JPS6289872A - Formation of solid film by deposition - Google Patents

Formation of solid film by deposition

Info

Publication number
JPS6289872A
JPS6289872A JP23040285A JP23040285A JPS6289872A JP S6289872 A JPS6289872 A JP S6289872A JP 23040285 A JP23040285 A JP 23040285A JP 23040285 A JP23040285 A JP 23040285A JP S6289872 A JPS6289872 A JP S6289872A
Authority
JP
Japan
Prior art keywords
thermionic emission
thermionic
emission member
transformer
reactive gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP23040285A
Other languages
Japanese (ja)
Other versions
JPS6320913B2 (en
Inventor
Noribumi Kikuchi
菊池 則文
Tetsuo Komatsu
哲郎 小松
Hiroaki Yamashita
山下 博明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Japan Science and Technology Agency
Mitsubishi Metal Corp
Original Assignee
Mitsubishi Metal Corp
Research Development Corp of Japan
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Metal Corp, Research Development Corp of Japan filed Critical Mitsubishi Metal Corp
Priority to JP23040285A priority Critical patent/JPS6289872A/en
Publication of JPS6289872A publication Critical patent/JPS6289872A/en
Publication of JPS6320913B2 publication Critical patent/JPS6320913B2/ja
Granted legal-status Critical Current

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Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、熱電子放射部材で反応性ガスを加熱活性化
することによって、基体の表面に固体被膜を析出形成さ
せる所謂化学蒸着法(CVD)に関するものである。
Detailed Description of the Invention [Field of Industrial Application] The present invention uses the so-called chemical vapor deposition method (CVD) in which a solid film is deposited and formed on the surface of a substrate by heating and activating a reactive gas with a thermionic emission member. ).

〔従来の技術〕[Conventional technology]

従来1例えば、切削工具および耐摩耗工具のような超硬
工具などを製造するに当って、基体表面に人工ダイヤモ
ンド、炭化チタン−窒fヒチタン、炭窒fヒチタン、炭
酸fヒチタン、酸fヒアルミニウム等の硬質被膜を析出
形成させるのに上記の化学蒸着法が利用されており−そ
れには、例えば人工ダイヤモンド被膜の析出形成を例に
とって説明すると、第6図に概略断面図で示されている
ように、石英製反応容器1内の上部に開口する反応性ガ
ス導入管2から流入する、主として炭(ヒ水素と水素と
からなる反応性ガスを、熱電子放射部材としての例えば
金属タングステン製フィラメント3および白根4上に支
持された基体5の周囲を通して下方に流し、この間反応
容器1内の雰囲気圧力を01〜3 Q Q torrに
維持するとともに、交流電源部6から供給される電力で
フィラメント3を1500〜2500°Cに加熱して、
反応性ガスの加熱活性(ヒと、このフィラメント3から
所定の間隔をあけて配置された基体表面の300〜13
00℃の範囲内の温度への加熱をはかり、この状態で所
望のダイヤモンド被膜形成反応を所定時間起させて一前
記基体5の表面にダイヤモンド被膜を析出形成させてい
る。
Conventional 1 For example, in manufacturing carbide tools such as cutting tools and wear-resistant tools, artificial diamond, titanium carbide-nitride titanium, carbonitride titanium, titanium carbonate, and acid hyaluminum are used on the substrate surface. The above-mentioned chemical vapor deposition method is used to precipitate hard coatings such as - For example, to explain the deposition formation of an artificial diamond coating, as shown in the schematic cross-sectional view in FIG. A reactive gas mainly composed of carbon (arsenic and hydrogen) flows into the quartz reaction vessel 1 from a reactive gas introduction pipe 2 opened at the upper part of the reaction vessel 1, and is passed through a filament 3 made of, for example, metal tungsten as a thermionic emitting member. The filament 3 is caused to flow downward through the periphery of the substrate 5 supported on the white root 4, while maintaining the atmospheric pressure in the reaction vessel 1 at 01 to 3 Q Q torr, and using the electric power supplied from the AC power supply section 6 to Heat to 1500-2500°C,
300 to 13 on the substrate surface arranged at a predetermined distance from the filament 3.
The substrate is heated to a temperature within the range of 00° C., and in this state, a desired diamond coating reaction is caused to occur for a predetermined period of time, thereby depositing and forming a diamond coating on the surface of the substrate 5.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

このような固体被膜形成方法では、析出した被膜の結晶
性が劣る上に、その結晶性が変動しやすくて再現性に欠
けるため1例えばWCC超超硬合金母材とし、これ(−
前記のような硬質被膜を被覆してなる切削工具では、こ
の被膜の結晶性が悪いと、切削中にその被膜の剥離や被
削材の溶着が起り易く、所望の品質を備えた製品を安定
して得ることができないという問題があった。
In this method of forming a solid film, the crystallinity of the deposited film is poor, and the crystallinity easily fluctuates and lacks reproducibility.
In a cutting tool coated with a hard coating as described above, if this coating has poor crystallinity, the coating is likely to peel off or the workpiece material will be welded during cutting, making it difficult to stably produce a product with the desired quality. The problem was that I couldn't get it.

〔研究に基づく知見事項〕[Findings based on research]

そこで1本発明者等は、このような問題を解決するため
に種々研究を重ねた結果。
Therefore, the inventors of the present invention have conducted various studies to solve such problems.

(1)析出する被膜(以下、蒸着膜ともいう)の結晶性
が一定しないで悪fヒするのは一熱電子放射部材から出
る熱電子の放射状態が安定しないところに起因し、この
不安定な熱電子の放射状態は、前述の第6図に示される
よう1二、この熱電子放射部材が直接交流電源部と接続
しているために、この電源部の影響をそのまま受けるこ
とによって起り、例えば、この電の部によって熱電子放
射部材の両端に印加される電圧が変動すると、それに応
じて熱電子の放射状態が変化すること。
(1) The reason why the crystallinity of the precipitated film (hereinafter also referred to as the vapor deposited film) is not constant is due to the fact that the emission state of thermionic electrons emitted from the thermionic electron emitting member is not stable. As shown in FIG. 6 above, this thermionic emission state occurs because the thermionic radiation member is directly connected to the AC power source and is therefore directly influenced by the AC power source. For example, when the voltage applied to both ends of the thermionic emission member changes due to this electric part, the emission state of thermionic electrons changes accordingly.

(2)  前述のような蒸着膜の析出形成方法において
は、熱電子放射部材から基体へ向うガスの流れやこの熱
電子放射部材にかかる交流電圧等によって、p ?!電
子放射部材ら飛び出した熱電子が基体(二到着すること
で熱電子放射部材と基体との間で電流が流れ、この状態
はP電子放射部材に直流のバイアス電圧をかけた状態に
相当し、このような見掛上の電圧は熱電子放射部材にか
かる交流電圧によって変動し、前述の熱電子放射状態を
左右するが、熱電子放射部材と交流電源部とを一変圧器
を介して接続し、かつこの変圧器の熱電子放射部材側の
巻線にタップをとって、このタップを接地すると、前述
のパスアス電圧が安定する結果、熱電子放射状態が安定
すること、 を見出した。
(2) In the method for depositing a vapor deposited film as described above, p? ! When the thermionic electrons ejected from the electron emitting member arrive at the base (2), a current flows between the thermionic emitting member and the base, and this state corresponds to a state in which a DC bias voltage is applied to the P electron emitting member. Such an apparent voltage varies depending on the AC voltage applied to the thermionic emission member and influences the above-mentioned thermionic emission state, but if the thermionic emission member and the AC power supply are connected through one transformer, , and if a tap is taken on the winding on the thermionic emission member side of this transformer and this tap is grounded, the above-mentioned pass-as voltage is stabilized, and as a result, the thermionic emission state is stabilized.

〔問題点を解決するための手段〕[Means for solving problems]

この発明は、上記知見に基づいて発明されたもので、交
流電源部から供給される電力によって熱電子放射部材か
ら基体へ向って熱電子を放射させろイヒ学蒸N去におい
て、その基体表面に析出形成される固体被膜の結晶性を
良好な状態に安定して保持することを目的とし1反応性
ガスが流入する反応容器内に設けられた熱電子放射部材
を、この熱電子放射部材と接続している交流電源部から
供給される電力で加熱して、前記反応性ガスを加熱活性
化するとともに、前記熱電子放射部材と所定間隔を隔て
て前記反応容器内シニ装入配置された基体を加熱するこ
とによって−この基体表面に、前記反応性ガスの反応に
基いて生成する固体材料を析出付着させることからなる
、固体被膜の析出形成方法において、前記熱電子放射部
材と前記交流電源部とを、変圧器を介して接続し、かつ
この変圧器の前記熱電子放射部材側回路の巻線に設けた
タップを接地することを特徴とするものである。
This invention was invented based on the above-mentioned knowledge, and in the process of emitting thermionic electrons from the thermionic emitting member toward the substrate using the electric power supplied from the AC power source, deposits are deposited on the surface of the substrate. In order to stably maintain the crystallinity of the solid film formed in a good state, a thermionic emission member provided in a reaction vessel into which a reactive gas flows is connected to this thermionic emission member. heating with electric power supplied from an alternating current power supply unit, heating and activating the reactive gas, and heating a substrate placed in the reaction vessel at a predetermined distance from the thermionic emission member. In the method for depositing a solid film, which comprises depositing and adhering a solid material generated based on the reaction of the reactive gas on the surface of the substrate, the thermionic emitting member and the AC power source are , and is characterized in that it is connected via a transformer, and a tap provided on the winding of the thermionic radiation member side circuit of this transformer is grounded.

〔発明の詳細な説明〕[Detailed description of the invention]

この発明の方法は、第1図に示されるように。 The method of this invention is as shown in FIG.

交流電源部6と熱電子放射部材3との間に変圧器7を設
は−その変圧器7の熱電子放射部材3惧11(二次1l
11)の巻線7aから引出したタップ8を接地したとこ
ろに特徴を有し、このような手段によって熱電子放射部
材3にかかる前記見掛上のバイアス電圧は安定1ヒし、
このとき、タップ8を、図の8′で示すように、前記巻
線7aの一端に付けて熱電子放射部材3の一端をアース
電位に落すと、その他端に印加電圧がかかり、熱電子放
射部材3のアース部分と一本来アース電位に保たれてい
る基体5との間では電位差が無くなるのに対して。
A transformer 7 is installed between the AC power source 6 and the thermionic radiation member 3.
11) is characterized in that the tap 8 drawn out from the winding 7a is grounded, and by such means the apparent bias voltage applied to the thermionic emission member 3 is stabilized.
At this time, when a tap 8 is attached to one end of the winding 7a to lower one end of the thermionic emission member 3 to ground potential, as shown by 8' in the figure, an applied voltage is applied to the other end, and the thermionic emission is emitted. Whereas there is no potential difference between the ground portion of the member 3 and the base 5, which is originally kept at ground potential.

熱電子放射部材3の他端と基体5の間には、印加した交
流電圧がそっくりかかつて、熱電子放射部材にかかる交
流電圧の不均一性が顕著になるのに対し、図の8“で示
すように、前記変圧器巻線7aの中央にタップ8をとっ
てこれをアースした場合は、熱電子放射部材の中央部が
アース電位になり、この熱電子放射部材3の両端に、印
加電圧の半分の電圧が正負逆向きに交互にかかる状態に
なって電圧が片寄って熱電子放射部材3にかかる前記の
状態が回避され、熱電子放射部材3と基体5との間の電
位差が比較的均一にならされるので、タップ8を取り付
ける位置は前記巻線7aのなるべく中央寄りが好ましく
、その中央部が最も好ましい。
The alternating current voltage applied between the other end of the thermionic emission member 3 and the base 5 is the same.However, the non-uniformity of the alternating current voltage applied to the thermionic emission member becomes noticeable, whereas at 8" in the figure As shown, when the tap 8 is placed in the center of the transformer winding 7a and grounded, the center of the thermionic emission member becomes at ground potential, and the applied voltage is applied to both ends of the thermionic emission member 3. The above-mentioned situation in which half the voltage is applied alternately in the positive and negative directions and the voltage is biased and applied to the thermionic emission member 3 is avoided, and the potential difference between the thermionic emission member 3 and the base 5 is relatively Since the tap 8 is evenly leveled, it is preferable that the tap 8 be attached as close to the center of the winding 7a as possible, and the center is most preferable.

〔実施例および実施例に基づく効果〕[Examples and effects based on the examples]

ついで、この発明をダイヤモンド被膜の形成を例にあげ
て比較例と対比しながら説明する。
Next, the present invention will be explained using the formation of a diamond coating as an example and comparing it with a comparative example.

第1図に示される装置において1反応容器1:外径50
咽を有する石英製反応容器、熱電子放射部材3:金属タ
ングステン製フィラメント−基体5: 10mmX10
mmX10の寸法を有する金属タングステン板、フィラ
メント3と基体5の表面との間隔:30m、変圧器7:
−次側と二次側との電圧比が1:1となる容@ 10 
KVAの変圧器、タップ位置二二次側巻線の中央部、と
し、かつ反応条件を第1表に示されるように設定して、
前記タングステン板5の表面に化学蒸着により人工ダイ
第 1 表 ヤモンド被膜を析出形成させ、また比較のため、前記変
圧器7を働かせないこと、すなわち変圧器7をバイパス
させて電流を流すことを除き、前記と全く同様な方法お
よび条件によってタングステン板上にダイヤモンド蒸着
膜を被覆させることによって、それぞれ本発明ダイヤモ
ンド蒸着膜および従来ダイヤモンド蒸着膜を形成させた
In the apparatus shown in Fig. 1, 1 reaction vessel 1: outer diameter 50
Quartz reaction vessel with throat, thermionic emission member 3: Metallic tungsten filament-substrate 5: 10 mm x 10
Metal tungsten plate with dimensions mm x 10, distance between filament 3 and surface of substrate 5: 30 m, transformer 7:
- Capacity where the voltage ratio between the next side and the secondary side is 1:1 @ 10
KVA transformer, the tap position is at the center of the secondary winding, and the reaction conditions are set as shown in Table 1.
An artificial die coating was deposited on the surface of the tungsten plate 5 by chemical vapor deposition, and for comparison, the transformer 7 was not operated, that is, the transformer 7 was bypassed to allow current to flow. A diamond deposited film of the present invention and a conventional diamond deposited film were respectively formed by coating a diamond deposited film on a tungsten plate using the same method and conditions as described above.

ついで、これらのダイヤモンド蒸着膜の結晶状態を調べ
るために一各被膜部分を5000倍に拡大した走査電子
顕、微鏡、写7真を写すとともに、各被膜試料のラマン
スペクトルをラマン分析法によって求めた。
Next, in order to investigate the crystalline state of these diamond deposited films, we used a scanning electron microscope, a microscope, and a photograph of each film part magnified 5000 times, and also obtained the Raman spectra of each film sample using Raman analysis. Ta.

本発明ダイヤモンド被膜の結晶状態を前記写真で示す第
2図と、従来ダイヤモンド被膜の結晶状態を前記写真で
示す第3図とを比較すると、第2図はダイヤモンドに特
有な結晶面を明瞭に示しているのに対し、第3図にはこ
のような結晶面がみられず、また本発明ダイヤモンド被
膜試料のラマンスペクトル図を示す第4図ではダイヤモ
ンド結晶に特有な1330ci−1付近の鋭いピークが
みられるのに対し、従来ダイヤモンド被膜試料のラマン
スペクトル図を示す第5図ではこのようなピークが見ら
れないことから、本発明ダイヤモンド被膜は従来ダイヤ
モンド被膜と較べて結晶性に優ネ1、かつ結晶性の向上
した結晶を多量に含んでいることがわかる。
When comparing FIG. 2, which shows the crystalline state of the diamond coating of the present invention with the above-mentioned photograph, and FIG. 3, which shows the crystalline state of the conventional diamond coating with the above-mentioned photograph, FIG. 2 clearly shows the crystal planes unique to diamond. On the other hand, no such crystal planes are seen in Figure 3, and Figure 4, which shows the Raman spectrum of the diamond coating sample of the present invention, shows a sharp peak near 1330ci-1, which is characteristic of diamond crystals. On the other hand, such a peak is not seen in Figure 5, which shows the Raman spectrum of the conventional diamond coating sample, indicating that the diamond coating of the present invention has better crystallinity than the conventional diamond coating. It can be seen that it contains a large amount of crystals with improved crystallinity.

〔発明の効果〕〔Effect of the invention〕

以上述べた説明から明らかなように、この発明によると
、熱電子の放射状態を安定fヒさせて、結晶性の優れた
蒸着膜を基体の上に安定した状態で析出形成できるので
、品質の優れた固体被膜が再現性よく被覆された種々の
部材1例えばスローアウェイチップ−ミニチュアドリル
、エンドミル等を提供することができ、これらの部材の
品質や性能を向上できるという、産業上有用な効果が得
られる。
As is clear from the above explanation, according to the present invention, a deposited film with excellent crystallinity can be deposited and formed on a substrate in a stable state by stabilizing the emission state of thermionic electrons, thereby improving quality. It is possible to provide various parts 1, such as indexable tips, miniature drills, end mills, etc., coated with excellent solid coatings with good reproducibility, and it has an industrially useful effect of improving the quality and performance of these parts. can get.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明の詳細な説明するための概要図、第2
図および第3図はダイヤモンド蒸着膜の走査顕微鏡写真
図、第4図および第5図はラマンスペクトル図、そして
第6図は従来方法を説明するための概要図である。 図
において 1・・・反応容器、    2・・・反応性ガス導入管
。 3・・・熱電子放射部材、4・・・台板。 5・・・基体、     6・・・交流電源部。 7・・・変圧器、     8・・・タップ。
Figure 1 is a schematic diagram for explaining the invention in detail;
3 and 3 are scanning micrographs of the diamond deposited film, FIGS. 4 and 5 are Raman spectra, and FIG. 6 is a schematic diagram for explaining the conventional method. In the figure, 1...reaction container, 2...reactive gas introduction tube. 3... Thermionic emission member, 4... Base plate. 5...Base body, 6...AC power supply section. 7...Transformer, 8...Tap.

Claims (1)

【特許請求の範囲】[Claims] (1)反応性ガスが流入する反応容器内に設けられた熱
電子放射部材を、この熱電子放射部材と接続している交
流電源部から供給される電力で加熱して、前記反応性ガ
スを加熱活性化するとともに、前記熱電子放射部材と所
定間隔を隔てて前記反応容器内に装入配置された基体を
加熱することによつて、この基体表面に、前記反応性ガ
スの反応に基いて生成する固体材料を析出付着させるこ
とからなる、固体被膜の析出形成方法において、前記熱
電子放射部材と前記交流電源部とを、変圧器を介して接
続し、かつこの変圧器の前記熱電子放射部材側回路の巻
線に設けたタップを接地することを特徴とする、前記固
体被膜の析出形成方法。
(1) A thermionic emission member provided in the reaction vessel into which the reactive gas flows is heated by electric power supplied from an AC power supply unit connected to the thermionic emission member, and the reactive gas is heated. At the same time as being activated by heating, by heating the substrate placed in the reaction vessel at a predetermined distance from the thermionic emission member, the surface of the substrate is heated to generate a chemical reaction based on the reaction of the reactive gas. In a method for forming a solid film by depositing a generated solid material, the thermionic emission member and the AC power source are connected via a transformer, and the thermionic emission of the transformer is The method for depositing and forming a solid film as described above, characterized in that a tap provided on the winding of the circuit on the member side is grounded.
JP23040285A 1985-10-16 1985-10-16 Formation of solid film by deposition Granted JPS6289872A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23040285A JPS6289872A (en) 1985-10-16 1985-10-16 Formation of solid film by deposition

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23040285A JPS6289872A (en) 1985-10-16 1985-10-16 Formation of solid film by deposition

Publications (2)

Publication Number Publication Date
JPS6289872A true JPS6289872A (en) 1987-04-24
JPS6320913B2 JPS6320913B2 (en) 1988-05-02

Family

ID=16907317

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23040285A Granted JPS6289872A (en) 1985-10-16 1985-10-16 Formation of solid film by deposition

Country Status (1)

Country Link
JP (1) JPS6289872A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5079031A (en) * 1988-03-22 1992-01-07 Semiconductor Energy Laboratory Co., Ltd. Apparatus and method for forming thin films

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5079031A (en) * 1988-03-22 1992-01-07 Semiconductor Energy Laboratory Co., Ltd. Apparatus and method for forming thin films

Also Published As

Publication number Publication date
JPS6320913B2 (en) 1988-05-02

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