Also Published As

Publication number Publication date
JPS5797661A (en) 1982-06-17

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