JPS6239780A - Apparatus for analyzing and displaying trouble - Google Patents

Abstract

PURPOSE:To indicate the area having the possibility of trouble on a circuit board to display the same, by automatically performing the analysis of trouble on the basis of failure information obtained when the board failed in a function test. CONSTITUTION:The function test of a circuit board is performed and, when the substrate failed in said test, a central control unit (CPU)1 performs a trouble analyzing program on the basis of the trouble indicating information stored in a memory 4. A display apparatus 3 immediately performs the automatic indication and display of trouble on the basis of the practice of said program. When the board failed in a plurality of patterns, indication and display are performed in the order of an area most having the possibility of trouble and an area having the possibility of trouble in the next degree on the basis of a plurality of failure informations and trouble indicating information.

Description

[Detailed Description of the Invention] [Industrial Application Field] This invention performs a function test on a board on which components are mounted, and when the function test results in a failure, failure analysis is performed based on the failure information and the location of the failure is determined. The present invention relates to a failure analysis display device that displays indications of problems.

[Conventional technology] Conventionally, failure analysis when a function test fails on a board on which MS1 parts, LSI parts, etc. are mounted has been carried out using a failure indication list created when creating a test pattern for a board test and a logical diagram of the board. The location of the failure on the board was manually analyzed based on the input cover turn at the time of failure, the expected value when the input cover turn was applied, etc.

To explain this in more detail, the function test of a board on which components are mounted is to apply an input pattern series from the external input pin of the board, observe the results from the external output pin of the board, and compare them in an expected value table. At this time, if the actual test result and the expected value do not match, there is a fault on the board, and we analyze and point out where on the board the fault is, and take measures such as replacing the faulty part. It becomes necessary to do so. In order to analyze and point out this failure, for each input pattern for performing a funsion test, refer to the failure indication list that shows the failure points that can be detected by that pattern, and Fault analysis and fault indication were performed by referring to logic drawings, etc.

Since the input cover turn series in the circuit board function test is large, the amount of troubleshooting required is large.Also, in actual tests, it does not fail with just one pattern, but with several patterns or dozens of patterns in the input cover turn series. It was not easy to analyze because it failed in multiple patterns.

[Problem that the invention seeks to solve]

Conventional failure analysis when a board fails in a function test uses the method described above, so it is not possible to easily point out the failure, and a list of failure points, drawings, etc. are required to perform failure analysis. However, there were problems such as a large amount of time and effort required.

This invention was made to solve the above-mentioned problems, and automatically performs failure analysis based on the failure information when a board fails in a function test, and identifies possible failures on the board. The object of the present invention is to provide a failure analysis display device that can point out a certain point and display the pointed out point.

[Means for solving problems]

The failure analysis display device according to the present invention includes a storage device 4 that holds information necessary for failure analysis;
A central processing unit 1 has a failure analysis program that performs failure analysis when the above-mentioned fail occurs based on information held in
The present invention is characterized in that it is equipped with a display device 3 that points out locations where there is a possibility of failure.

[Effect]

If the function test results in a failure, the central processing unit executes a failure analysis program based on the information held in the storage device.

Possible locations of failure obtained by executing this failure analysis program are displayed and pointed out on the display device.

〔Example〕

An embodiment of the present invention will be described below.

FIG. 1 shows an embodiment of the present invention. FIG. 1 is a diagram showing a system configuration. In Figure 1, 1 is the central processing unit (
CPU), 2 is a console for instructing failure analysis display, 3 is a display device such as a CRT for displaying failure analysis, and 4 is a magnetic disk or the like that holds information necessary for failure analysis. 5 is a printer for outputting a necessary list; 6 is a board tester for testing the board; and an interface section for connecting with the host computer; 7 is a board tester system for testing the board; 8 is a host computer in which input pattern series for testing the board, their expected values, and information necessary for failure analysis are created.

Further, FIG. 2 is a format diagram showing an example of information for pointing out a fault that is created at the same time when the input pattern series and its expected value for a board function test are created by a fault simulation or the like. In Figure 2, 1.
10 is a failure that can be detected in each pattern of the input pattern series. For example, when one pattern is applied to the first 1-1-300-2001, and a failure occurs in the bin with the output pin number 1 on the board, the failure group number 300. This indicates that there is a possibility of failure at two locations in 2001. 11 indicates the failure location on the board for each failure number.

In the failure analysis display device configured as described above, if the board fails as a result of the function test, the failed pattern number and output pin number are stored in the storage device 4, which are information at the time of failure, for example. Based on the failure indication information shown in FIG. 2, the central processing unit 1 executes a failure analysis program, and based on the execution of this program, the display device 3 automatically displays failure indication 1. As a result, if the function test fails, the display device 3 immediately points out and displays the location where the failure may occur. In addition, when failure occurs in multiple patterns, based on the multiple failure information and the failure indication information shown in Figure 2, point 1 is placed in the order of the most likely location, followed by the location with the highest possibility of failure. Display is performed.

〔Effect of the invention〕

As explained above, the present invention includes a storage device that holds information necessary to perform failure analysis, and a failure analysis program that performs failure analysis when the above-mentioned fail occurs based on the information held in this storage device. Equipped with a central processing unit and a display device that points out possible failure points through failure analysis by this central processing unit, it is possible to significantly reduce the time and effort required for failure analysis, and to easily detect failures. This has the effect of being able to find the location.

[Brief explanation of the drawing]

FIG. 1 is a block diagram of a failure analysis display device according to an embodiment of the present invention, and FIG. 2 is a format diagram showing an example of information for pointing out a failure. 1 is a central processing unit, 3 is a display device, 4 is a storage device, 5 is a printer, 6 is an interface unit, 7 is a board tester system, and 8 is a host combinator. Agent: Masuo Oiwa (and 2 others) Figure 1 Figure 2 Procedural amendment form (self-effective Showa month date!

Claims (1)

[Claims] This is a failure analysis display device that performs a function test on a board, and when the function test fails, performs failure analysis based on this failure information and points out the failure location, and holds the information necessary for failure analysis. a central processing unit having a failure analysis program that performs a failure analysis when the above-mentioned fail occurs based on the information held in this storage device; A failure analysis display device characterized by comprising: a display device for pointing out.