JPS6317404U - - Google Patents

Info

Publication number
JPS6317404U
JPS6317404U JP4868086U JP4868086U JPS6317404U JP S6317404 U JPS6317404 U JP S6317404U JP 4868086 U JP4868086 U JP 4868086U JP 4868086 U JP4868086 U JP 4868086U JP S6317404 U JPS6317404 U JP S6317404U
Authority
JP
Japan
Prior art keywords
light
test piece
receiving part
light receiving
displacement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4868086U
Other languages
English (en)
Other versions
JPH0723683Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1986048680U priority Critical patent/JPH0723683Y2/ja
Publication of JPS6317404U publication Critical patent/JPS6317404U/ja
Application granted granted Critical
Publication of JPH0723683Y2 publication Critical patent/JPH0723683Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Description

【図面の簡単な説明】
第1図は本考案による光学式変位計の一実施例
の全体構成図、第2図はグリツドを示す拡大平面
図、第3図は光学式センサを示す拡大平面図、第
4図は実施例における信号処理部を示す詳細図、
第5図a〜f及び第6図a〜fは各々信号処理部
の各部信号を示す波形図、第7図は他の実施例の
全体構成図、第8図及び第9図は従来の変位計の
2例を示す図である。 TP:試験片、10a,10b:接触子、11
:支点、12,33:グリツド、12a:非反射
部、12b:反射部、13:光学式センサ、14
:信号処理部、16a,17a:発光素子、16
b,17b:受光素子、16c,16d,17c
,17d:光フアイバ、23:マイクロコンピユ
ータ、24:レコーダ、32:光源。

Claims (1)

    【実用新案登録請求の範囲】
  1. 試験片の標点位置に取付けられて試験片の変位
    に追動する一対の接触子と、発光部および受光部
    を有し一方の接触子側に少なくともいずれかが設
    けられた光学式センサと、他方の接触子側に設け
    られ、発光部からの光をオン・オフして受光部に
    導くグリツドと、受光部で受光したオン・オフ光
    信号に基づいて試験片の変位量を算出する信号処
    理部と、を具備したことを特徴とする光学式変位
    計。
JP1986048680U 1986-03-31 1986-03-31 光学式変位計 Expired - Lifetime JPH0723683Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1986048680U JPH0723683Y2 (ja) 1986-03-31 1986-03-31 光学式変位計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1986048680U JPH0723683Y2 (ja) 1986-03-31 1986-03-31 光学式変位計

Publications (2)

Publication Number Publication Date
JPS6317404U true JPS6317404U (ja) 1988-02-05
JPH0723683Y2 JPH0723683Y2 (ja) 1995-05-31

Family

ID=30870438

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1986048680U Expired - Lifetime JPH0723683Y2 (ja) 1986-03-31 1986-03-31 光学式変位計

Country Status (1)

Country Link
JP (1) JPH0723683Y2 (ja)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5956509U (ja) * 1982-10-08 1984-04-13 三井化学株式会社 光学式伸び計

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5956509U (ja) * 1982-10-08 1984-04-13 三井化学株式会社 光学式伸び計

Also Published As

Publication number Publication date
JPH0723683Y2 (ja) 1995-05-31

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