JPS6310090B2 - - Google Patents

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Publication number
JPS6310090B2
JPS6310090B2 JP2046181A JP2046181A JPS6310090B2 JP S6310090 B2 JPS6310090 B2 JP S6310090B2 JP 2046181 A JP2046181 A JP 2046181A JP 2046181 A JP2046181 A JP 2046181A JP S6310090 B2 JPS6310090 B2 JP S6310090B2
Authority
JP
Japan
Prior art keywords
silicon oxide
acid
oxide film
silicon
water
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP2046181A
Other languages
Japanese (ja)
Other versions
JPS57135713A (en
Inventor
Shozo Horikiri
Tadaaki Yako
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Chemical Co Ltd
Original Assignee
Sumitomo Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Chemical Co Ltd filed Critical Sumitomo Chemical Co Ltd
Priority to JP2046181A priority Critical patent/JPS57135713A/en
Publication of JPS57135713A publication Critical patent/JPS57135713A/en
Publication of JPS6310090B2 publication Critical patent/JPS6310090B2/ja
Granted legal-status Critical Current

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  • Silicon Compounds (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Description

【発明の詳細な説明】[Detailed description of the invention]

本発明は無機質基体表面への酸化ケイ素被膜の
形成法に関する。 従来、無機質基体表面に酸化ケイ素被膜を形成
する方法はスパツタリングや気相成長法によつて
いた。しかし、これらは何れも装置が複雑なう
え、広い面積に亘つて均質な被膜を形成すること
が困難である。近年このような欠点を改善するた
め、例えばアルコキシシランまたはハロゲン化シ
ランと低級カルボン酸とアルコールとの反応生成
物を基体に塗布した後熱処理し、酸化ケイ素被膜
を形成させる方法が提案されていた。(特開昭50
−103533号公報、同昭52−104521号公報、同昭55
−34276号公報、同昭55−34258号公報)。しかし、
上記の方法によつて得られた塗布液を用いて形成
した酸化ケイ素被膜はピンホール、クラツク等の
ない完全な被膜とはならず、必ずしも充分満足さ
れたものではない。この原因は定かではないが、
アルコキシシランまたはハロゲン化シランから生
成したヒドロキシシラン中にアルコキシ基が残存
し、このアルコキシ基が熱処理時に分解飛散する
などのために生じていると考えられる。上記方法
によつて塗布液を製造する場合には、反応に極め
て長時間(約24時間以上)を要し、生産性が極め
て低いという不都合もある。 またアルコキシシラン1モル当り、8モル以下
の水でもつて加水分解した生成物を塗布液とする
方法も提案されている。(特開昭51−93922号公
報)しかし、この方法によつて得られた塗布液を
用いても形成した酸化ケイ素被膜は完全な被膜と
ならないという欠点がある。これは加水分解に用
いる水の量が水/アルコキシシラン<8(モル比)
という条件であるために、加水分解が完全に進行
せず、そのため生成したヒドロキシシラン中にア
ルコキシ基が残存し、このアルコキシ基が熱処理
時に分解飛散するためと考えられる。 さらに前記いずれの方法も加水分解が不充分な
生成物を塗布液として用いているため、無機質基
体表面でハジキやムラを生じて均質な被膜が得ら
れないし、塗布液が保存中に湿分によつて分解す
るという欠点を有している。 本発明者らは、上記のような欠点を克服すべく
鋭意研究を重ねた結果、原料のケイ素化合物を酸
性化処理してケイ酸の水溶液とした後、該水溶液
から水を除去、分離して極性有機溶媒溶液とした
ものが塗布液として好適であることを見出し、本
発明を完成するに至つた。すなわち本発明は無機
質基体表面にケイ素化合物を含む塗布液を塗布
し、次いで熱処理によつて酸化ケイ素被膜となす
方法に於て、塗布液としてケイ酸およびケイ酸塩
から選ばれた一種または二種以上のケイ素化合物
を酸性化処理によつて水溶性ケイ酸となし、次い
で該ケイ酸水溶液を脱水処理して水/ケイ素のモ
ル比が5以下の極性有機溶媒溶液となした塗布液
を用いることを特徴とする、高生産性、高安定性
であつて、しかも優れた塗膜を賦与し得るところ
の無機質基体表面への酸化ケイ素被膜の形成法を
提供するものである。 本発明の塗布液により、被膜を形成せしめる場
合には原料自体に全く有機部分がないために、ア
ルコキシシランを原料とした場合に問題となるよ
うな、残存アルコキシ基に起因する数々の不都合
を全く考慮する必要がなく、その上、ピンホール
やクラツク等のない、均一で表面硬度の高い被膜
が得られるし、加えて塗布液を製造するための時
間も短時間で済み、且つ得られる塗布液は長時間
の保存に対しても安定であるという利点を有して
いる。 本発明方法の実施に用いられるケイ素化合物
は、ケイ酸および/またはケイ酸塩である。これ
らの化合物を例示すれば、ケイ酸、シリカゾル、
ケイ酸リチウム、ケイ酸カリウム、ケイ酸ナトリ
ウム、ケイ酸アンモニウム、ケイ酸カルシウム、
ケイ酸マグネシウム、JIS1号、2号、3号、4号
水ガラス、リチウム水ガラス、カリウム水ガラ
ス、ゼオライトX、ゼオライトY、ゼオライト
A、ゼオライトL等の合成ケイ酸塩、かくらん
石、かくせん石、雲母、滑石、けい灰石、ほうふ
つ石、蛇紋岩、石綿などの天然ケイ酸塩鉱物を挙
げることができる。これらは単独で用いてもよい
し、二種類以上を混合して用いてもよい。 本発明方法の実施に当り、ケイ素化合物を酸性
化処理する方法としては、水に可溶であつてケイ
酸塩の塩基と中和反応をなし得る一価または多価
の酸で処理する方法、陽イオン交換樹脂で処理す
る方法等が採用できる。この様な酸としては、塩
酸、硫酸、硝酸、リン酸、スルホン酸、クロルス
ルホン酸、臭素酸、酢酸、クロル酢酸、ギ酸、シ
ユウ酸、プロピオン酸、アクリル酸、メタクリル
酸、アセト酢酸、クエン酸、グルコン酸、グリコ
ール酸、カプリル酸、カプロン酸等を挙げること
ができる。酸の量は原料ケイ素化合物の種類、使
用する酸の強度、酸処理条件等によつて適宜に選
ばれるできであるが、通常の場合ケイ素1モルに
対して1当量から100当量の範囲が好ましく用い
られる。原料のケイ素化合物が水不溶性である場
合には使用する酸の量も相対的に多くすることが
生成物の収率を高める点で好ましい。 本酸性化処理は一般に0℃から100℃の範囲で
実施され、所要時間は原料の種類によつても異な
るが、通常10分から5時間までの範囲で実施され
得る。 酸性化処理は、処理中にPHが4以上になるとケ
イ酸ゲルを生じ、本発明法において目的とすると
ころの塗布液が得られなくなるのでPH4以下の酸
性領域で実施される。 本発明方法の実施に当り、上記酸性化処理液は
次いで脱水処理に付され、水/ケイ素のモル比が
5以下、好ましくは3以下の塗布液となす。脱水
処理に際して液中に微細沈澱物が存在する場合
は、予め過等の分離をしておくことが好まし
い。 脱水処理の方法としては、一般に無機電解質を
添加し、塩析させる方法が好適に採用されるが、
脱水剤を投入する等の他の方法も勿論採用可能で
ある。塩析を行なうには酸性化処理液に極性有機
溶媒を添加し、これに無機電解質を加えて、混合
した後静置すればよい。塩析の際の極性溶媒の量
及び無機電解質の量は、生成ケイ酸が充分に回収
され、且つまた脱水後の塗布液中の水/ケイ素の
モル比が5以下となるように用いればよいが、一
般には酸化ケイ素1重量部当り、極性有機溶媒5
〜100重量部及び無機電解質1〜20重量部が用い
られる。 塗布液中の水/ケイ素のモル比が5よりも大き
くなるとピンホール、クラツクのない被膜を形成
させることが出来なく、しかも被膜にムラを生じ
るようになるので好ましくない。 上記極性有機溶媒としては、メタノール、エタ
ノール、プロパノール、ブタノール、テトラヒド
ロフラン、ジオキサン、アセトン、メチルエチル
ケトン、メチルイソブチルケトン、ジエチルケト
ン、酢酸メチル、酢酸エチルなどが挙げられる。
特にメタノール、テトラヒドロフランが好適に使
用される。また無機電解質としては一般に塩析剤
として使用されるものでよく、例えば塩化ナトリ
ウム、塩化カリウム、塩化アンモニウム、塩化カ
ルシウム、硫酸ナトリウム、硫酸カリウム、硫酸
アンモニウム、硫酸マグネシウム等が使用でき
る。 脱水処理としての塩析操作は通常一回でよい
が、ケイ酸分の抽出率を高めるために複数回の繰
り返し抽出を行なつてもよい。脱水剤としては、
シリカゲル、活性アルミナ、モレキユラーシーブ
ズ、脱水硫酸ナトリウム、脱水硫酸銅等公知の固
体脱水剤が使用できる。 かくして得られた塗布液はそのまま、または所
望に応じて前述の有機溶媒で稀釈した後、更に適
当な添加剤を添加後、塗布液として用いられる。
塗布液中のケイ酸分の濃度は酸化ケイ素として
0.1〜20重量パーセントの範囲で使用するのが好
ましい。塗布液の稀釈溶媒としては、抽出溶媒と
同種のものでもよいし、また異なつたものでもさ
しつかえない。塗布液にはさらに必要に応じてエ
チレングリコール、プロピレングリコール、トリ
エチレングリコール、グリセリン等の多価アルコ
ールや、アセチルアセトン、アセト酢酸エチル、
ジアセトンアルコール等のキレート形成性化合物
およびエチレングリコールモノエチルエーテル、
ジエチレングリコールモノエチルエーテル、ジエ
チレングリコールジエチルエーテル等の含酸素高
沸点溶媒、さらにまたポリビニルプチラール、ポ
リビニルピロリドン、ポリ酢酸ビニル等の高分子
造膜剤や、本塗布液に可溶な他の金属塩を加える
こともできる。これら添加成分の濃度は塗布液の
使用条件および形成されるべき酸化ケイ素被膜の
条件によつて異なるが、含酸素高沸点溶媒は塗布
液中30重量パーセント以下量、高分子造膜剤は10
重量パーセント以下量の範囲で用いるのがよい。 本発明方法による塗布液を適用し得る無機質基
体としては、ガラス、セラミツクス、鉱物、単結
晶など公知の無機質固体表面が挙げられる。特に
ガラス表面に対して好適に使用し得る。これらの
基体表面に本発明の塗布液を施すに当り、基体表
面は予め洗浄等によつて清浄にしておくことがよ
り完全な被膜を形成させる上で好ましいことであ
る。かくして該基体表面に塗布液を施すには、ス
プレー法、浸漬引き上げ法、スピンオン法、ロー
ルコーター法などの公知方法を用いて行なうこと
ができる。この際必要に応じて塗布雰囲気の湿分
および溶媒蒸気濃度を適度に調節するなどの処置
を構ずることも塗膜の均一性を得るうえで有効で
ある。 塗布を施した無機質基体を150℃以上の温度で
熱処理することによつて酸化ケイ素被膜が形成さ
れる。 本発明による塗布液では0.02〜5μの膜厚の酸化
ケイ素被膜が透明で且つピンホールやクラツクの
ない均質な被膜として容易に得ることができる。 本発明方法による酸化ケイ素被膜はガラス表面
の化学的、機械的な保護、半導体やガラスからの
不純物拡散の防止、電気的絶縁または不純物ドー
ピングによる電導性制御、研磨等によらずに平滑
な面を得る場合などに有効に使用し得るものであ
る。 次に実施例をあげて本発明を更に詳細に説明す
るが、本発明はこれらに限定されるものではな
い。 実施例 1 撹拌器付きの500mlフラスコに、0.64モル/
硫酸200mlを仕込み、ここへ100mlの0.8モル/
2号水ガラスを10分間で滴下し、水/ケイ素モル
比80のケイ酸水溶液を得た。 次いで200mlのテトラヒドロフランと第1表に
示す様な種類と量の塩析剤を加え、激しく撹拌し
て静置後、ケイ酸を含むテトラヒドロフラン層を
抽出分離した。本液中の水/ケイ素のモル比はそ
れぞれ第1表に示すようであつた。 次いでこの液中のケイ酸分を酸化ケイ素として
3重量%になるようにテトラヒドロフランで稀釈
した。この液を塗布液としてガラス板を浸漬、等
速引き上げ後450℃30分間の焼成を行なつて、
1000Åの膜厚を有する酸化ケイ素被膜を形成させ
た。得られた塗膜を55%HF15g、60%HNO310
g、水600gの比で混合したエツチング液で処理
し、エツチング速度を測定した。また表面状態を
肉眼及び光学顕微鏡で観察した結果を第1表に示
す。
The present invention relates to a method for forming a silicon oxide film on the surface of an inorganic substrate. Conventionally, methods for forming a silicon oxide film on the surface of an inorganic substrate have been based on sputtering or vapor phase growth. However, all of these devices require complicated devices, and it is difficult to form a uniform coating over a wide area. In recent years, in order to improve these drawbacks, a method has been proposed in which, for example, a reaction product of an alkoxysilane or a halogenated silane, a lower carboxylic acid, and an alcohol is applied to a substrate and then heat treated to form a silicon oxide film. (Unexamined Japanese Patent Publication 1973)
-103533 Publication, 1982-104521 Publication, 1982 Publication
Publication No.-34276, Publication No. 55-34258). but,
The silicon oxide coating formed using the coating liquid obtained by the above method does not have a complete coating without pinholes, cracks, etc., and is not necessarily completely satisfactory. The cause of this is not certain, but
This is thought to occur because alkoxy groups remain in hydroxysilanes produced from alkoxysilanes or halogenated silanes, and these alkoxy groups decompose and scatter during heat treatment. When producing a coating liquid by the above method, there is also the disadvantage that the reaction requires an extremely long time (about 24 hours or more) and the productivity is extremely low. A method has also been proposed in which a coating solution is prepared by hydrolyzing a product of 8 moles or less of water per mole of alkoxysilane. (Japanese Unexamined Patent Publication No. 51-93922) However, there is a drawback that the silicon oxide film formed using the coating liquid obtained by this method does not become a complete film. This means that the amount of water used for hydrolysis is water/alkoxysilane <8 (molar ratio)
It is thought that this is because hydrolysis does not proceed completely under these conditions, and as a result, alkoxy groups remain in the hydroxysilane produced, and these alkoxy groups are decomposed and scattered during heat treatment. Furthermore, since all of the above methods use a product that has not been sufficiently hydrolyzed as a coating solution, repellency and unevenness occur on the surface of the inorganic substrate, making it impossible to obtain a homogeneous film, and the coating solution is exposed to moisture during storage. It has the disadvantage that it decomposes. As a result of intensive research to overcome the above-mentioned drawbacks, the inventors of the present invention have developed an aqueous solution of silicic acid by acidifying a silicon compound as a raw material, and then removing and separating water from the aqueous solution. It was discovered that a polar organic solvent solution is suitable as a coating liquid, and the present invention was completed. That is, the present invention provides a method in which a coating solution containing a silicon compound is applied to the surface of an inorganic substrate, and then a silicon oxide film is formed by heat treatment, in which one or two selected from silicic acid and silicates are used as the coating solution. Use a coating solution in which the above silicon compound is acidified to form water-soluble silicic acid, and then the silicic acid aqueous solution is dehydrated to form a polar organic solvent solution with a water/silicon molar ratio of 5 or less. The present invention provides a method for forming a silicon oxide film on the surface of an inorganic substrate, which is characterized by high productivity, high stability, and can provide an excellent coating film. When forming a film using the coating solution of the present invention, since the raw material itself has no organic moieties, there are no problems caused by residual alkoxy groups that occur when alkoxysilane is used as a raw material. There is no need to consider this, and in addition, a uniform coating with high surface hardness without pinholes or cracks can be obtained.In addition, the time required to produce the coating solution is short, and the resulting coating solution is easy to use. has the advantage of being stable even when stored for long periods of time. The silicon compounds used in carrying out the method of the invention are silicic acid and/or silicates. Examples of these compounds include silicic acid, silica sol,
Lithium silicate, potassium silicate, sodium silicate, ammonium silicate, calcium silicate,
Magnesium silicate, JIS No. 1, No. 2, No. 3, No. 4 water glass, lithium water glass, potassium water glass, synthetic silicates such as zeolite X, zeolite Y, zeolite A, zeolite L, olivine, olivine Mention may be made of natural silicate minerals such as , mica, talc, wollastonite, albite, serpentine, and asbestos. These may be used alone or in combination of two or more. In carrying out the method of the present invention, the method of acidifying the silicon compound includes a method of treating the silicon compound with a monovalent or polyvalent acid that is soluble in water and capable of neutralizing the base of the silicate; A method such as treatment with a cation exchange resin can be adopted. Such acids include hydrochloric acid, sulfuric acid, nitric acid, phosphoric acid, sulfonic acid, chlorosulfonic acid, bromic acid, acetic acid, chloroacetic acid, formic acid, oxalic acid, propionic acid, acrylic acid, methacrylic acid, acetoacetic acid, and citric acid. , gluconic acid, glycolic acid, caprylic acid, caproic acid and the like. The amount of acid can be appropriately selected depending on the type of raw material silicon compound, the strength of the acid used, the acid treatment conditions, etc., but in general, it is preferably in the range of 1 equivalent to 100 equivalents per 1 mole of silicon. used. When the raw material silicon compound is water-insoluble, it is preferable to use a relatively large amount of acid in order to increase the yield of the product. This acidification treatment is generally carried out at a temperature in the range of 0°C to 100°C, and although the required time varies depending on the type of raw material, it can usually be carried out in a range of 10 minutes to 5 hours. The acidification treatment is carried out in an acidic region with a pH of 4 or lower, because if the pH becomes 4 or higher during the treatment, a silicic acid gel will be generated, making it impossible to obtain the desired coating solution in the method of the present invention. In carrying out the method of the present invention, the acidified solution is then subjected to a dehydration treatment to form a coating solution having a water/silicon molar ratio of 5 or less, preferably 3 or less. If fine precipitates are present in the liquid during dehydration, it is preferable to separate them by filtration or the like in advance. As a dehydration treatment method, generally a method of adding an inorganic electrolyte and salting out is preferably adopted, but
Of course, other methods such as adding a dehydrating agent can also be used. In order to perform salting out, a polar organic solvent may be added to the acidified solution, an inorganic electrolyte may be added thereto, the mixture may be mixed, and then left to stand. The amount of polar solvent and the amount of inorganic electrolyte during salting out may be such that the silicic acid produced is sufficiently recovered and the water/silicon molar ratio in the coating solution after dehydration is 5 or less. However, in general, 5 parts by weight of polar organic solvent are used per 1 part by weight of silicon oxide.
~100 parts by weight and 1 to 20 parts by weight of inorganic electrolyte are used. If the water/silicon molar ratio in the coating solution is greater than 5, it is not preferable to form a film free of pinholes and cracks, and the film becomes uneven. Examples of the polar organic solvent include methanol, ethanol, propanol, butanol, tetrahydrofuran, dioxane, acetone, methyl ethyl ketone, methyl isobutyl ketone, diethyl ketone, methyl acetate, and ethyl acetate.
In particular, methanol and tetrahydrofuran are preferably used. The inorganic electrolyte may be one commonly used as a salting-out agent, such as sodium chloride, potassium chloride, ammonium chloride, calcium chloride, sodium sulfate, potassium sulfate, ammonium sulfate, magnesium sulfate, and the like. The salting-out operation as a dehydration treatment usually only needs to be carried out once, but in order to increase the extraction rate of the silicic acid component, the extraction may be repeated several times. As a dehydrating agent,
Known solid dehydrating agents such as silica gel, activated alumina, molecular sieves, dehydrated sodium sulfate, and dehydrated copper sulfate can be used. The coating liquid thus obtained can be used as a coating liquid as it is, or after diluting with the above-mentioned organic solvent as desired and further adding suitable additives.
The concentration of silicic acid in the coating solution is expressed as silicon oxide.
Preferably, it is used in a range of 0.1 to 20 weight percent. The diluting solvent for the coating solution may be the same as the extraction solvent or may be different. The coating solution further contains polyhydric alcohols such as ethylene glycol, propylene glycol, triethylene glycol, and glycerin, as well as acetylacetone, ethyl acetoacetate,
chelating compounds such as diacetone alcohol and ethylene glycol monoethyl ether,
Add oxygen-containing high boiling point solvents such as diethylene glycol monoethyl ether and diethylene glycol diethyl ether, polymeric film forming agents such as polyvinyl butyral, polyvinyl pyrrolidone, and polyvinyl acetate, and other metal salts that are soluble in this coating solution. You can also do that. The concentration of these additive components varies depending on the usage conditions of the coating solution and the conditions of the silicon oxide film to be formed, but the oxygen-containing high-boiling solvent is in an amount of 30% by weight or less in the coating solution, and the polymeric film-forming agent is in an amount of 10% by weight or less.
It is preferable to use the amount within a weight percent range. Examples of inorganic substrates to which the coating solution according to the present invention can be applied include well-known inorganic solid surfaces such as glass, ceramics, minerals, and single crystals. In particular, it can be suitably used for glass surfaces. Before applying the coating solution of the present invention to the surface of these substrates, it is preferable to clean the substrate surface by washing or the like in advance in order to form a more complete coating. In order to apply the coating liquid to the surface of the substrate, known methods such as a spray method, a dip-and-lift method, a spin-on method, and a roll coater method can be used. At this time, it is also effective to take measures such as appropriately adjusting the moisture content of the coating atmosphere and the concentration of solvent vapor as necessary in order to obtain uniformity of the coating film. A silicon oxide film is formed by heat-treating the coated inorganic substrate at a temperature of 150°C or higher. With the coating solution according to the present invention, a transparent silicon oxide film having a thickness of 0.02 to 5 μm can be easily obtained as a homogeneous film without pinholes or cracks. The silicon oxide film produced by the method of the present invention chemically and mechanically protects the glass surface, prevents impurity diffusion from semiconductors and glass, controls electrical conductivity through electrical insulation or impurity doping, and forms a smooth surface without polishing. It can be effectively used when obtaining Next, the present invention will be explained in more detail with reference to Examples, but the present invention is not limited thereto. Example 1 In a 500 ml flask with a stirrer, 0.64 mol/
Pour 200ml of sulfuric acid and add 100ml of 0.8mol/
No. 2 water glass was added dropwise over 10 minutes to obtain an aqueous silicic acid solution with a water/silicon molar ratio of 80. Next, 200 ml of tetrahydrofuran and a salting-out agent of the type and amount shown in Table 1 were added, stirred vigorously and left to stand, and then the tetrahydrofuran layer containing silicic acid was extracted and separated. The water/silicon molar ratios in this liquid were as shown in Table 1. Next, the silicic acid content in this liquid was diluted with tetrahydrofuran to a concentration of 3% by weight as silicon oxide. A glass plate was immersed in this liquid as a coating liquid, and after being pulled up at a constant speed, it was fired at 450°C for 30 minutes.
A silicon oxide film with a thickness of 1000 Å was formed. The resulting coating film was mixed with 15 g of 55% HF and 10 g of 60% HNO.
The sample was treated with an etching solution containing 600 g of water and 600 g of water, and the etching rate was measured. Table 1 shows the results of observing the surface condition with the naked eye and with an optical microscope.

【表】 実施例 2 比較例1で得られた塗布液100gに、乾燥シリ
カゲル20gを加えて一昼夜放置後、過して塗布
液とし、(水/ケイ素モル比3)実施例1と同様
の方法にて酸化ケイ素被膜を形成した。この酸化
ケイ素被膜の表面状態は良好で、エツチング速度
は600Å/minであつた。 実施例 3 直径25mmφ、長さ500mmの下方コツク付きカラ
ムに、アンバーライトIR−120B H型陽イオン交
換樹脂を充填し、ここへ0.8モル/2号水ガラ
スを通して酸性化処理した。この酸性化処理液
(水/ケイ素モル比24)100mlを200mlのテトラヒ
ドロフランと混合した。この溶液を分液斗に移
した後、80gの塩化ナトリウムを加えて激しく振
とうして静置後、ケイ酸を含むテトラヒドロフラ
ン層を分離した。本液中の水/ケイ素のモル比は
0.5以下であつた。 次いでこの液中のケイ酸分を酸化ケイ素として
3重量パーセントになるようにテトラヒドロフラ
ンで調整し、塗布液とした。本塗布液を用いて実
施例1と同様手法にて形成した酸化ケイ素被膜の
エツチング速度は450Å/minで、表面状態は良
好だつた。 尚比較のため、本実施例のイオン交換流下液
100mlを200mlのテトラヒドロフランに導き、塩化
ナトリウムを加えないこと以外は全く本実施例と
同様に行なつた。この塗布液を用いた酸化ケイ素
被膜はガラス基板周辺部一帯にクラツクを生じ、
エツチング速度は1100Å/minであつた。 実施例 4 1000mlの撹拌器付きフラスコに濃塩酸500mlと、
A4型合成ゼオライトの200メツシユ下の粉末20g
を仕込み、室温で2時間撹拌した。アンモニア水
でPHを1〜1.5に調整した後、反応残渣を過分
離し、液(水/ケイ素モル比125)に200mlのテ
トラヒドロフランと120gの塩化ナトリウムを加
えて激しく撹拌し、静置後ケイ酸を含むテトラヒ
ドロフラン層を分離した。本液中の水/ケイ酸の
モル比は2であつた。本液中のケイ酸分を酸化ケ
イ素として3重量パーセントに調整した後、実施
例1と同様にして酸化ケイ素被膜を形成させたと
ころ、表面状態が良好でエツチング速度は600
Å/minであつた。 さらに比較のため、抽出の際に食塩を添加しな
かつたこと以外は本実施例と全く同様に行なつて
形成させた酸化ケイ素被膜は周辺部に著しいクラ
ツクを生じ、エツチング速度は1100Å/minであ
つた。
[Table] Example 2 Add 20 g of dry silica gel to 100 g of the coating solution obtained in Comparative Example 1, leave it for a day and night, filter it to obtain a coating solution, and apply the same method as in Example 1 (water/silicon molar ratio 3). A silicon oxide film was formed. The surface condition of this silicon oxide film was good, and the etching rate was 600 Å/min. Example 3 Amberlite IR-120B H-type cation exchange resin was packed in a column with a diameter of 25 mmφ and a length of 500 mm with a bottom cap, and 0.8 mol/No. 2 water glass was passed through the column for acidification treatment. 100 ml of this acidified solution (water/silicon molar ratio 24) was mixed with 200 ml of tetrahydrofuran. This solution was transferred to a separatory funnel, 80 g of sodium chloride was added thereto, and after vigorous shaking and standing, the tetrahydrofuran layer containing silicic acid was separated. The water/silicon molar ratio in this liquid is
It was less than 0.5. Next, the silicic acid content in this liquid was adjusted to 3% by weight as silicon oxide with tetrahydrofuran, and a coating liquid was prepared. The etching rate of a silicon oxide film formed using this coating solution in the same manner as in Example 1 was 450 Å/min, and the surface condition was good. For comparison, the ion exchange flowing liquid of this example was
The procedure was exactly as in this example except that 100 ml was introduced into 200 ml of tetrahydrofuran and no sodium chloride was added. The silicon oxide coating using this coating liquid causes cracks around the glass substrate.
The etching rate was 1100 Å/min. Example 4 500ml of concentrated hydrochloric acid in a 1000ml flask with a stirrer,
20g of powder under 200 mesh of A4 type synthetic zeolite
and stirred at room temperature for 2 hours. After adjusting the pH to 1 to 1.5 with aqueous ammonia, the reaction residue was over-separated, and 200 ml of tetrahydrofuran and 120 g of sodium chloride were added to the liquid (water/silicon molar ratio 125), stirred vigorously, and after standing still, the silicic acid The tetrahydrofuran layer containing was separated. The water/silicic acid molar ratio in this liquid was 2. After adjusting the silicic acid content in this solution to 3% by weight as silicon oxide, a silicon oxide film was formed in the same manner as in Example 1. The surface condition was good and the etching rate was 600%.
The temperature was Å/min. Furthermore, for comparison, a silicon oxide film formed in the same manner as in this example except that no salt was added during extraction had significant cracks in the periphery, and the etching rate was 1100 Å/min. It was hot.

Claims (1)

【特許請求の範囲】 1 無機質基体表面にケイ素化合物を含む塗布液
を塗布し、次いで熱処理によつて酸化ケイ素被膜
となす方法に於て、塗布液としてケイ酸およびケ
イ酸塩から選ばれた一種または二種以上のケイ素
化合物を酸性化処理によつて水溶性ケイ酸とな
し、次いで該ケイ酸水溶液を脱水処理して水/ケ
イ素のモル比が5以下の極性有機溶媒溶液となし
た塗布液を用いることを特徴とする無機質基体表
面への酸化ケイ素被膜の形成法。 2 ケイ素化合物として水ガラス、ケイ酸ナトリ
ウム、ケイ酸カリウム又はカリウム水ガラスを用
いることを特徴とする特許請求の範囲第1項記載
の無機質基体表面への酸化ケイ素被膜の形成法。 3 酸性化処理に用いる酸として、塩酸、硫酸又
は硝酸を用いることを特徴とする特許請求の範囲
第1項記載の無機質基体表面への酸化ケイ素被膜
の形成法。 4 脱水処理を水/ケイ素モル比が3以下となる
ようになすことを特徴とする特許請求の範囲第1
項記載の無機質基体表面への酸化ケイ素被膜の形
成法。 5 脱水処理方法として、無機電解質を用い塩析
させる方法を用いることを特徴とする特許請求の
範囲第1項記載の無機質基体表面への酸化ケイ素
被膜の形成法。
[Claims] 1. In a method of applying a coating solution containing a silicon compound to the surface of an inorganic substrate and then heat-treating it to form a silicon oxide film, a type selected from silicic acid and silicates is used as the coating solution. Alternatively, a coating solution is obtained by acidifying two or more silicon compounds to form water-soluble silicic acid, and then dehydrating the silicic acid aqueous solution to form a polar organic solvent solution with a water/silicon molar ratio of 5 or less. A method for forming a silicon oxide film on the surface of an inorganic substrate, the method comprising using: 2. The method for forming a silicon oxide film on the surface of an inorganic substrate according to claim 1, characterized in that water glass, sodium silicate, potassium silicate, or potassium water glass is used as the silicon compound. 3. The method for forming a silicon oxide film on the surface of an inorganic substrate according to claim 1, characterized in that hydrochloric acid, sulfuric acid, or nitric acid is used as the acid used in the acidification treatment. 4. Claim 1, characterized in that the dehydration treatment is performed such that the water/silicon molar ratio is 3 or less.
A method for forming a silicon oxide film on the surface of an inorganic substrate as described in 1. 5. The method of forming a silicon oxide film on the surface of an inorganic substrate according to claim 1, characterized in that the dehydration treatment method is a method of salting out using an inorganic electrolyte.
JP2046181A 1981-02-14 1981-02-14 Formation of silicon oxide film on surface of inorganic substrate Granted JPS57135713A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2046181A JPS57135713A (en) 1981-02-14 1981-02-14 Formation of silicon oxide film on surface of inorganic substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2046181A JPS57135713A (en) 1981-02-14 1981-02-14 Formation of silicon oxide film on surface of inorganic substrate

Publications (2)

Publication Number Publication Date
JPS57135713A JPS57135713A (en) 1982-08-21
JPS6310090B2 true JPS6310090B2 (en) 1988-03-03

Family

ID=12027713

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2046181A Granted JPS57135713A (en) 1981-02-14 1981-02-14 Formation of silicon oxide film on surface of inorganic substrate

Country Status (1)

Country Link
JP (1) JPS57135713A (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012077210A (en) * 2010-10-01 2012-04-19 Kaneka Corp Method for manufacturing laminate

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Publication number Publication date
JPS57135713A (en) 1982-08-21

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