JPS63139534U - - Google Patents

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Publication number
JPS63139534U
JPS63139534U JP3185287U JP3185287U JPS63139534U JP S63139534 U JPS63139534 U JP S63139534U JP 3185287 U JP3185287 U JP 3185287U JP 3185287 U JP3185287 U JP 3185287U JP S63139534 U JPS63139534 U JP S63139534U
Authority
JP
Japan
Prior art keywords
wavelength
absorbance
spectrometer
measure
main
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3185287U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3185287U priority Critical patent/JPS63139534U/ja
Publication of JPS63139534U publication Critical patent/JPS63139534U/ja
Pending legal-status Critical Current

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  • Spectrometry And Color Measurement (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本案の原理を示す構成の概念図、第2
図は本案の一実施例を示す構造の概念図である。 1…入射主光軸、2…入射副光軸、3…出射主
軸、4…反射プリズム、5…入射スリツト、6…
出射スリツト、7…分散子(回折格子)。
Figure 1 is a conceptual diagram of the configuration showing the principle of the present proposal, Figure 2
The figure is a conceptual diagram of a structure showing an embodiment of the present invention. 1... Input main optical axis, 2... Input sub-optical axis, 3... Output main axis, 4... Reflection prism, 5... Input slit, 6...
Output slit, 7...Dispersion element (diffraction grating).

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 溶液試料の主吸収帯にある主波長と、吸収の度
合いの少ない副波長における吸光度を測定し、両
波長における吸光度の差、または比によつて、試
料による散乱等の影響を軽減して濃度を測定する
二波長分光光度計において、まず主波長における
吸光度を測定し、次に分光器の分散子を固定した
まま、分光器の光路中に反射プリズムを挿入し、
分光器の出射スリツトより出射する光の波長を変
えて副波長における吸光度を測定することを特徴
とする二波長分光光度計。
Measure the absorbance at the main wavelength in the main absorption band of the solution sample and at the subwavelength where the degree of absorption is low, and use the difference or ratio of the absorbance at both wavelengths to reduce the influence of scattering etc. due to the sample and calculate the concentration. In the dual-wavelength spectrophotometer to be measured, first measure the absorbance at the dominant wavelength, then insert a reflective prism into the optical path of the spectrometer while keeping the dispersion of the spectrometer fixed.
A two-wavelength spectrophotometer characterized by measuring absorbance at a sub-wavelength by changing the wavelength of light emitted from an output slit of a spectrometer.
JP3185287U 1987-03-06 1987-03-06 Pending JPS63139534U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3185287U JPS63139534U (en) 1987-03-06 1987-03-06

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3185287U JPS63139534U (en) 1987-03-06 1987-03-06

Publications (1)

Publication Number Publication Date
JPS63139534U true JPS63139534U (en) 1988-09-14

Family

ID=30837968

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3185287U Pending JPS63139534U (en) 1987-03-06 1987-03-06

Country Status (1)

Country Link
JP (1) JPS63139534U (en)

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