JPS6237827B2 - - Google Patents
Info
- Publication number
- JPS6237827B2 JPS6237827B2 JP16995179A JP16995179A JPS6237827B2 JP S6237827 B2 JPS6237827 B2 JP S6237827B2 JP 16995179 A JP16995179 A JP 16995179A JP 16995179 A JP16995179 A JP 16995179A JP S6237827 B2 JPS6237827 B2 JP S6237827B2
- Authority
- JP
- Japan
- Prior art keywords
- frequency
- laser
- light
- diode
- differential
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/0607—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying physical parameters other than the potential of the electrodes, e.g. by an electric or magnetic field, mechanical deformation, pressure, light, temperature
- H01S5/0612—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium by varying physical parameters other than the potential of the electrodes, e.g. by an electric or magnetic field, mechanical deformation, pressure, light, temperature controlled by temperature
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Semiconductor Lasers (AREA)
Description
【発明の詳細な説明】
本発明は大気汚染物質等をレーザ方式で検出す
るシステムにおけるレーザ光周波数の周波数変調
方式に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a frequency modulation method of a laser light frequency in a system for detecting air pollutants and the like using a laser method.
レーザ方式の大気汚染監視システムは通常第1
図に示すごとく赤外線レーザ光の投受光装置つま
り観測装置20の設定地点から、たとえば数
100mのへだたりを有する長光路上にレトロリフ
レクタrを設置し、この長光路途上に浮遊する汚
染ガス、たとえば亜硫酸ガス(SO2)や一酸化炭
素(CO)中を往復する放射赤外線の吸収特性か
ら該汚染ガス(以下特にことわらぬかぎり単にガ
スと呼ぶ)濃度を求めるものであつてその概要に
ついて簡単に説明する。第1図中の観測装置20
外への赤外線放射は、波長可変な半導体ダイオー
ド・レーザ(以下単にレーザと呼ぶ)DLからの
Poなるパワーを有する光例えば赤外線をカセグ
レンレンズ1の内鏡の前面2で反射させることに
よつて光路へ方向に放射せしめ、遠方に置かれた
レトロリフレクタrで反射して帰つて来た入射光
を同じカセグレンレンズ1の外鏡の前面3と内鏡
の後面4で反射させ、受光素子Dに入射し、この
際の光往復時におこる前記ガスによる光吸収の結
果を記録器5で記録させるのであるが、この場合
該受光素子Dによる受光パワーPrは
Pr=Po exp{−α(ν)CL}f(t) …(1)
で与えられる。ここでα(ν)はレーザ光周波数
νの関数としての前記ガスによる吸収係数、Cは
該ガスの濃度、Lはレーザ光の往復光路長であ
る。また第1図中の光チヨツパCHは受光素子D
からの電気的出力信号を交流増幅器すなわち第1
および第2のロツクイン増幅器LA1,LA2と除算
器7からなる信号処理系21で処理するためにあ
らかじめレーザDLからの放射赤外光を例えば500
Hzの周波数で継続するためのものである。一点鎖
線イは該チヨツパCHから第1ロツクイン増幅器
LA1への参照信号伝達経路を形成しており、この
ため第1のロツクイン増幅器LA1からは前記受光
パワーPrに対応する電圧Erが出力される。とこ
ろでガスの光吸収スペクトルは光周波数νを軸横
に、受光パワーPrを縦軸にとつた第2図aの吸
収曲線となるが、前記(1)式中でf(t)として表
したガスの擾乱のために該曲線の吸収値mにゆら
ぎが生じて観測が困難となる。このため(1)式の両
辺をνについて微分し、かつ上記(1)式で規格化す
れば
Pr′/Pr=Po′/Po−CLα′ …(2)
として擾乱係数f(t)を消去できる。これが前
記の微分測法であるがα′は正負の両値を有する
ために、第2図aの曲線の微分結果すなわち
(Pr′/Pr)は第2図bのごとき2つのピークを呈
する
N字型の曲線となるので、以下では第2図aを単
なる吸収曲線、第2図cを微分吸収曲線と呼んで
区別する。なお、(2)式中のPr′,Po′,α′はそれ
ぞれ(1)式中のPr,Po,αの光周波数νに対する
微分値である。 Laser-based air pollution monitoring systems are usually the first
As shown in the figure, for example, several
A retroreflector r is installed on a long optical path with a gap of 100 m, and radiation infrared rays are absorbed as they travel back and forth through pollutant gases such as sulfur dioxide gas (SO 2 ) and carbon monoxide (CO) floating on this long optical path. The concentration of the pollutant gas (hereinafter simply referred to as gas unless otherwise specified) is determined from its characteristics, and its outline will be briefly explained. Observation device 20 in Figure 1
Infrared radiation to the outside comes from a wavelength-tunable semiconductor diode laser (hereinafter simply referred to as a laser) DL.
Light having a power of Po, such as infrared light, is reflected by the front surface 2 of the internal mirror of the Cassegrain lens 1 to radiate it in the optical path, and the incident light is reflected by a retroreflector r placed far away and returned. The light is reflected by the front surface 3 of the outer mirror and the rear surface 4 of the inner mirror of the same Cassegrain lens 1 and is incident on the light receiving element D, and the result of light absorption by the gas that occurs when the light travels back and forth at this time is recorded by the recorder 5. However, in this case, the light reception power Pr by the light receiving element D is given by Pr=Po exp {−α(ν) CL}f(t) (1). Here, α(ν) is the absorption coefficient of the gas as a function of the laser beam frequency ν, C is the concentration of the gas, and L is the round trip optical path length of the laser beam. In addition, the optical chopper CH in Fig. 1 is the light receiving element D.
The electrical output signal from the
In order to process the infrared light emitted from the laser DL in advance by the signal processing system 21 consisting of the second lock-in amplifiers LA 1 and LA 2 and the divider 7,
It is intended to continue at a frequency of Hz. The dashed line A indicates the first lock-in amplifier from the chipper CH.
A reference signal transmission path to LA 1 is formed, and therefore, a voltage Er corresponding to the received light power Pr is output from the first lock-in amplifier LA 1 . By the way, the optical absorption spectrum of a gas is the absorption curve shown in Figure 2a, with the optical frequency ν on the horizontal axis and the received light power Pr on the vertical axis. Due to the disturbance, the absorption value m of the curve fluctuates, making observation difficult. Therefore, by differentiating both sides of equation (1) with respect to ν and normalizing it using equation (1) above, we get Pr'/Pr=Po'/Po-CLα'...(2) and eliminate the disturbance coefficient f(t). can. This is the differential measurement method mentioned above, but since α' has both positive and negative values, the differential result of the curve in Figure 2a, ie (Pr'/Pr), exhibits two peaks as shown in Figure 2b.N Since the curve is in the shape of a letter, hereinafter, Fig. 2 a will be referred to as a simple absorption curve, and Fig. 2 c will be referred to as a differential absorption curve. Note that Pr', Po', and α' in equation (2) are the differential values of Pr, Po, and α in equation (1), respectively, with respect to the optical frequency ν.
こうした微分計測を行うには、従来は第2図a
の吸収曲線の変曲点オに対応した周波数ν0の光
をレーザDLから放射させるべく、該レーザDLを
同図中でI0として示した直流電流で駆動するに際
して、該電流の供給源すなわち第1図中の電源8
中において該電流I0にI1,I2なる尖頭値を有する
微小振幅の交流電流IACを重畳せしめ、これによ
つてレザDLからの発光周波数νをν1からν2
まで変化せしめ、一種の周波数変調をほどこして
いた。第1図中の第2のロツクイン増幅器LA2に
は上記微小振幅の交流電流IACに対応した交番信
号が電源8から参照信号として伝達経路ロを介し
ているために該第2のロツクイン増幅器LA2は微
分モードで動作し、このため該増幅器LA2の出力
にはE′rなる微分出力電圧が表れるが、これは前
記受光パワーPrの微分値Pr′に対応する。この微
分出力電圧E′rと先述の第1ロツクイン増幅器
LA1からの出力電圧Er(受光パワーPrに対応す
る)とは減算器7で減算されるのでEr′/Erに対
応する第2図bの(Pr′/Pr)の値は記録器5で
記録される。なお、前記第1図中では説明の便宜
上、省略してダイオードレーザを単にDLなる記
号で示してあるが、実際のダイオード・レーザ素
子は図示しないデユワーの内筒を形成する循環型
冷凍機の一部たるコールドヘツド上に取りつけら
れ、高圧ヘリウムガスを、これも図示しないコン
プレツサから該デユワー内に供給循環せしめて上
記ダイオード・レーザ素子を冷却せしめる必要が
ある。 In order to perform such differential measurement, conventionally, Figure 2a
When driving the laser DL with a direct current shown as I 0 in the figure in order to emit light with a frequency ν 0 corresponding to the inflection point O of the absorption curve from the laser DL, the source of the current, i.e. Power supply 8 in Figure 1
Inside, an alternating current I AC of minute amplitude having peak values I 1 and I 2 is superimposed on the current I 0, thereby changing the light emission frequency ν from the laser DL from ν 1 to ν 2 .
It changed the frequency to a certain level, creating a kind of frequency modulation. The second lock-in amplifier LA2 in FIG . 2 operates in a differential mode, and therefore a differential output voltage E'r appears at the output of the amplifier LA2 , which corresponds to the differential value Pr' of the received light power Pr. This differential output voltage E'r and the first lock-in amplifier mentioned above
Since the output voltage Er (corresponding to the received light power Pr) from LA 1 is subtracted by the subtracter 7, the value of (Pr'/Pr) in Fig. 2b, which corresponds to Er'/Er, is obtained by the recorder 5. recorded. Note that in FIG. 1, the diode laser is simply indicated by the symbol DL for convenience of explanation, but the actual diode laser element is part of a circulating refrigerator that forms the inner cylinder of the dewar (not shown). It is necessary to supply and circulate high pressure helium gas into the dewar from a compressor, also not shown, to cool the diode laser element.
以上のようにすれば、汚染ガス濃度Cは第2図
bの微分吸収値(Pr′/Pr)の曲線のピークnの
大きさから容易に求めうるが、そのためには赤外
光源たるレーザDLの駆動電流I0に重畳すべき前
記交流電流IACの振幅を極めて安定させる必要が
あるほかにこうした高精度の交流電流を第1図中
の電源8中に備える必要が生じる。こうした高精
度の交流電流発生器は著しく高価であるとともに
こうした微小電流IACを前記直流電流I0に重畳せ
しめるための一種の加算回路が必要となり、この
ためレーザ駆動電源8の内部は著しく複雑化する
という欠点があつた。 As described above, the contaminant gas concentration C can be easily determined from the size of the peak n of the differential absorption value (Pr'/Pr) curve in Figure 2b. In addition to the need to extremely stabilize the amplitude of the alternating current I AC to be superimposed on the drive current I 0 , it is also necessary to provide such a highly accurate alternating current in the power supply 8 in FIG. Such a high-precision AC current generator is extremely expensive, and also requires a type of addition circuit to superimpose such a minute current I AC on the DC current I 0 , which makes the inside of the laser drive power supply 8 extremely complicated. There was a drawback of doing so.
本発明はこうした欠点に鑑みてなされたもの
で、ダイオード・レーザ駆動電流I0に高精度の正
弦波電流IACを重畳せしめずに、コンプレツサか
ら供給される寒剤たとえば高圧ヘリウムガスの圧
縮、膨張に基づく熱サイクルを利用して、レーザ
DLの温度を周期的に変化せしめ、これによつて
該レーザDLからの発光周波数νに周波数変調を
施すもので以下図面を用いて詳記する。 The present invention has been made in view of these drawbacks, and it does not superimpose a highly accurate sinusoidal current I AC on the diode laser drive current I 0 , but instead allows the compression and expansion of a cryogen such as high-pressure helium gas supplied from a compressor. Based on the thermal cycle, the laser
The temperature of the DL is changed periodically, thereby frequency modulating the emission frequency ν from the laser DL, which will be described in detail below with reference to the drawings.
第2図は本発明に係るレーザ光周波数νの周波
数変調方式を示したもので前記第1図と同等部位
には同一記号を付す。 FIG. 2 shows a frequency modulation method of the laser light frequency ν according to the present invention, and the same symbols are attached to the same parts as in FIG. 1.
まずダイオード・レーザ素子DLは循環型冷凍
機の一部を構成するデユワーDU内のコールドヘ
ツドHに良好な熱導伝性を有するように装着され
ており、該デユワーDUには矢印ワで示したよう
にコンプレツサCOからの寒剤たとえば高圧ヘリ
ウムガスが供給循環されるようになつている。上
記デユワー内の高圧ヘリウムガスのコンプレツサ
COによる圧縮時にはコールドヘツドの温度が上
昇し、逆に該ガスの膨張時には温度が低下する。
こうしたコールドヘツドの温度の上昇、低下はコ
ンプレツサーCOの極めて規則正しい動作によつ
て周期的にもたらされるのであるが、該温度の上
昇、低下は直接レーザ素子DLに伝えられる。レ
ーザ素子DLの発光周波数νは該ダイオード素子
DLの温度に直接依存するから、あらかじめ該ダ
イオード素子DLに電源8から基準となる光周波
数ν0をもたらす直流電流I0を供給しておけば、
該ダイオード素子DLの発光周波数νはこの光周
波数ν0を中心としてν1からν2まで精度よく
変化し、それゆえに光周波数ν0に対する正確な
周波数変調を施しうる。このレーザダイオード
DLからの光(赤外線)は矢印カ方向に放射され
るが、チヨツパCHはこの光を断続せしめる役割
を演じる。該チヨツパCHからの信号処理系21
中に図示しない第1ロツクイン増幅器LA1への第
1の参照信号の伝達経路は矢印イで示されている
が、同じ信号処理系21中の図示しない第2ロツ
クイン増幅器LA2への経路ロによつて伝達される
べき第2の参照信号はコンプレツサCOに取付け
られた圧力トランスデユーサTを用いて取り出さ
れる。このようにすれば前記第1のロツクイン増
幅器LA1からは光路ヨを介して受光素子Dに入射
する光の受光パワーPrに対応した出力電圧Erが
出力される一方、前記第2のロツクイン増幅器
LA2からは該受光パワーPrの微分値Prに対応した
微分出力電圧Er′が取出され、これは信号処理系
21から出力されて記録器5で記録されるので前
記第2図bに示したと同じ微分吸収曲線が得られ
ることになる。 First, the diode/laser element DL is installed in the cold head H in the dewar DU, which constitutes a part of the circulating refrigerator, so as to have good thermal conductivity. In this way, a refrigerant such as high-pressure helium gas is supplied and circulated from the compressor CO. Compressor of high pressure helium gas in the above dewar
When compressed by CO, the temperature of the cold head increases; conversely, when the gas expands, the temperature decreases.
These temperature increases and decreases in the cold head are periodically brought about by the extremely regular operation of the compressor CO, and these temperature increases and decreases are directly transmitted to the laser element DL. The emission frequency ν of the laser element DL is the same as that of the diode element.
Since it directly depends on the temperature of DL, if the diode element DL is supplied in advance with a direct current I 0 that provides a reference optical frequency ν 0 from the power supply 8,
The light emission frequency ν of the diode element DL changes accurately from ν 1 to ν 2 with this optical frequency ν 0 as the center, and therefore accurate frequency modulation can be performed on the optical frequency ν 0 . This laser diode
The light (infrared rays) from the DL is emitted in the direction of the arrow, but Chiyotsupa CH plays the role of intermittent this light. Signal processing system 21 from the chipotop channel
The transmission path of the first reference signal to the first lock-in amplifier LA 1 (not shown) is indicated by arrow A, but the path to the second lock-in amplifier LA 2 (not shown) in the same signal processing system 21 is indicated by arrow B. The second reference signal to be transmitted is thus extracted using a pressure transducer T attached to the compressor CO. In this way, the first lock-in amplifier LA 1 outputs an output voltage Er corresponding to the received light power Pr of the light incident on the light receiving element D via the optical path Y, while the second lock-in amplifier
A differential output voltage Er' corresponding to the differential value Pr of the received light power Pr is extracted from LA 2 , and this is output from the signal processing system 21 and recorded by the recorder 5, so that it is shown in FIG. 2b above. The same differential absorption curve will be obtained.
以上に述べた本発明に係る光周波数変調方式を
用いれば、基準光周波数に対応するダイオードレ
ーザの駆動直流電流に重畳すべき高い精度の微小
交流電流の発生器が不必要となり、これに伴つて
観測装置内の投光装置周辺回路が非常に簡単化さ
れるために、実用上多大の効果が期待できる。 If the optical frequency modulation method according to the present invention described above is used, there is no need for a highly accurate minute alternating current generator to be superimposed on the driving direct current of the diode laser corresponding to the reference optical frequency. Since the circuitry surrounding the light projector in the observation device is greatly simplified, great practical effects can be expected.
第1図は大気汚染ガス濃度の測定装置の一例を
示す系統図、第2図aおよびbは該測定装置によ
つて得られる光吸収スペクトルの吸収曲線ならび
に微分吸収曲線を示す図、第3図は本発明に係る
光周波数変調方式に基づく光周波数変調装置とそ
れに関連する装置との関係を示す系統図である。
CH…チヨツパ、CO…コンプレツサ、DL…ダ
イオード・レーザ、D…受光素子、H…コールド
ヘツド、T…圧力トランスデユーサ、ワ…寒剤の
供給循環経路、カ…放射光路、ヨ…入射光路、5
…記録器、8…直流電源、21…信号処理系。
Fig. 1 is a system diagram showing an example of a measuring device for atmospheric pollutant gas concentration, Fig. 2 a and b are diagrams showing absorption curves and differential absorption curves of a light absorption spectrum obtained by the measuring device, and Fig. 3 1 is a system diagram showing the relationship between an optical frequency modulation device based on an optical frequency modulation method according to the present invention and devices related thereto; FIG. CH...Chiyotsupa, CO...Compressor, DL...Diode laser, D...Photodetector, H...Cold head, T...Pressure transducer, W...Cryogen supply circulation path, F...Radiation optical path, Y...Incoming optical path, 5
...Recorder, 8...DC power supply, 21...Signal processing system.
Claims (1)
ダイオード・レーザ素子から放射される基準光周
波数に対して所定の周波数偏差を与える周波数変
調形式の発光系において、上記ダイオード・レー
ザ素子に前記の基準光周波数に対応する直流電流
を供給する一方、前記冷凍機の圧縮、膨張に基づ
いた温度変化サイクルを前記基準光周波数に対し
て与えるべき周波数偏差に対応させ、該温度変化
によつて周波数偏差を与えるようにしたことを特
徴とする光周波数変調方式。1. In a frequency modulation type light emitting system that provides a predetermined frequency deviation with respect to a reference light frequency emitted from a diode/laser element installed in the cold head of a circulating refrigerator, the reference light is applied to the diode/laser element. While supplying a direct current corresponding to the frequency, a temperature change cycle based on compression and expansion of the refrigerator is made to correspond to a frequency deviation to be given with respect to the reference optical frequency, and a frequency deviation is given by the temperature change. An optical frequency modulation method characterized by:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16995179A JPS5691488A (en) | 1979-12-25 | 1979-12-25 | Light frequency modulation system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16995179A JPS5691488A (en) | 1979-12-25 | 1979-12-25 | Light frequency modulation system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5691488A JPS5691488A (en) | 1981-07-24 |
| JPS6237827B2 true JPS6237827B2 (en) | 1987-08-14 |
Family
ID=15895884
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16995179A Granted JPS5691488A (en) | 1979-12-25 | 1979-12-25 | Light frequency modulation system |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5691488A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0736318U (en) * | 1991-03-15 | 1995-07-04 | 貢 長谷川 | Desk lamp with a shading device for blocking direct light or strong reflected light |
-
1979
- 1979-12-25 JP JP16995179A patent/JPS5691488A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0736318U (en) * | 1991-03-15 | 1995-07-04 | 貢 長谷川 | Desk lamp with a shading device for blocking direct light or strong reflected light |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5691488A (en) | 1981-07-24 |
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