JPS6319280U - - Google Patents

Info

Publication number
JPS6319280U
JPS6319280U JP11227486U JP11227486U JPS6319280U JP S6319280 U JPS6319280 U JP S6319280U JP 11227486 U JP11227486 U JP 11227486U JP 11227486 U JP11227486 U JP 11227486U JP S6319280 U JPS6319280 U JP S6319280U
Authority
JP
Japan
Prior art keywords
resistor
measuring
current
steady
subtraction circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP11227486U
Other languages
Japanese (ja)
Other versions
JPH0611510Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11227486U priority Critical patent/JPH0611510Y2/en
Publication of JPS6319280U publication Critical patent/JPS6319280U/ja
Application granted granted Critical
Publication of JPH0611510Y2 publication Critical patent/JPH0611510Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図はこの考案の一実施例を示す接続図、第
２図は従来の電圧印加電流測定装置を説明するた
めの接続図、第３図はＣ―ＭＯＳ形ＩＣに流れる
電流を説明するための波形図である。 １００：被験体、２００：電源、３００：定常
電流測定手段、３０１：定常電流検出用抵抗器、
３０２：レンジ切替手段、３０３：第１引算回路
、４００：電圧帰還回路、５００：電流制限回路
、６００：過電流検出用抵抗器、７００：第２引
算回路、８０１，８０２：ピーク電流側路用ダイ
オード。 Fig. 1 is a connection diagram showing an embodiment of this invention, Fig. 2 is a connection diagram to explain a conventional voltage applied current measuring device, and Fig. 3 is a connection diagram to explain the current flowing through a C-MOS type IC. FIG. 100: Subject, 200: Power source, 300: Steady current measuring means, 301: Steady current detection resistor,
302: Range switching means, 303: First subtraction circuit, 400: Voltage feedback circuit, 500: Current limiting circuit, 600: Overcurrent detection resistor, 700: Second subtraction circuit, 801, 802: Peak current side road diode.

Claims (1)

【実用新案登録請求の範囲】 Ａ 被験体に電源電圧を与える電源と、 Ｂ この電源と被験体との間に直列接続された定
常電流測定用抵抗器及び過電流測定用抵抗器と、 Ｃ 定常電流測定用抵抗器に並列接続したピータ
電流側路用ダイオードと、 Ｄ 定常電流測定用抵抗器に発生する電圧を取出
す第１引算回路と、 Ｅ 過電流測定用抵抗器に発生する電圧を取出す
第２引算回路と、 Ｆ この第２引算回路の出力電圧を設定電圧と比
較し第２引算回路の出力電圧が設定電圧を越えた
とき上記電源の出力電圧を制限する電圧制限回路
と、 から成る電圧印加電流測定装置。[Claims for Utility Model Registration] A. A power source that provides a power supply voltage to the test object; B. A resistor for measuring a steady current and a resistor for measuring an overcurrent connected in series between this power source and the test object; C. A steady state Peter's current bypass diode connected in parallel to the current measuring resistor, D: A first subtraction circuit that extracts the voltage generated in the steady current measuring resistor, E: Extracting the voltage generated in the overcurrent measuring resistor a second subtraction circuit; A voltage applied current measuring device consisting of the following.
JP11227486U 1986-07-21 1986-07-21 Voltage applied current measuring device Expired - Lifetime JPH0611510Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11227486U JPH0611510Y2 (en) 1986-07-21 1986-07-21 Voltage applied current measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11227486U JPH0611510Y2 (en) 1986-07-21 1986-07-21 Voltage applied current measuring device

Publications (2)

Publication Number Publication Date
JPS6319280U true JPS6319280U (en) 1988-02-08
JPH0611510Y2 JPH0611510Y2 (en) 1994-03-23

Family

ID=30992993

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11227486U Expired - Lifetime JPH0611510Y2 (en) 1986-07-21 1986-07-21 Voltage applied current measuring device

Country Status (1)

Country Link
JP (1) JPH0611510Y2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999028756A1 (en) * 1997-12-02 1999-06-10 Advantest Corporation Method of measuring current while applying a voltage and apparatus therefor
JP2008026015A (en) * 2006-07-18 2008-02-07 Young Tek Electronics Corp Device for measuring static parameters of integrated circuits
JP2009115506A (en) * 2007-11-02 2009-05-28 Yokogawa Electric Corp DC test equipment and semiconductor test equipment

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6323668B1 (en) * 1997-11-20 2001-11-27 Advantest Corporation IC testing device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999028756A1 (en) * 1997-12-02 1999-06-10 Advantest Corporation Method of measuring current while applying a voltage and apparatus therefor
JP2008026015A (en) * 2006-07-18 2008-02-07 Young Tek Electronics Corp Device for measuring static parameters of integrated circuits
JP2009115506A (en) * 2007-11-02 2009-05-28 Yokogawa Electric Corp DC test equipment and semiconductor test equipment

Also Published As

Publication number Publication date
JPH0611510Y2 (en) 1994-03-23

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