JPS6286534U - - Google Patents

Info

Publication number
JPS6286534U
JPS6286534U JP17856185U JP17856185U JPS6286534U JP S6286534 U JPS6286534 U JP S6286534U JP 17856185 U JP17856185 U JP 17856185U JP 17856185 U JP17856185 U JP 17856185U JP S6286534 U JPS6286534 U JP S6286534U
Authority
JP
Japan
Prior art keywords
sample
low
collecting
organic
inorganic materials
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17856185U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP17856185U priority Critical patent/JPS6286534U/ja
Publication of JPS6286534U publication Critical patent/JPS6286534U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案の全体斜視図を示し、第2図は
本装置を上から見た平面図、第3図は側面断面図
、第4図は本装置の使用実施例を示す断面図であ
る。第1図〜第3図において1はウエーハ特取付
部、2は試料皿部、3は装置上方にあいている穴
、4はウエーハ等の着脱の際に容易に取り出せる
ようにあいている切り込みと溝である。
Fig. 1 shows an overall perspective view of the present invention, Fig. 2 is a plan view of the device seen from above, Fig. 3 is a side sectional view, and Fig. 4 is a sectional view showing an example of the use of the device. be. In Figures 1 to 3, 1 is a wafer special attachment part, 2 is a sample tray part, 3 is a hole in the upper part of the device, and 4 is a notch to allow easy removal of a wafer, etc. It's a groove.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 有機および無機材料からの低沸点揮発成分をシ
リコンウエーハ等の表面上に効率良く採取する装
置であつて、すり合せにより分割される試料を収
容する試料皿と、該試料皿中の低沸点揮発成分を
採取する試料採取板が載置されるウエーハ取付部
とを有し、該試料の密閉加熱を行なえることを特
徴とする有機、無機材料中の低沸点揮発成分採取
装置。
A device that efficiently collects low-boiling volatile components from organic and inorganic materials onto the surface of a silicon wafer, etc., which includes a sample dish that accommodates a sample to be divided by grinding, and a low-boiling volatile component in the sample dish. 1. An apparatus for collecting low boiling point volatile components in organic and inorganic materials, comprising a wafer mounting part on which a sample collecting plate for collecting the sample is mounted, and capable of sealing and heating the sample.
JP17856185U 1985-11-20 1985-11-20 Pending JPS6286534U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17856185U JPS6286534U (en) 1985-11-20 1985-11-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17856185U JPS6286534U (en) 1985-11-20 1985-11-20

Publications (1)

Publication Number Publication Date
JPS6286534U true JPS6286534U (en) 1987-06-02

Family

ID=31120807

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17856185U Pending JPS6286534U (en) 1985-11-20 1985-11-20

Country Status (1)

Country Link
JP (1) JPS6286534U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012154718A (en) * 2011-01-25 2012-08-16 Fujitsu Ltd Spectral analysis method and sampling unit for spectral analysis
JP2012194063A (en) * 2011-03-16 2012-10-11 Fujitsu Ltd Analytical method and analyzer for plasticizer in resin

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012154718A (en) * 2011-01-25 2012-08-16 Fujitsu Ltd Spectral analysis method and sampling unit for spectral analysis
JP2012194063A (en) * 2011-03-16 2012-10-11 Fujitsu Ltd Analytical method and analyzer for plasticizer in resin

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