JPS6235592A - Quantum well semiconductor laser - Google Patents

Quantum well semiconductor laser

Info

Publication number
JPS6235592A
JPS6235592A JP17401185A JP17401185A JPS6235592A JP S6235592 A JPS6235592 A JP S6235592A JP 17401185 A JP17401185 A JP 17401185A JP 17401185 A JP17401185 A JP 17401185A JP S6235592 A JPS6235592 A JP S6235592A
Authority
JP
Japan
Prior art keywords
quantum well
layer
emitted
semiconductor laser
type
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17401185A
Other languages
Japanese (ja)
Other versions
JPH0671115B2 (en
Inventor
Akira Fujimoto
晶 藤本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Tateisi Electronics Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Tateisi Electronics Co filed Critical Omron Tateisi Electronics Co
Priority to JP60174011A priority Critical patent/JPH0671115B2/en
Publication of JPS6235592A publication Critical patent/JPS6235592A/en
Publication of JPH0671115B2 publication Critical patent/JPH0671115B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y20/00Nanooptics, e.g. quantum optics or photonic crystals
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/34Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
    • H01S5/343Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
    • H01S5/34313Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer having only As as V-compound, e.g. AlGaAs, InGaAs
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/40Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
    • H01S5/4025Array arrangements, e.g. constituted by discrete laser diodes or laser bar
    • H01S5/4031Edge-emitting structures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/30Structure or shape of the active region; Materials used for the active region
    • H01S5/34Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
    • H01S5/343Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
    • H01S5/34313Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer having only As as V-compound, e.g. AlGaAs, InGaAs
    • H01S5/3432Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer having only As as V-compound, e.g. AlGaAs, InGaAs the whole junction comprising only (AI)GaAs
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/40Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
    • H01S5/4025Array arrangements, e.g. constituted by discrete laser diodes or laser bar
    • H01S5/4087Array arrangements, e.g. constituted by discrete laser diodes or laser bar emitting more than one wavelength

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  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biophysics (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Semiconductor Lasers (AREA)

Abstract

PURPOSE:To supply a quantum well semiconductor laser capable of generating a plurality of light beams of different wavelengths by one element by varying the thickness (width LZ) of a quantum well layer in response to the place. CONSTITUTION:An N-type AlGaAs enclosed layer 2 formed on an N-type GaAs substrate 1, a quantum well layer 3 enclosed on the layer 2 with partly different thicknesses LZ, a P-type AlGaAs enclosed layer 4, P-type side electrodes 5 (51-53) formed in a stripe shape, and N-type side electrodes 6 are formed. Such a quantum well laser element is integrated monolithically with lasers of 5 different wavelengths, and when a current is fed to the electrode 51, a laser light beam of wavelength lambda1 is emitted, and when a current is fed to the electrode 52, a laser light beam of lambda2 is emitted. Similarly, the laser light beams of different 5 wavelengths lambda3, lambda4, lambda5 can be separately emitted, or several or all the beams can be simultaneously emitted.

Description

【発明の詳細な説明】 発明の要約 活性領域が量子井戸構造となっているものにおいて、そ
の量子井戸層の厚さく巾)が場所に応じ変化し、複数の
異なる波長で発振することを特徴とする量子井戸半導体
レーザ。
[Detailed Description of the Invention] Summary of the Invention In an active region having a quantum well structure, the thickness and width of the quantum well layer vary depending on the location, and oscillation occurs at a plurality of different wavelengths. quantum well semiconductor laser.

[技術分野] この発明は、半導体レーザに関し、さらに詳しくは活性
領域が量子井戸構造となっている量子井戸半導体レーザ
に関する。
[Technical Field] The present invention relates to a semiconductor laser, and more particularly to a quantum well semiconductor laser whose active region has a quantum well structure.

[従来技術] 量子井戸半導体レーザは、従来のダブルへテロ構造の半
導体レーザに比べて、(1)スペクトル単色性が良い、
(2)偏波面の選択性が高い。
[Prior Art] Compared to conventional double heterostructure semiconductor lasers, quantum well semiconductor lasers have (1) good spectral monochromaticity;
(2) High selectivity of polarization plane.

(3)パルス応答性が良い、(4)発振波長が制御可能
である、(5)低いしきい値で動作する、(6)高い温
度安定性がある等の利点があり、実用化に向けて広く研
究されている。しかし、現段階までに開発されているこ
の種の量子井戸レーザは、1つの素子で1つの波長の光
しか発生させることができない、いわゆる単一波長レー
ザであり、複数の波長の光を同時に発振する多波長レー
ザが実現したという報告はまだない。
It has advantages such as (3) good pulse response, (4) controllable oscillation wavelength, (5) low threshold operation, and (6) high temperature stability. has been widely studied. However, this type of quantum well laser that has been developed to date is a so-called single-wavelength laser, in which one element can only generate light of one wavelength; instead, it emits light of multiple wavelengths at the same time. There are no reports yet of the realization of a multi-wavelength laser that can do this.

多波長レーザは、波長多重光通信用の光源等として非常
に有用でありその出現が待たれている。
Multi-wavelength lasers are extremely useful as light sources for wavelength-multiplexed optical communications, and their appearance is eagerly awaited.

現在では、多波長レーザの代用として、波長の異なる複
数個のレーザを相互に近接して実装し使用しているが、
組立が複雑でその形状も大きい、また信頼性もよくない
、といった問題がある。
Currently, as a substitute for multi-wavelength lasers, multiple lasers with different wavelengths are mounted close to each other and used.
There are problems such as the assembly is complicated, the shape is large, and the reliability is poor.

[発明の目的] この発明は、1つの素子で複数の異なる波長の光を発生
することのできる量子井戸半導体レーザを提供すること
を目的とする。
[Object of the Invention] An object of the present invention is to provide a quantum well semiconductor laser that can generate light of a plurality of different wavelengths with one element.

[発明の構成と効果] この発明は、活性領域が量子井戸構造となっている量子
井戸半導体レーザにおいて、その量子井戸層の厚さく巾
L )が場所に応じて変化していることを特徴とする。
[Configuration and Effects of the Invention] The present invention is characterized in that, in a quantum well semiconductor laser in which the active region has a quantum well structure, the thickness and width L of the quantum well layer vary depending on the location. do.

この発明による量子井戸半導体レーザは、活性層である
量子井戸層の巾L によりレーザ発振波長が決定される
ことを利用したものである。量子井戸半導体レーザの波
長はほぼL 2に比例することが知られており、L を
小さくすれば波長は短かくなり、逆にL を大きくすれ
ば波長は長くなる、この発明による量子井戸レーザでは
同一のウェハ上に部分的に厚さの異なる量子井戸活性層
が形成されているから、複数の異なる波長の光を同時に
または切換えて発振させることができる。
The quantum well semiconductor laser according to the present invention utilizes the fact that the laser oscillation wavelength is determined by the width L of the quantum well layer, which is the active layer. It is known that the wavelength of a quantum well semiconductor laser is approximately proportional to L 2 .If L is made smaller, the wavelength becomes shorter, and conversely, if L is made larger, the wavelength becomes longer. Since quantum well active layers having partially different thicknesses are formed on the same wafer, it is possible to oscillate light of a plurality of different wavelengths simultaneously or by switching.

同一のウェハ上に部分的に厚さの異なる量子井戸層を形
成するやり方としては、たとえば量子井戸層の分子線エ
ピタキシャル成長中に金属マスクで成長基板を部分的に
覆い、適当な時間間隔で少しずつマスクをずらせること
により、容易かつ再現性よく1部分的に厚さの異なる量
子井戸層を形成することが可能である。
To form quantum well layers with partially different thicknesses on the same wafer, for example, during the molecular beam epitaxial growth of the quantum well layer, the growth substrate is partially covered with a metal mask, and the growth substrate is grown little by little at appropriate time intervals. By shifting the mask, it is possible to easily and reproducibly form a quantum well layer having a partially different thickness.

[実施例の説明] 第1図はこの発明による量子井戸半導体1/−ザの構造
の一例を示すものである。この量子井戸半導体レーザは
、n形GaAs基板1、この基板1 、hに形成された
n形AlGaAs閉じ込め層2、閉じ込め層z上に形成
された厚さL が部分的に異なる量弁炉層3、この量弁
炉層3上にあるp形AlGaAs閉じ込め層4、P形A
lGaAs閉じ込め層4上にストライプ状に形成された
P側電極5(51〜55)、および基板1裏面に形成さ
れたn側電極6とからなる。P側電極5をストライブ状
に形成するためには、ストライプ部分以外を5i02等
の酸化膜で予め覆っておく酸化膜ストライプ法や、スト
ライプ部分のみにZ を拡散させるためブレーナ・スト
ライブ法等が用いられる。また通常は電極抵抗を下げる
ためにp形閉じ込め層4上にp形GaAs電極層が形成
される。
[Description of Embodiments] FIG. 1 shows an example of the structure of a quantum well semiconductor 1/-Z according to the present invention. This quantum well semiconductor laser includes an n-type GaAs substrate 1, an n-type AlGaAs confinement layer 2 formed on the substrate 1, and a quantum well layer 3 formed on the confinement layer z and having a partially different thickness L. , the p-type AlGaAs confinement layer 4 on the valve furnace layer 3, the p-type A
It consists of a P-side electrode 5 (51-55) formed in a stripe shape on the lGaAs confinement layer 4, and an N-side electrode 6 formed on the back surface of the substrate 1. In order to form the P-side electrode 5 in a stripe shape, an oxide film stripe method is used, in which the area other than the stripe portion is covered in advance with an oxide film such as 5i02, or a Brainer stripe method, etc. is used to diffuse Z 2 only in the stripe portion. is used. Further, a p-type GaAs electrode layer is usually formed on the p-type confinement layer 4 in order to lower the electrode resistance.

次に、第3図および第4図を参照してこのような構造の
量子井戸半導体レーザの製造方法について説明する。
Next, a method for manufacturing a quantum well semiconductor laser having such a structure will be described with reference to FIGS. 3 and 4.

第3図は、部分的に厚さの異なる量子井戸層を形成する
際の分子線エピタキシャル成長機構を示す、まずn形G
aAs基板1上にn形AlGaAs閉じ込め層2を全面
に成長させる。このn形AlGaAs閉じ込め層は、 
Al混晶比が0.3で、Siをドープしキャリヤ濃度が
〜1018cm’のn形となっており、厚さは2〜34
mである。このn形AlGaAs閉じ込め層2上に場所
によって厚さく巾)の異なる量子井戸層3を成長させる
ためには、重文2のストライブ状の窓工2をもつ金属マ
スク11で基板1の層2を覆い、 Ga、 Asの原料
分子ビームをあてながら適当な時間間隔で、マスク11
を、そのストライプ窓12の巾方向にずらしてGaAs
の結晶成長を行なう。
Figure 3 shows the molecular beam epitaxial growth mechanism when forming quantum well layers with partially different thicknesses.
An n-type AlGaAs confinement layer 2 is grown over the entire surface of an aAs substrate 1. This n-type AlGaAs confinement layer is
It has an Al mixed crystal ratio of 0.3, is doped with Si, has a carrier concentration of ~1018 cm', is n-type, and has a thickness of 2 to 34 cm.
It is m. In order to grow a quantum well layer 3 of different thickness and width depending on the location on this n-type AlGaAs confinement layer 2, the layer 2 of the substrate 1 is mask 11 at appropriate time intervals while applying the raw material molecular beam of Ga and As.
is shifted in the width direction of the striped window 12 and the GaAs
crystal growth.

この結晶成長過程が第4図に詳しく示されてい1g+/
I+11雇づ1↓ム9−づh−1小→[ニノーh12の
重文2とこれらの間隔fLfとが等しく設定されている
This crystal growth process is shown in detail in Figure 4.
I+11 employment 1↓mu9-zuh-1small→[Nino h12 important text 2 and their interval fLf are set equal.

まず、最も短波長の発振波投入1に相当する厚さdlの
量子井戸を成長させる(第4図a)。
First, a quantum well with a thickness dl corresponding to the input oscillation wave 1 with the shortest wavelength is grown (FIG. 4a).

次に、金属マスク11を文、15だけ右方向にずらして
、この層(dl)上にさらに結晶を成長させ、2番目に
短い波長入2に相当する厚さCt、+a2とする(第4
図b)。
Next, the metal mask 11 is shifted to the right by 15 degrees, and a crystal is further grown on this layer (dl) to a thickness Ct + a2 corresponding to the second shortest wavelength (2).
Figure b).

同様にマスク11を順次ずらしながら結晶成長させてい
くと、2嘗15のマスク・シフトごとに、ct、+d2
+d3.d、+d、、+d3+d4 、d、+d2 +
a3+a4+d、と厚さの異なるGaAs量子井戸層が
形成される。
Similarly, if crystal growth is performed while sequentially shifting the mask 11, ct, +d2 for every 2 and 15 mask shifts.
+d3. d, +d,, +d3+d4 ,d, +d2 +
GaAs quantum well layers having different thicknesses, a3+a4+d, are formed.

この工程はマスク蒸着法として確立された方法であり、
再現性は非常によい、このようにして形成したGaAg
量子井戸層3上にp形りラッド層4を全面に形成し、ス
トライプ電極5および電極6を設け、基板を適当な箇所
で分割すれば多波長井戸半導体レーザが完成する。
This process is an established mask vapor deposition method,
GaAg formed in this way has very good reproducibility.
A p-type rad layer 4 is formed on the entire surface of the quantum well layer 3, striped electrodes 5 and electrodes 6 are provided, and the substrate is divided at appropriate locations to complete a multiwavelength well semiconductor laser.

この実施例の量子井戸レーザ素子は、5つの異なる波長
のレーザをモノリシックに集積化したもので、電極51
に電流を流せば波長入1のレーザ光が出射し、電極52
に電流を流せば波長入2のレーザ光が出射する。同様に
入3、入4、入5と5つの異なる波長のレーザ光を別個
に、または数個もしくは全部同時に出射させることが可
能である。以下に各パラメータの一例を示す。
The quantum well laser device of this embodiment is one in which lasers of five different wavelengths are monolithically integrated, and the electrode 51
When a current is applied to the electrode 52, a laser beam with a wavelength of 1 is emitted, and the electrode 52
When a current is applied to the laser beam, a laser beam with a wavelength of 2 is emitted. Similarly, it is possible to emit laser beams of five different wavelengths (input 3, input 4, input 5) separately, or several or all at the same time. An example of each parameter is shown below.

AI  Ga、xAs閉じ込み層2.4の混晶比x=0
.3 、 発振波長(nm)   入、、、、atO入2=820 人、 =830 人、 =840 人、=850 量子井戸層成長時のパラメータ(λ) d、  =68 d2 =10 d3 =10 d4 =12 第2図に示すように、量子井戸層3の厚さを連続的に変
化させるようにしてもよい。この場合に、電極5として
図示のように全面に設けてもよいし、第1図のようにス
トライプ状にしてもよい。
AI Ga, xAs confinement layer 2.4 mixed crystal ratio x=0
.. 3. Oscillation wavelength (nm) AtO input 2 = 820 people, = 830 people, = 840 people, = 850 Parameters during quantum well layer growth (λ) d, = 68 d2 = 10 d3 = 10 d4 =12 As shown in FIG. 2, the thickness of the quantum well layer 3 may be changed continuously. In this case, the electrode 5 may be provided on the entire surface as shown in the figure, or may be provided in a striped form as shown in FIG.

この発明は多重量子井戸構造(multiquantu
mwell、MQW)のレーザにも適用可能である。
This invention is based on a multi-quantum well structure (multiquantum well structure).
It can also be applied to lasers (mwell, MQW).

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の実施例を示す斜視図、第2図はこの
発明の他の実施例を示す斜視図、第3図は分子線エピタ
キシャル成長法を示す図、第4図は部分的に厚さの異な
る量子井戸層を成長させる様子を詳細に示す工程図であ
る。 1−−−GaAs基板、2−n形AlGaAs閉じ込め
層、3・・・GaAs量子井戸層、4・・・p形AlG
aAs閉じ込め層。 以  上
FIG. 1 is a perspective view showing an embodiment of the present invention, FIG. 2 is a perspective view showing another embodiment of the invention, FIG. 3 is a diagram showing the molecular beam epitaxial growth method, and FIG. 4 is a partially thickened FIG. 3 is a process diagram showing in detail how quantum well layers of different sizes are grown. 1--GaAs substrate, 2-n-type AlGaAs confinement layer, 3...GaAs quantum well layer, 4...p-type AlG
aAs confinement layer. that's all

Claims (1)

【特許請求の範囲】[Claims] 活性領域が量子井戸構造となっている量子井戸半導体レ
ーザにおいて、その量子井戸層の厚さが場所に応じて変
化していることを特徴とする量子井戸半導体レーザ。
A quantum well semiconductor laser whose active region has a quantum well structure, wherein the thickness of the quantum well layer varies depending on the location.
JP60174011A 1985-08-09 1985-08-09 Quantum well semiconductor laser Expired - Lifetime JPH0671115B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60174011A JPH0671115B2 (en) 1985-08-09 1985-08-09 Quantum well semiconductor laser

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60174011A JPH0671115B2 (en) 1985-08-09 1985-08-09 Quantum well semiconductor laser

Publications (2)

Publication Number Publication Date
JPS6235592A true JPS6235592A (en) 1987-02-16
JPH0671115B2 JPH0671115B2 (en) 1994-09-07

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP60174011A Expired - Lifetime JPH0671115B2 (en) 1985-08-09 1985-08-09 Quantum well semiconductor laser

Country Status (1)

Country Link
JP (1) JPH0671115B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01319986A (en) * 1988-06-21 1989-12-26 Matsushita Electric Ind Co Ltd Semiconductor laser device
JP2006339237A (en) * 2005-05-31 2006-12-14 Tohoku Techno Arch Co Ltd Multi-wavelength synchronized pulse light source

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102009013909A1 (en) 2009-03-19 2010-09-23 Osram Opto Semiconductors Gmbh Optoelectronic semiconductor device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61185993A (en) * 1985-02-13 1986-08-19 Matsushita Electric Ind Co Ltd Multi-wavelength semiconductor laser device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61185993A (en) * 1985-02-13 1986-08-19 Matsushita Electric Ind Co Ltd Multi-wavelength semiconductor laser device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01319986A (en) * 1988-06-21 1989-12-26 Matsushita Electric Ind Co Ltd Semiconductor laser device
JP2006339237A (en) * 2005-05-31 2006-12-14 Tohoku Techno Arch Co Ltd Multi-wavelength synchronized pulse light source

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JPH0671115B2 (en) 1994-09-07

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