JPS6317225B2 - - Google Patents

Info

Publication number
JPS6317225B2
JPS6317225B2 JP55140465A JP14046580A JPS6317225B2 JP S6317225 B2 JPS6317225 B2 JP S6317225B2 JP 55140465 A JP55140465 A JP 55140465A JP 14046580 A JP14046580 A JP 14046580A JP S6317225 B2 JPS6317225 B2 JP S6317225B2
Authority
JP
Japan
Prior art keywords
lead frame
cartridge
electronic component
electronic components
leads
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55140465A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5764947A (en
Inventor
Hiroyuki Nakajima
Mutsuyo Kanetani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP55140465A priority Critical patent/JPS5764947A/ja
Publication of JPS5764947A publication Critical patent/JPS5764947A/ja
Publication of JPS6317225B2 publication Critical patent/JPS6317225B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP55140465A 1980-10-09 1980-10-09 Inspecting apparatus for electric characteristics of electronic parts Granted JPS5764947A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55140465A JPS5764947A (en) 1980-10-09 1980-10-09 Inspecting apparatus for electric characteristics of electronic parts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55140465A JPS5764947A (en) 1980-10-09 1980-10-09 Inspecting apparatus for electric characteristics of electronic parts

Publications (2)

Publication Number Publication Date
JPS5764947A JPS5764947A (en) 1982-04-20
JPS6317225B2 true JPS6317225B2 (cs) 1988-04-13

Family

ID=15269225

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55140465A Granted JPS5764947A (en) 1980-10-09 1980-10-09 Inspecting apparatus for electric characteristics of electronic parts

Country Status (1)

Country Link
JP (1) JPS5764947A (cs)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5944840A (ja) * 1982-09-07 1984-03-13 Toshiba Corp フラットパッケ−ジの測定装置
JPS59181631A (ja) * 1983-03-31 1984-10-16 Toshiba Corp 半導体装置の自動ハンドラ−
JPH06281698A (ja) * 1993-11-26 1994-10-07 Toshiba Corp Ｉｃオートハンドラ方法

Also Published As

Publication number Publication date
JPS5764947A (en) 1982-04-20

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