JPS63114872A - Surface polishing device - Google Patents

Surface polishing device

Info

Publication number
JPS63114872A
JPS63114872A JP61257895A JP25789586A JPS63114872A JP S63114872 A JPS63114872 A JP S63114872A JP 61257895 A JP61257895 A JP 61257895A JP 25789586 A JP25789586 A JP 25789586A JP S63114872 A JPS63114872 A JP S63114872A
Authority
JP
Japan
Prior art keywords
temperature
liquid
stool
workpiece
polishing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61257895A
Other languages
Japanese (ja)
Inventor
Misuo Sugiyama
杉山 美寿男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SpeedFam Co Ltd
Original Assignee
SpeedFam Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SpeedFam Co Ltd filed Critical SpeedFam Co Ltd
Priority to JP61257895A priority Critical patent/JPS63114872A/en
Publication of JPS63114872A publication Critical patent/JPS63114872A/en
Pending legal-status Critical Current

Links

Landscapes

  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Grinding-Machine Dressing And Accessory Apparatuses (AREA)

Abstract

PURPOSE:To sustain the flatness with a high degree of accuracy, by filling polishing liquid in a liquid tank to such a degree that a stool and a pressurizing plate are sunk into polishing liquid during the workpiece is polished, so as to prevent the temperatures of a stool and a pressurizing plate from rising and to prevent occurrence of the difference in pressure between the upper and lower surfaces. CONSTITUTION:A drive source 12 rotates a liquid tank 11 together with a stool 13 in the liquid tank 11. In this condition, a pressurizing plate 22 is lowered so that a workpiece 23 bonded to the lower surface of the pressurizing plate 22 is made into press-contact with the upper surface of the stool 13 on rotation under a predetermined pressure in order to polish the workpiece 23 by the stool 13. Meanwhlie, polishing liquid 14 is circulated from the liquid tank 11 by means of a pump 18 through a suction pipe 16, a temperature managing device 15 and a supply pipe 17 to cool the stool 13 and the workpiece by the polishing liquid 14 so as to prevent a temperature rise of the stool 13 and the transmission of heat to the pressurizing plate 22. As a result the polishing liquid whose temperature is raised, is cooled while it circulates through the temperature managing device 15, thereby it is possible to maintain the liquid at a set temperature.

Description

【発明の詳細な説明】 [産業上の利用分野1 本発明は、回転する定盤にワークを圧接させてTif磨
干るようにした平面研磨装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application 1] The present invention relates to a surface polishing apparatus that performs TIF polishing by bringing a workpiece into pressure contact with a rotating surface plate.

〔従来の技術] 一般に、回転する定盤に加圧プレートによりワークを圧
接させて研磨すると、ワークと定盤との界面で発熱し、
定盤や加圧プレートが熱変形してその平面度が悪化する
ため、ワークを所望の精度で研@することができない。
[Prior Art] Generally, when polishing a workpiece by pressing it against a rotating surface plate using a pressure plate, heat is generated at the interface between the workpiece and the surface plate.
Because the surface plate and pressure plate are thermally deformed and their flatness deteriorates, it is not possible to grind the workpiece with the desired accuracy.

そこで、このような問題を解消するため、例えば実公昭
80−21174号公報には、定盤の内部に冷却室を設
け、この冷却室内に冷却水を循還的に供給することによ
り該定盤の温度上昇を防ぐようにしたものが提奪されて
おり、該定盤の極端な温度上昇による地変形を防いで研
磨精度を高め得るという点で著しい成果をあげている。
Therefore, in order to solve this problem, for example, in Japanese Utility Model Publication No. 80-21174, a cooling chamber is provided inside the surface plate, and cooling water is supplied into the cooling chamber in a circular manner. A device designed to prevent the temperature rise of the surface plate has been proposed, and has achieved remarkable results in that it can prevent ground deformation due to the extreme temperature rise of the surface plate and improve polishing precision.

しかしながら、上記従来の装置においては、定盤の犬が
かりな熱変形は防止できるものの、その上下面の温彦差
による比較的微小な熱変形までも完全に防止中ることは
できず、高い平面度を要求゛される精密研磨への適用は
困難であった。即ち、このように定盤内に冷却水を通す
と、定盤の上面は加工によって発熱昇温するが、下面は
冷却により昇温しないため、上面と下面とで大きな温度
差が生じ、その温度差により定盤が歪んで平面度を維持
できなくなる。しかも、その温度差が加工時間等に応じ
た定盤上面の温度変化と共に変化するため、定盤の平面
度も変化し、一定の条件でワークを研磨することができ
なかった。また、加圧プレートについても同様の間寵が
あった。
However, although the above-mentioned conventional device can prevent severe thermal deformation of the surface plate, it cannot completely prevent even the relatively minute thermal deformation due to the temperature difference between the upper and lower surfaces. It has been difficult to apply it to precision polishing, which requires In other words, when cooling water is passed through the surface plate in this way, the top surface of the surface plate heats up due to processing, but the bottom surface does not rise in temperature due to cooling, so a large temperature difference occurs between the top and bottom surfaces, and the temperature Due to the difference, the surface plate becomes distorted and flatness cannot be maintained. Moreover, since the temperature difference changes with the temperature change on the top surface of the surface plate depending on the processing time, etc., the flatness of the surface plate also changes, making it impossible to polish the workpiece under constant conditions. Similar considerations were made regarding the pressure plate.

特に近年では、単導体ウェハ、真空機器等の研磨におい
て非常に高い研磨精度が要求されるようになっており、
その要求に答える意味からも、上述したような定盤及び
加圧プレートの温度や上、下面の温度差を厳しく管理し
、その平面度を適正にコントロールすることは極めて重
要な意味を持つ。
Especially in recent years, extremely high polishing precision has been required for polishing single conductor wafers, vacuum equipment, etc.
In order to meet this demand, it is extremely important to strictly control the temperature of the surface plate and pressure plate as described above, as well as the temperature difference between the upper and lower surfaces, and to properly control their flatness.

〔発明が解決しようとする問題点] 大発明の課題は、定i及び加圧プレートの温度変化や上
下面での温度差をなくし、それらの平面度を高精度に管
理できるようにした平面研磨装置を提供することにある
[Problems to be Solved by the Invention] The problem of the great invention is to eliminate temperature changes in the constant i and pressure plates and temperature differences between the upper and lower surfaces, and to provide surface polishing that makes it possible to control their flatness with high precision. The goal is to provide equipment.

し問題点を解決するための手段〕 上記課題を解決するため、大発明においては、回転自在
の定盤と該定盤にワークを圧接させる加圧プレートとを
備え、該加圧プレートによりワークを一定の加圧力で定
盤に押付けながら研磨するようにしたものにおいて、上
記定盤を液槽内に設け1.該液槽に、ワークの研磨加工
時に定盤及び加圧プレートが浸漬する程度に研磨液を充
填すると共に、該研磨液の温度管理装置を付設したこと
を特徴とするものである。
Means for Solving the Problems] In order to solve the above problems, the great invention includes a rotatable surface plate and a pressure plate that presses the workpiece against the surface plate, and the pressure plate presses the workpiece. In a device in which polishing is performed while pressing against a surface plate with a constant pressure, the surface plate is provided in a liquid tank.1. The present invention is characterized in that the liquid bath is filled with polishing liquid to such an extent that the surface plate and pressure plate are immersed during polishing of a workpiece, and that a temperature control device for the polishing liquid is attached.

[作 用] 研磨液中へ浸漬した状態で回転する定盤の上面に加圧プ
レートによりワークが一定の圧力で圧接され、該定盤に
よってそれが研磨加工される。
[Function] A workpiece is pressed against the upper surface of a rotating surface plate under constant pressure by a pressure plate while immersed in a polishing liquid, and the workpiece is polished by the surface plate.

一方、研磨液は、温度管理装置により常時一定温度に保
持されている。
On the other hand, the polishing liquid is always maintained at a constant temperature by a temperature control device.

ここで、研磨加工によって定盤及びワークが発熱すると
、その熱は研磨液によって直ちに冷却され、定盤の温度
と昇や加圧プレートへの熱伝達が防[I−される、従っ
て、これらの定盤及び加圧プレートは、常に一定温度に
保持されるばかりでなく、□上下面の温度差を生じるこ
ともなく、温度変化や温度差による反りや変形などの歪
みが生じない。
Here, when the surface plate and workpiece generate heat due to the polishing process, the heat is immediately cooled by the polishing liquid, preventing the temperature of the surface plate from rising and heat transfer to the pressure plate. The surface plate and pressure plate are not only kept at a constant temperature at all times, but also have no temperature difference between the upper and lower surfaces, and no distortion such as warpage or deformation due to temperature changes or temperature differences.

[実施例1 以下1本発明の実施例を図面に基づいて詳細に説明する
[Embodiment 1] Hereinafter, an embodiment of the present invention will be described in detail based on the drawings.

第1図において、10は平面研磨装置の機体であって、
該機体10には、液槽11が回転自在に取付けられ、該
液槽11は、その下面に設けられた駆動軸11aを介し
てモータ等の駆動源12に接続されている。
In FIG. 1, 10 is the body of a flat surface polishing apparatus,
A liquid tank 11 is rotatably attached to the body 10, and the liquid tank 11 is connected to a drive source 12 such as a motor via a drive shaft 11a provided on the lower surface of the liquid tank 11.

上記液槽11の内部には、中心穴13aを備えた円環状
の定913が、該液槽11の底面11bより若干持ち、
ヒげられると共に、該液槽11内に充填された研磨液1
4中に全体が浸漬するように取付けられており、該液槽
11には、研磨液の温度を管理するための温度管理装置
15がポンプ18を介して付設され、液槽11の内部外
周には、研磨液14を攪拌するためのフィン19が配設
されている。このフィン18は、液(11と一緒に回転
することのないように固定的に配設され、液槽11の回
転によって研磨液を攪拌するものである。
Inside the liquid tank 11, an annular ring 913 with a center hole 13a extends slightly from the bottom surface 11b of the liquid tank 11.
The polishing liquid 1 filled in the liquid tank 11 while being polished
A temperature control device 15 for controlling the temperature of the polishing liquid is attached to the liquid tank 11 via a pump 18. A fin 19 for stirring the polishing liquid 14 is provided. The fins 18 are fixedly disposed so as not to rotate together with the liquid (11), and stir the polishing liquid by the rotation of the liquid tank 11.

また1、l:記温度管理装置15は、液温を検出する温
度センサや熱交換器などの液温yJ節手段を備え、上記
液槽11内の研磨液14を吸込管16及び供給管17を
通じてポンプ18により循環させながら、その液温を設
定温度に保つものであって、上記吸込管16が液槽11
の外周部に、供給管17が液槽14の中心部にそれぞれ
配設されている。この場合、研磨液14中に浸漬する吸
込管16によっても該研磨液14がIaされることにな
る。
Further, the temperature control device 15 described in 1 and 1 is equipped with liquid temperature control means such as a temperature sensor and a heat exchanger for detecting the liquid temperature, and carries the polishing liquid 14 in the liquid tank 11 to the suction pipe 16 and the supply pipe 17. The suction pipe 16 is connected to the liquid tank 11 while circulating the liquid by a pump 18 to maintain the temperature of the liquid at a set temperature.
A supply pipe 17 is disposed at the center of the liquid tank 14 on the outer periphery of the liquid tank 14 . In this case, the polishing liquid 14 is also exposed to the suction pipe 16 immersed in the polishing liquid 14.

上記液槽11のと方には、複数のエアシリンダ20が機
体10に取付けられて配設され、これらのエアシリンダ
200ロツドにそれぞれ加圧ヘッド21が取付けられる
と共に、各加圧へ一2ド21にワーク23を貼着保持す
る加圧プレート22が着脱自在に取付けられており、該
加圧プレート22の下面に貼着されたワーク23が上記
シリンダ20により定盤13に圧接されて研磨されるよ
うになっている。
A plurality of air cylinders 20 are installed on the body 10 on the side of the liquid tank 11, and a pressurizing head 21 is attached to each of these air cylinders 200 rods. A pressure plate 22 for holding a workpiece 23 attached to the plate 21 is detachably attached, and the workpiece 23 attached to the lower surface of the pressure plate 22 is pressed against the surface plate 13 by the cylinder 20 and polished. It has become so.

なお、上記シリンダ20は、空気圧1整弁24を介して
圧縮空気ff125に接続されている。また1図中28
はドレン排出口である。
Note that the cylinder 20 is connected to compressed air ff125 via an air pressure 1 regulating valve 24. Also 28 in 1 figure
is the drain outlet.

次に、上記構成を有する平面研磨装置の作用について説
明する。
Next, the operation of the surface polishing apparatus having the above configuration will be explained.

シリンダ20により加圧プレート22が上昇せしめられ
た状態で液槽11が駆動′a12により回転されると、
該液1611内に取付けられた定a13も該液槽11と
共に回転する。この状態で加圧プレート22が下降し、
その下面に貼着されたワーク23が回転する定盤130
1面にシリンダ20により一定の圧力で圧接され、該定
盤13によって研磨加工される。
When the liquid tank 11 is rotated by the drive 'a12 with the pressure plate 22 raised by the cylinder 20,
The constant a13 installed in the liquid 1611 also rotates together with the liquid tank 11. In this state, the pressure plate 22 is lowered,
Surface plate 130 on which the workpiece 23 attached to the lower surface rotates
One surface is pressed with a constant pressure by a cylinder 20, and polished by the surface plate 13.

一方、液槽11内の研@液14は、ポンプ18により吸
込管16.温度管理装置15、及び供給管17を経て循
環せしめられている。
On the other hand, the polishing liquid 14 in the liquid tank 11 is pumped through the suction pipe 16 by the pump 18. It is circulated through a temperature control device 15 and a supply pipe 17.

ここで、加工開始時などに研磨液14の液温か設定温度
より低い場合には、温度管理装置15によって該研磨液
14が加熱され、それが設定温度に保持される。
Here, if the temperature of the polishing liquid 14 is lower than the set temperature at the start of processing, etc., the polishing liquid 14 is heated by the temperature control device 15 and maintained at the set temperature.

また、研磨加工によって定盤13及びワーク23が発熱
すると、その熱は研磨液14によって直ちに冷却され、
定盤13の温度上昇や加圧プレート22への熱伝達が防
止される。従って、これらの定盤13及び加圧プレート
22は、常に一定温度に保持されるばかりでなく、上下
面の温度差を生じることもなく、温度変化や温度差によ
る反りや変形などの歪みが生じない。
Furthermore, when the surface plate 13 and the workpiece 23 generate heat due to the polishing process, the heat is immediately cooled by the polishing liquid 14.
A rise in temperature of the surface plate 13 and heat transfer to the pressure plate 22 are prevented. Therefore, these surface plate 13 and pressure plate 22 are not only kept at a constant temperature at all times, but also do not have a temperature difference between the upper and lower surfaces, and are not subject to distortion such as warping or deformation due to temperature changes or temperature differences. do not have.

一方、定盤13及び加圧プレート22を冷却することに
より研磨液14の液温か上昇すると、それが温度管理装
MI5を通ってm環する開に冷却され、設定温度に保た
れる。従って、研磨液14の温度上昇による冷却効率の
低下や、定盤13及び加圧プレート22の昇温による歪
みの発生等が生じない。
On the other hand, when the temperature of the polishing liquid 14 rises by cooling the surface plate 13 and the pressure plate 22, it passes through the temperature control device MI5 and is cooled to a constant temperature, thereby maintaining the set temperature. Therefore, a decrease in cooling efficiency due to an increase in the temperature of the polishing liquid 14 and generation of distortion due to an increase in the temperature of the surface plate 13 and pressure plate 22 do not occur.

[発明の効果] このように、本発明の平面研磨装置によれば。[Effect of the invention] Thus, according to the surface polishing apparatus of the present invention.

定盤及び加圧プレートを研磨液中に浸漬した状態でワー
クの研磨加工を行うようにしたので、これらの定盤及び
加圧プレートの温度上昇や上下面の温度差の発生等を防
止し、熱変形を防いでその平面度を高精度に管理するこ
とができる。
Since the workpiece is polished while the surface plate and pressure plate are immersed in the polishing liquid, the temperature rise of the surface plate and pressure plate and the temperature difference between the upper and lower surfaces can be prevented. It is possible to prevent thermal deformation and to control its flatness with high precision.

しかも、研磨液を温度管理装設で常時一定温度に保つよ
うにしたので、定熾及び加圧プレートの加工に伴なう温
度変化を防止することができ、これによって加工精度を
一層高めることが可能となる。
Furthermore, since the polishing liquid is always kept at a constant temperature using a temperature control device, it is possible to prevent temperature changes that occur during processing of the fixing plate and pressurizing plate, thereby further increasing processing accuracy. It becomes possible.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の要部断面図である。 13・・定盤、      14・・研磨液、15Φ・
温度管理装置、22・舎加圧プレート、23−・ワーク
FIG. 1 is a sectional view of a main part of an embodiment of the present invention. 13. Surface plate, 14. Polishing liquid, 15Φ.
Temperature control device, 22. Pressure plate, 23. Work.

Claims (1)

【特許請求の範囲】[Claims] 1、回転自在の定盤と該定盤にワークを圧接させる加圧
プレートとを備え、該加圧プレートによりワークを一定
の加圧力で定盤に押付けながら研磨するようにしたもの
において、上記定盤を液槽内に設け、該液槽に、ワーク
の研磨加工時に定盤及び加圧プレートが浸漬する程度に
研磨液を充填すると共に、該研磨液の温度管理装置を付
設したことを特徴とする平面研磨装置。
1. A rotatable surface plate and a pressure plate that presses the workpiece against the surface plate, and the pressure plate presses the workpiece against the surface plate with a constant pressure while polishing. A disk is provided in a liquid tank, and the liquid tank is filled with polishing liquid to such an extent that the surface plate and pressure plate are immersed during polishing of a workpiece, and a temperature control device for the polishing liquid is attached. Surface polishing equipment.
JP61257895A 1986-10-29 1986-10-29 Surface polishing device Pending JPS63114872A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61257895A JPS63114872A (en) 1986-10-29 1986-10-29 Surface polishing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61257895A JPS63114872A (en) 1986-10-29 1986-10-29 Surface polishing device

Publications (1)

Publication Number Publication Date
JPS63114872A true JPS63114872A (en) 1988-05-19

Family

ID=17312679

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61257895A Pending JPS63114872A (en) 1986-10-29 1986-10-29 Surface polishing device

Country Status (1)

Country Link
JP (1) JPS63114872A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5113622A (en) * 1989-03-24 1992-05-19 Sumitomo Electric Industries, Ltd. Apparatus for grinding semiconductor wafer
JPH0626530A (en) * 1992-06-23 1994-02-01 Aisin Chem Co Ltd Method for polishing clutch plate

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5113622A (en) * 1989-03-24 1992-05-19 Sumitomo Electric Industries, Ltd. Apparatus for grinding semiconductor wafer
JPH0626530A (en) * 1992-06-23 1994-02-01 Aisin Chem Co Ltd Method for polishing clutch plate

Similar Documents

Publication Publication Date Title
JP2985490B2 (en) Heat removal method of polishing machine
EP1614505A1 (en) Polishing device and method
JPH0112631B2 (en)
JP4654209B2 (en) Polishing equipment
KR100632468B1 (en) Retainer Rings, Polishing Heads & Chemical Mechanical Polishing Devices
TW202335790A (en) Semiconductor manufacturing device and manufacturing method of semiconductor device
CN112405333A (en) Chemical mechanical polishing device and polishing method
JPS63114872A (en) Surface polishing device
JPS61265262A (en) Polishing apparatus
US7163053B2 (en) Heat exchanger
JP2008229828A (en) Surface plate shape control device and flat surface processing device
JPH0752034A (en) Wafer polishing machine
JP2002231672A (en) Wafer-polishing method and device
JP2000015561A (en) Polishing machine
JP4051116B2 (en) Wafer polishing equipment
JPH0659623B2 (en) Wafer mechanochemical polishing method and apparatus
JP2001237206A (en) Flattening method
JP2002046058A (en) Method of dressing polishing cloth for double-sided polishing
JPH02250771A (en) Semiconductor wafer grinding equipment
JPH01222861A (en) Surface polishing device
JPH02240925A (en) Wafer polishing equipment
CN223572865U (en) A cleaning fluid heat preservation device for precision grinding of ultra-precision bearing steel balls
KR20250138780A (en) Polishing treatment device and polishing table
JPH07307317A (en) Semiconductor wafer polishing machine
JP2000218515A (en) Polishing machine