JPS625292B2 - - Google Patents
Info
- Publication number
- JPS625292B2 JPS625292B2 JP6727381A JP6727381A JPS625292B2 JP S625292 B2 JPS625292 B2 JP S625292B2 JP 6727381 A JP6727381 A JP 6727381A JP 6727381 A JP6727381 A JP 6727381A JP S625292 B2 JPS625292 B2 JP S625292B2
- Authority
- JP
- Japan
- Prior art keywords
- resistor
- resistance
- current setting
- point
- measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 claims description 23
- 230000001629 suppression Effects 0.000 claims description 9
- 238000009529 body temperature measurement Methods 0.000 claims description 5
- 230000003321 amplification Effects 0.000 claims 1
- 238000003199 nucleic acid amplification method Methods 0.000 claims 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 4
- 230000007423 decrease Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000000284 extract Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/18—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer
- G01K7/20—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer in a specially-adapted circuit, e.g. bridge circuit
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
- Arrangements For Transmission Of Measured Signals (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Description
【発明の詳細な説明】
この発明は測温抵抗体による温度測定回路の改
良に関し、特に測温抵抗体の抵抗値変化がもたら
す測定電流の変動による測定誤差、差動増幅器に
流入する電流によつて発生する誤差等を充分小さ
い値に軽減することができる測温抵抗体による温
度測定回路を提供しようとするものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to improvements in temperature measurement circuits using resistance temperature detectors, and in particular to improvements in measurement errors caused by fluctuations in measurement current caused by changes in the resistance value of resistance temperature detectors, and by currents flowing into differential amplifiers. It is an object of the present invention to provide a temperature measurement circuit using a resistance temperature sensor, which can reduce errors and the like that occur due to the temperature measurement to a sufficiently small value.
第1図に従来の測温抵抗体による温度測定回路
を示す。この温度測定回路は定電圧源VEと基準
電位点D間に抵抗器1,2,4と測温抵抗体3に
よつて構成した抵抗ブリツジを接続し、測温抵抗
体3と抵抗器4に発生する電圧の差電圧を差動増
幅器5によつて増幅して取出す回路である。この
温度測定回路は一般に広く用いられており、その
特徴とする点は測温抵抗体3が三線式であつてそ
のリード線6と7に同一方向に電流を流し、その
和の電流をリード線8に流して帰路させるように
し、このようにしてリード線6及び7の線路抵抗
rに発生する電圧E1,E2を端子9及び10間で
相殺するようにした点である。 FIG. 1 shows a conventional temperature measuring circuit using a resistance temperature detector. This temperature measuring circuit connects a resistance bridge composed of resistors 1, 2, 4 and a resistance temperature detector 3 between a constant voltage source V E and a reference potential point D, This circuit amplifies and extracts the differential voltage generated between the voltages using the differential amplifier 5. This temperature measurement circuit is widely used in general, and its characteristic feature is that the resistance temperature detector 3 is of a three-wire type, and current is passed in the same direction through the lead wires 6 and 7, and the sum of the currents is passed through the lead wires 6 and 7. In this way, the voltages E 1 and E 2 generated in the line resistance r of the lead wires 6 and 7 are canceled out between the terminals 9 and 10.
一般には抵抗器1及び2によつて測温抵抗体3
と抵抗器4を流れる電流を設定し、抵抗器4によ
つて差動増幅器の出力端子12に出力される出力
電圧のゼロ点を設定する。従つて抵抗器1及び2
を測定電流設定抵抗器と称し、抵抗器4を零サプ
レツシヨン抵抗器と称している。抵抗器1,2,
4の抵抗値をR1,R2,R4とし、測温抵抗体3の
測定レンジの0%時の抵抗値をR3とすれば、一
般にはR1=R2,R3=R4のように設定される。ま
た差動増幅器5の演算抵抗器13,14と15,
16の抵抗値をRa,Rb,Ra′,Rb′とした場合
Ra=Ra′,Rb=Rb′に選定するものとする。 In general, resistance temperature detector 3 is connected by resistors 1 and 2.
The current flowing through the resistor 4 is set, and the zero point of the output voltage outputted by the resistor 4 to the output terminal 12 of the differential amplifier is set. Therefore resistors 1 and 2
is called a measurement current setting resistor, and resistor 4 is called a zero suppression resistor. Resistor 1, 2,
4 are R 1 , R 2 , R 4 , and the resistance value at 0% of the measurement range of the resistance thermometer 3 is R 3 . Generally, R 1 = R 2 , R 3 = R 4 It is set as follows. Also, the operational resistors 13, 14 and 15 of the differential amplifier 5,
When the resistance values of 16 are R a , R b , R a ′, and R b ′, R a =R a ′, and R b =R b ′ are selected.
ところでこの第1図に示す回路は次のような欠
点がある。 However, the circuit shown in FIG. 1 has the following drawbacks.
(1) 測定温度が変化するに伴なつて測温抵抗体3
の抵抗値R3が変化するものであるがR3が変化
することによつて測温抵抗体を流れる測定電流
が変化し、誤差が発生する。つまり測温抵抗体
3の抵抗値R3が測定温度に応じて変化すると
抵抗器1と測温抵抗体3を流れる電流値が変化
する。この電流の変動によりリード線6におけ
る電圧降下E1が変化し、その変化分が誤差と
なる。更に測温抵抗体3の抵抗値R3と、測温
抵抗体3での電圧降下との間係が非線形とな
る。この測定誤差は、R1≫R3の関係に選定す
ることにより或る程度は軽減できるがそれには
限界がある。(1) As the measured temperature changes, the resistance temperature detector 3
However, due to the change in R 3 , the measurement current flowing through the resistance temperature sensor changes, causing an error. That is, when the resistance value R 3 of the resistance temperature detector 3 changes in accordance with the measured temperature, the value of the current flowing through the resistor 1 and the resistance temperature detector 3 changes. Due to this current fluctuation, the voltage drop E 1 in the lead wire 6 changes, and the amount of the change becomes an error. Furthermore, the relationship between the resistance value R 3 of the resistance temperature detector 3 and the voltage drop across the resistance temperature detector 3 becomes nonlinear. This measurement error can be reduced to some extent by selecting the relationship R 1 >>R 3 , but there is a limit to this.
(2) ブリツジを流れる測定電流が差動増幅器5の
演算抵抗器13,15に分流し、これにより測
定電流に変化を与え、この測定電流の変化によ
り誤差が発生する。(2) The measurement current flowing through the bridge is shunted to the operational resistors 13 and 15 of the differential amplifier 5, which causes a change in the measurement current, and this change in measurement current causes an error.
つまり、差動増幅器の演算抵抗13,15を
流れる電流は演算抵抗器13,14の抵抗値R
aとRa′が大きい程小さくなり、誤差も小さく
なる。然し乍ら演算抵抗器13と15の抵抗値
は増幅器で必要とするバイアス電流値によつて
制限され、現状では無制限に大きくできるもの
ではない。従つて差動増幅器を用いる限りにお
いては差動増幅器に分流する電流によつて発生
する誤差を充分小さくできない欠点がある。 In other words, the current flowing through the operational resistors 13 and 15 of the differential amplifier is the resistance value R of the operational resistors 13 and 14.
The larger a and R a ' become, the smaller the error becomes. However, the resistance values of the operational resistors 13 and 15 are limited by the bias current value required by the amplifier, and cannot be increased indefinitely at present. Therefore, as long as a differential amplifier is used, there is a drawback that the error caused by the current shunted to the differential amplifier cannot be sufficiently reduced.
(3) 測温抵抗体3のリード線6及び7の長さが変
わり、その抵抗分rが変化するとスパン誤差が
発生する欠点がある。(3) If the lengths of the lead wires 6 and 7 of the resistance temperature detector 3 change and their resistance r changes, there is a drawback that a span error occurs.
つまりリード線6及び7の長さが変わるとブ
リツジを流れる測定電流が変化する。これによ
り測温抵抗体が所定温度範囲内において所定の
抵抗値変化をもたらしても、その抵抗値変化に
より所定の電圧変化を取出し得なくなりスパン
誤差が発生する。 That is, if the lengths of the leads 6 and 7 change, the measured current flowing through the bridge will change. As a result, even if the resistance temperature detector brings about a predetermined change in resistance value within a predetermined temperature range, the change in resistance value makes it impossible to obtain a predetermined voltage change, resulting in a span error.
このスパン誤差を小さくするには(1)項と同様
にR1≫R3及びR2≫R4の関係に選定することに
よつて或る程度の軽減は達せられるが、リード
線6及び7の長さが大幅に変わつた場合にはそ
れに応じたスパン誤差が発生し無視できないも
のとなつている。つまり製造時に調整のために
接続したリード線6,7と実際にフイールドに
設置される場合のリード線6,7の長さには大
きな違いがあるのが普通である。よつてフイー
ルドに設置した状態で再度スパン調整をしなけ
ればならない欠点がある。 This span error can be reduced to a certain extent by selecting the relationships R 1 ≫ R 3 and R 2 ≫ R 4 as in item (1), but lead wires 6 and 7 If the length of the span changes significantly, a corresponding span error will occur and cannot be ignored. In other words, there is usually a large difference in length between the lead wires 6 and 7 connected for adjustment during manufacturing and the lengths of the lead wires 6 and 7 when actually installed in the field. Therefore, it has the disadvantage that the span must be adjusted again while it is installed in the field.
(4) 差動増幅器5を構成する演算抵抗器13〜1
6の相互の比の温度変動に起因し、出力端子1
2にゼロサプレツシヨン抵抗器R4における電
圧降下に比例した約
Ra+Rb/Ra倍されたゼロ点変動が生じる。(4) Operational resistors 13 to 1 forming the differential amplifier 5
Due to temperature fluctuations in the mutual ratio of 6, output terminal 1
2, a zero point variation of approximately R a +R b /R a times proportional to the voltage drop across the zero suppression resistor R 4 occurs.
この発明の目的はこれら(1)〜(4)項で説明した各
種の誤差及びゼロ点変動を除去することができる
測温抵抗体による温度測定回路を提供するにあ
る。 An object of the present invention is to provide a temperature measuring circuit using a temperature measuring resistor that can eliminate the various errors and zero point fluctuations described in sections (1) to (4).
以下にこの発明の一実施例を第2図を用いて詳
細に説明する。 An embodiment of the present invention will be described in detail below with reference to FIG.
この発明においては測定電流設定抵抗器1及び
2と、測温抵抗体3及びゼロサプレツシヨン抵抗
器4によつて構成された抵抗ブリツジに対して電
流設定抵抗器2とゼロサプレツシヨン抵抗器4と
の接続点Aの電位が常に基準電位点Dの電位とな
るように制御する手段17を設けると共に測定電
流設定抵抗器1と測温抵抗体3の接続点Bの電位
を正帰還抵抗器18を持つ増幅器19によつて増
幅するように構成したものである。 In this invention, a current setting resistor 2 and a zero suppression resistor are connected to a resistance bridge constituted by measuring current setting resistors 1 and 2, a temperature sensing resistor 3, and a zero suppression resistor 4. A positive feedback resistor is provided to control the potential at the connection point A between the measurement current setting resistor 1 and the temperature sensing resistor 3 so that the potential at the connection point A with the measuring current setting resistor 1 always becomes the potential at the reference potential point D. The signal is amplified by an amplifier 19 having 18.
手段17は演算増幅器によつて構成することが
できる。演算増幅器の例えば反転入力端子をブリ
ツジのA点に接続し、非反転入力端子を基準電位
点Dに接続する。更に演算増幅器の出力を端子1
1に接続しブリツジを流れる電流を手段7を構成
する演算増幅器によつて吸引するように構成す
る。 The means 17 can be constituted by an operational amplifier. For example, an inverting input terminal of the operational amplifier is connected to a point A of the bridge, and a non-inverting input terminal is connected to a reference potential point D. Furthermore, the output of the operational amplifier is connected to terminal 1.
1 and configured to draw the current flowing through the bridge by an operational amplifier constituting means 7.
また増幅器19は出力端と基準電位点Dの間に
接続した抵抗器20と21の分圧点から負帰還を
掛け、出力と非反転入力端子との間に正帰還抵抗
器18を接続し、その正帰還点をブリツジのB点
とする。従つて増幅器19は入力インピーダンス
が充分高い不平衡入力形増幅器として動作する。 Further, the amplifier 19 applies negative feedback from the voltage dividing point of resistors 20 and 21 connected between the output terminal and the reference potential point D, and connects the positive feedback resistor 18 between the output and the non-inverting input terminal. Let the positive feedback point be point B of the bridge. Therefore, the amplifier 19 operates as an unbalanced input type amplifier with sufficiently high input impedance.
このように構成することにより手段17の利得
が充分大きいものとするとブリツジのA点の電位
は基準電位点Dと等しい電位となるように端子1
1の電位が制御される。従つて測定電流設定抵抗
器2とゼロサプレツシヨン抵抗器4を流れる電流
は抵抗器2の抵抗値をR2、定電圧源VEの電圧を
Vとすれば、V/R2となり、測温抵抗体3のリ
ード線7の線路抵抗rに影響を受けることなく抵
抗器2を流れる電流は一定値に保持される。故に
ブリツジの下端C点の電位をVCとすると、
VC=−V/R2×(R4+r) …………(1)
となる。 With this configuration, if the gain of the means 17 is sufficiently large, the potential at the point A of the bridge is equal to the reference potential point D.
1 is controlled. Therefore, the current flowing through the measurement current setting resistor 2 and the zero suppression resistor 4 is V/R 2, where the resistance value of the resistor 2 is R 2 and the voltage of the constant voltage source V E is V. The current flowing through the resistor 2 is maintained at a constant value without being affected by the line resistance r of the lead wire 7 of the temperature resistor 3. Therefore, if the potential at point C at the lower end of the bridge is V C , then V C =-V/R 2 ×(R 4 +r) ……(1).
B点の電位をVBとすると、出力端子12の出
力電圧VOは、
VO=Ra+Rb/Ra×VB …………(2)
となる。 When the potential at point B is V B , the output voltage V O of the output terminal 12 is V O =R a +R b /R a ×V B (2).
但し、Raは抵抗器20の抵抗値、Rbは抵抗器
21の抵抗値である。 However, R a is the resistance value of the resistor 20 and R b is the resistance value of the resistor 21 .
B点の電位VBは電流設定抵抗器1と、測温抵
抗体3とリード線6の線路抵抗rの直列回路と、
正帰還抵抗器18で構成されるY形回路の接続点
の電位であるからVBは次のように書換えること
ができる。 The potential V B at point B is a series circuit of the current setting resistor 1, the resistance temperature detector 3, and the line resistance r of the lead wire 6,
Since it is the potential at the connection point of the Y-shaped circuit constituted by the positive feedback resistor 18, VB can be rewritten as follows.
ここでRCは正帰還抵抗器18の抵抗値。 Here, R C is the resistance value of the positive feedback resistor 18.
これをVBについて解くと、 ここでR1=R2=Rとすると、 となる。 Solving this for V B , we get Here, if R 1 = R 2 = R, becomes.
第5式において、(R3+r){1/RC+1/R1−
1/RC・
(Ra+Rb)/Ra}の項をゼロとすることができる
とVB
とR3との間が比例関係となる。 In the fifth formula, (R 3 +r) {1/R C +1/R 1 −
If the term 1/R C ·(R a +R b )/R a } can be made zero, there will be a proportional relationship between V B and R 3 .
すなわち、
1/RC−1/RC・(Ra+Rb)/Ra+1/
R1=0
よつて、
RC=R1・Rb/Ra=R1(k−1)
但しkはk=Ra+Rb/Raであり、これは増幅器
1
9の利得を示す。 That is, 1/R C -1/R C・(R a +R b )/R a +1/
R 1 =0 Therefore, R C =R 1・R b /R a =R 1 (k-1) However, k is k=R a +R b /R a , which indicates the gain of amplifier 19. .
正帰還抵抗器18の抵抗値RCをRC=R1(k
−1)の関係に選定することにより
VB=V/R(R3−R4)
よつて、
VO=Ra+Rb/Ra・VB
=Ra+Rb/Ra・V/R・(R3−R4)…………(6
)
となり出力端子12には測温抵抗体3の抵抗値
R3に比例した出力電圧VOを得ることができる。 The resistance value R C of the positive feedback resistor 18 is R C = R 1 (k
-1), V B = V/R (R 3 - R 4 ) Therefore, V O = R a + R b /R a・V B = R a +R b /R a・V/ R・(R 3 − R 4 )…………(6
), and the output terminal 12 has the resistance value of the resistance temperature detector 3.
An output voltage V O proportional to R 3 can be obtained.
従つてこの発明によればブリツジのA点を制御
手段17によつて基準電位点Dの電位に保持し、
更に増幅器19の正帰還抵抗器18の抵抗値RC
をRC=R1(k−1)に選定することにより測温
抵抗体の抵抗値変化による測定電流の変化を正帰
還抵抗器18によつて補償することができる。 Therefore, according to the present invention, the point A of the bridge is held at the potential of the reference potential point D by the control means 17,
Furthermore, the resistance value R C of the positive feedback resistor 18 of the amplifier 19
By selecting R C =R 1 (k-1), the positive feedback resistor 18 can compensate for changes in the measurement current due to changes in the resistance value of the temperature-measuring resistor.
換言すれば測温抵抗体3の抵抗値R3が大きく
なつたときこれを流れる電流が減少してもその電
流の減少分は正帰還抵抗器18を通じてB点に流
入する電流によつて補償される。よつて測温抵抗
体3を流れる電流は常に一定値となるように動作
する。従つて従来例の(1)項で説明した、測定電流
の変化に基ずくリード線6における電圧降下E1
の変化から来る誤差を解消することができる。 In other words, even if the current flowing through the resistance temperature detector 3 decreases when the resistance value R3 of the resistance temperature detector 3 increases, the decrease in current is compensated for by the current flowing into point B through the positive feedback resistor 18. Ru. Therefore, the current flowing through the temperature measuring resistor 3 always operates at a constant value. Therefore, as explained in section (1) of the conventional example, the voltage drop E 1 in the lead wire 6 based on the change in the measured current
Errors resulting from changes in can be eliminated.
また電流設定抵抗器2とゼロサプレツシヨン抵
抗器4の接続点Aが基準電位に保持されることか
ら不平衡入力の演算増幅器を用いることができ差
動増幅器を利用しなくてよい。不平衡入力形演算
増幅器の入力バイアス電流はブリツジを流れる測
定電流に較べて充分小さくすることができる。よ
つて差動増幅器の場合のようにブリツジから余分
な電流を分流させないから従来例の(2)項で説明し
た欠点も解消できる。 Furthermore, since the connection point A between the current setting resistor 2 and the zero suppression resistor 4 is held at the reference potential, an operational amplifier with an unbalanced input can be used and a differential amplifier need not be used. The input bias current of the unbalanced input type operational amplifier can be made sufficiently small compared to the measurement current flowing through the bridge. Therefore, unlike in the case of a differential amplifier, unnecessary current is not shunted from the bridge, so the disadvantages described in item (2) of the conventional example can also be eliminated.
更に出力電圧VOにはリード線6及び7の線路
抵抗rの項を全く含まないから、線路抵抗rが大
きく変化してもこれらの影響を受けることがな
い。よつて線路抵抗rが変化してもスパン誤差が
発生することがなく従来の(3)項の欠点も解消でき
る。 Furthermore, since the output voltage V O does not include the line resistance r of the lead wires 6 and 7 at all, it is not affected by large changes in the line resistance r. Therefore, even if the line resistance r changes, a span error does not occur, and the conventional drawback of item (3) can be overcome.
また測温抵抗体3の抵抗値R3が測定レンジの
0%にあるときの測温抵抗体3の抵抗値R3は増
幅器19の利得の演算に全く関与しない。したが
つて増幅器19の演算抵抗器18,20,21の
温度変動等によるゼロ点ずれも発生することがな
い。よつて従来の(4)項の欠点も一掃することがで
きる。 Further, when the resistance value R 3 of the temperature-measuring resistor 3 is at 0% of the measurement range, the resistance value R 3 of the temperature-measuring resistor 3 is not involved in the calculation of the gain of the amplifier 19 at all. Therefore, no zero point shift occurs due to temperature fluctuations in the operational resistors 18, 20, 21 of the amplifier 19. Therefore, the drawbacks of the conventional item (4) can also be eliminated.
以上説明したようにこの発明によれば測温抵抗
体3の抵抗変化を正確に電圧信号に変換すること
ができる。よつて高精度に温度を測定することが
できる。然も回路構成は第1図で説明した構成と
比較して大幅に回路素子が増加するものでないか
ら安価に作ることができる。よつて安価で精度の
高い温度測定装置を提供できる。 As explained above, according to the present invention, the resistance change of the temperature measuring resistor 3 can be accurately converted into a voltage signal. Therefore, temperature can be measured with high accuracy. Moreover, since the circuit configuration does not have a large increase in circuit elements compared to the configuration explained in FIG. 1, it can be manufactured at low cost. Therefore, an inexpensive and highly accurate temperature measuring device can be provided.
第1図は従来の測温抵抗体を利用した温度測定
装置を説明するための接続図、第2図はこの発明
の一実施例を示す接続図である。
1,2:測定電流設定抵抗器、3:三線式測温
抵抗体、4:ゼロサプレツシヨン抵抗器、VE:
定電圧源、17:A点の電位が基準電位となるよ
うに制御する手段、18:正帰還抵抗器、19:
増幅器。
FIG. 1 is a connection diagram for explaining a conventional temperature measuring device using a resistance temperature sensor, and FIG. 2 is a connection diagram showing an embodiment of the present invention. 1, 2: Measurement current setting resistor, 3: Three-wire resistance temperature detector, 4: Zero suppression resistor, V E :
constant voltage source, 17: means for controlling the potential at point A to be the reference potential, 18: positive feedback resistor, 19:
amplifier.
Claims (1)
二つの測定電流設定抵抗器と、この測定電流設定
抵抗器の一方の一端に一端が接続された三線式測
温抵抗体と、上記測定電流設定抵抗器の他方の一
端に一端が接続され他端が上記三線式測温抵抗体
の他端に接続され測定温度レンジによつて適宜そ
の値が選定される零サプレツシヨン抵抗器との四
つの抵抗器によつて構成される抵抗ブリツジと、
上記二つの測定電流設定抵抗器の接続点と基準電
位点の間に一定電圧を与える定電圧源と、上記ゼ
ロサプレツシヨン抵抗器と測定電流設定抵抗器の
接続点が常時基準電位となるように上記測温抵抗
体とゼロサプレツシヨン抵抗器の接続点の電位を
制御する手段と、上記測温抵抗体と測定電流設定
抵抗器の接続点の電位が入力され、その入力点が
正帰還抵抗器の接続端とされた増幅率K倍の増幅
器とより成り上記正帰還抵抗器の抵抗値を上記測
定電流設定抵抗器の(K−1)倍の抵抗値に選定
して成る測温抵抗体による温度測定回路。1. Two measurement current setting resistors with the same resistance value and whose one ends are commonly connected to each other, a three-wire resistance temperature detector whose one end is connected to one end of the measurement current setting resistor, and the above measurement current. One end is connected to the other end of the setting resistor, the other end is connected to the other end of the three-wire resistance temperature detector, and the value is selected as appropriate depending on the measurement temperature range. a resistance bridge composed of a
A constant voltage source that provides a constant voltage between the connection point of the two measurement current setting resistors and the reference potential point, and a constant voltage source that provides a constant voltage between the connection point of the two measurement current setting resistors and the reference potential point, and the connection point of the zero suppression resistor and measurement current setting resistor so that the reference potential is always maintained. means for controlling the potential at the connection point between the above-mentioned resistance temperature detector and the zero suppression resistor, and the potential at the connection point between the above-mentioned resistance temperature detector and the measurement current setting resistor are input, and the input point is used as a positive feedback. A temperature measuring resistor comprising an amplifier with an amplification factor of K times the connecting end of the resistor, and a resistance value of the positive feedback resistor selected to be (K-1) times the resistance value of the measuring current setting resistor. Body temperature measurement circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6727381A JPS57182134A (en) | 1981-05-02 | 1981-05-02 | Temperature measurement circuit by temperature measurement resistor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6727381A JPS57182134A (en) | 1981-05-02 | 1981-05-02 | Temperature measurement circuit by temperature measurement resistor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57182134A JPS57182134A (en) | 1982-11-09 |
| JPS625292B2 true JPS625292B2 (en) | 1987-02-04 |
Family
ID=13340185
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6727381A Granted JPS57182134A (en) | 1981-05-02 | 1981-05-02 | Temperature measurement circuit by temperature measurement resistor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57182134A (en) |
-
1981
- 1981-05-02 JP JP6727381A patent/JPS57182134A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57182134A (en) | 1982-11-09 |
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