JPS6328058A - Integrated circuit device - Google Patents

Integrated circuit device

Info

Publication number
JPS6328058A
JPS6328058A JP61172076A JP17207686A JPS6328058A JP S6328058 A JPS6328058 A JP S6328058A JP 61172076 A JP61172076 A JP 61172076A JP 17207686 A JP17207686 A JP 17207686A JP S6328058 A JPS6328058 A JP S6328058A
Authority
JP
Japan
Prior art keywords
substrate bias
bias generation
circuit
generation circuit
turned
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61172076A
Other languages
Japanese (ja)
Inventor
Masao Ikushima
正雄 生嶋
Akira Osawa
彰 大沢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electronics Corp filed Critical Matsushita Electronics Corp
Priority to JP61172076A priority Critical patent/JPS6328058A/en
Publication of JPS6328058A publication Critical patent/JPS6328058A/en
Pending legal-status Critical Current

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  • Semiconductor Integrated Circuits (AREA)
  • Semiconductor Memories (AREA)

Abstract

PURPOSE:To enable substrate potential to quickly become of a constant value when the power is turned on, by providing a flip flop which can control control- circuit operations at that time. CONSTITUTION:A flip flop 5 is designed not to operate a controlling circuit 3 in its initial state. when the source is turned on, therefore, the second high- power circuit 2 for substrate-bias generation can be operated until a reset signal is applied to the reset terminal 6 in this flip flop 5. Substrate potential can be quickly made to become a constant value by operating the second high-power circuit for substratebias generation in accordance with the initial state of the flip flop 5 when the power is turned on.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、基板バイアス発生回路をそなえた集積回路装
置に関する。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to an integrated circuit device equipped with a substrate bias generation circuit.

従来の技術 従来、LSI回路において、接合容量を減らす等の特性
を改善するため、基板バイアス発生回路を搭載すること
が多くある。しかし、近年、低消費電力化の要望が多い
中で、基板バイアス発生回路自身の消費電力を低減させ
ることが大きな課題となっている。従来、そのような性
能をもたせたものとして、能力の異なる二つの基板バイ
アス発生回路を有し、本体LSI回路の動作状態に応じ
て、前記二つの基板バイアス発生回路のうちの能力の大
きな一方を、制御回路により、オン、オフすることによ
り、消費電力を低減した基板バイアス発生回路がある。
2. Description of the Related Art Conventionally, LSI circuits are often equipped with a substrate bias generation circuit in order to improve characteristics such as reducing junction capacitance. However, in recent years, with the increasing demand for lower power consumption, reducing the power consumption of the substrate bias generation circuit itself has become a major issue. Conventionally, devices with such performance have had two substrate bias generation circuits with different capabilities, and depending on the operating state of the main LSI circuit, one of the two substrate bias generation circuits with the greater capability is selected. There is a substrate bias generation circuit that reduces power consumption by being turned on and off by a control circuit.

以下図面を参照しながら、上述した従来の基板バイアス
発生回路をダイナミックメモリに適用した例について説
明する。
An example in which the above-described conventional substrate bias generation circuit is applied to a dynamic memory will be described below with reference to the drawings.

第2図は、従来の基板バイアス発生回路の構成を示すブ
ロック図である。1は第一の基板バイアス発生回路、2
は第二の基板バイアス発生回路、3は制御回路、4は入
力端子であり、以下、その動作について説明する。
FIG. 2 is a block diagram showing the configuration of a conventional substrate bias generation circuit. 1 is a first substrate bias generation circuit; 2
3 is a second substrate bias generation circuit, 3 is a control circuit, and 4 is an input terminal.The operation thereof will be explained below.

まず、第一の基板バイアス発生回路1は制御回路3の動
作に無関係に動作する。第二の基板バイアス発生回路2
は、第一の基板バイアス回路1よりも能力の大きいもの
で、制御回路3により動作するか停止するかを制御され
る。制御回路3は入力端子4に加わる信号によりその動
作が決定される。ここでは、本体LSI回路がダイナミ
ックメモリとして、入力端子4の信号がそのダイナミッ
クメモリの動作状態を決める行番地活性信号(以下、R
AS信号と略し、RAS信号はその反転信号)に同期し
たものである例をのべる。入力信号<RAS信号は)が
ハイレベルの場合、すなわちダイナミックメモリがスタ
ンバイ状態である時、第二の基板バイアス発生回路2の
動作を停止させる。この時、第一の基板バイアス発生回
路1はスタンバイ状態で特性改善に必要な最小限の能力
を備えているものである。入力信号(RAS信号)がロ
ーレベルの場合、すなわち、ダイナミックメモリが動作
状態である時には、第二の基板バイアス発生回路2を動
作させて基板電位が浅くなるのを抑える。
First, the first substrate bias generation circuit 1 operates independently of the operation of the control circuit 3. Second substrate bias generation circuit 2
has a larger capacity than the first substrate bias circuit 1, and is controlled by the control circuit 3 to operate or stop. The operation of the control circuit 3 is determined by a signal applied to the input terminal 4. Here, the main body LSI circuit serves as a dynamic memory, and the signal at input terminal 4 is a row address activation signal (hereinafter referred to as R) that determines the operating state of the dynamic memory.
An example will be described in which the RAS signal is synchronized with the inverted signal (abbreviated as the AS signal). When the input signal <RAS signal) is at a high level, that is, when the dynamic memory is in a standby state, the operation of the second substrate bias generation circuit 2 is stopped. At this time, the first substrate bias generation circuit 1 is in a standby state and has the minimum capability necessary for improving the characteristics. When the input signal (RAS signal) is at a low level, that is, when the dynamic memory is in an operating state, the second substrate bias generation circuit 2 is operated to suppress the substrate potential from becoming shallow.

以上の動作により、この従来例のダイナミックメモリで
は、スタンバイ時に能力の大きな第二の基板バイアス発
生回路を停止させることにより、無駄な消費電流を抑え
ることが出来る。
With the above-described operation, in this conventional dynamic memory, by stopping the second substrate bias generation circuit having a large capacity during standby, it is possible to suppress wasteful current consumption.

発明が解決しようとする問題点 しかしながら上記のような構成では、電源投入 。The problem that the invention seeks to solve However, in the above configuration, when the power is turned on.

時に、入力端子4に加わる信号(RAS信号)がハイレ
ベルであると、第二の能力の大きな基板バイアス発生回
路2が停止しており、基板電位が一定値に達するまでの
時間が長くかかってしまう。
Sometimes, when the signal (RAS signal) applied to the input terminal 4 is at a high level, the second substrate bias generation circuit 2 with large capacity is stopped, and it takes a long time for the substrate potential to reach a certain value. Put it away.

すなわち、従来のLSI回路では、電源を投入してから
正常な動作状態になるまでの時間が長くかかってしまう
と言う問題点を有していた。
That is, the conventional LSI circuit has a problem in that it takes a long time from turning on the power until the circuit is in a normal operating state.

本発明は上記問題点に鑑み、電源投入時に入力端子4に
加わる信号(RAS信号)がハイレベルであっても、第
二の能力の大きな基板バイアス発生回路を動作させて素
早く基板電位を一定値にさせるものである。
In view of the above-mentioned problems, the present invention operates a second high-capacity substrate bias generation circuit to quickly maintain a constant substrate potential even if the signal (RAS signal) applied to the input terminal 4 when the power is turned on is at a high level. It is something that makes you.

問題点を解決するための手段 上記問題点を解決するために、本発明は、基板バイアス
発生回路およびその動作を制御するための制御回路に付
加して、電源投入時に、前記制御回路の動作を規制し得
るフリップフロップを設けたものである。
Means for Solving the Problems In order to solve the above problems, the present invention adds a method to a substrate bias generation circuit and a control circuit for controlling its operation, and controls the operation of the control circuit when the power is turned on. It is equipped with a flip-flop that can be regulated.

作用 本発明によって、電源投入時からフリップフロップにそ
の状態を変えるリセット信号が加わるまでの間、前記制
御回路の動作を抑え、能力の大きな基板バイアス発生回
路を動作させることにより、基板電位を素早く一定値に
することができる。
Effect of the Invention According to the present invention, the substrate potential can be quickly kept constant by suppressing the operation of the control circuit and operating the high-capacity substrate bias generation circuit from when the power is turned on until a reset signal is applied to change the state of the flip-flop. Can be a value.

実施例 以下、本発明の一実施例の基板バイアス発生回路を、ダ
イナミックメモリに応用した例で、図面を参照しながら
説明する。
Embodiment Hereinafter, an example in which a substrate bias generation circuit according to an embodiment of the present invention is applied to a dynamic memory will be explained with reference to the drawings.

第1図は本発明実施例基板バイアス発生回路の構成を示
すブロック図である。1は第一の基板バイアス発生回路
、2は能力の大きな第二の基板バイアス発生回路、3は
制御回路、4は入力端子で、これらは従来例と同じもの
である。5はフリップフロップ、6はリセット端子であ
る。この基板バイアス発生回路について、以下、その動
作について説明する。
FIG. 1 is a block diagram showing the structure of a substrate bias generation circuit according to an embodiment of the present invention. 1 is a first substrate bias generation circuit, 2 is a second substrate bias generation circuit with a large capacity, 3 is a control circuit, and 4 is an input terminal, which are the same as in the conventional example. 5 is a flip-flop, and 6 is a reset terminal. The operation of this substrate bias generation circuit will be described below.

まず、第一の基板バイアス発生回路1は制御回路3の動
作に無関係に動作する。第二の基板バイアス発生回路2
は制御回路3により動作するか停止するかを制御される
。制御回路3は、入力端子4に加わる信号によりその動
作が決定される。本実施例の場合、入力端子4に加えら
れた入力信号(RAS信号)がハイレベルの場合、すな
わち、ダイナミックメモリがスタンバイ状態である時、
制御回路3は、第二の基板バイアス発生回路2の動作を
停止させるように動作する。この時、第一の基板バイア
ス発生回路1はスタンバイ状、態で特性改善に必要な最
小限の能力を備えているものである。入力端子4への入
力信号(RAS信号)がローレベルの場合、すなわち、
ダイナミックメモリが動作状態である時には、制御回路
3は動作せず、第二の基板バイアス発生回路2が動作状
態になり、これによって、基板電位が浅くなるのを抑え
る。ここまでの動作は従来例と同じであるが、フリップ
フロップ5は、その初期状態を、制御回路3が動作しな
いように設計されているため、電源投入時には、フリッ
プフロップ5のリセット端子6にリセット信号が加わる
まで、能力の大きな第二の基板バイアス発生回路2は動
作することができる。したがって、本実施例によれば、
電源投入時においても、フリップフロップ5の初期状態
により、能力の大きな第二の基板バイアス発生回路を動
作させることができ、これによって、基板電位を素早く
一定値にすることができる。
First, the first substrate bias generation circuit 1 operates independently of the operation of the control circuit 3. Second substrate bias generation circuit 2
The control circuit 3 controls whether to operate or stop. The operation of the control circuit 3 is determined by a signal applied to the input terminal 4. In the case of this embodiment, when the input signal (RAS signal) applied to the input terminal 4 is at high level, that is, when the dynamic memory is in the standby state,
The control circuit 3 operates to stop the operation of the second substrate bias generation circuit 2. At this time, the first substrate bias generation circuit 1 is in a standby state and has the minimum capability necessary for improving the characteristics. When the input signal (RAS signal) to input terminal 4 is low level, that is,
When the dynamic memory is in the active state, the control circuit 3 is not in operation, and the second substrate bias generation circuit 2 is in the active state, thereby suppressing the substrate potential from becoming shallow. The operation up to this point is the same as the conventional example, but since the flip-flop 5 is designed so that the control circuit 3 does not operate in its initial state, it is reset to the reset terminal 6 of the flip-flop 5 when the power is turned on. The second substrate bias generation circuit 2 with greater capacity can operate until the signal is applied. Therefore, according to this embodiment,
Even when the power is turned on, the second substrate bias generation circuit with a large capacity can be operated depending on the initial state of the flip-flop 5, and thereby the substrate potential can be quickly brought to a constant value.

本実施例は2つの能力の異なる基板バイアス発生回路と
1つのフリップフロップを使用しLSI回路の状態はス
タンバイ時と動作時との2つの動作状態について述べた
が、一般的には、2つ以上の基板バイアス発生回路を使
用し、2つ以上の動作状態が存在するLSI回路に応用
し、効果的に消費電力を低減することができることはい
うまでもない。
This embodiment uses two substrate bias generation circuits with different capabilities and one flip-flop, and the LSI circuit has two operating states, standby and operating, but generally there are two or more states. It goes without saying that the substrate bias generation circuit of the present invention can be applied to an LSI circuit in which two or more operating states exist to effectively reduce power consumption.

発明の効果 以上のように本発明は能力の異なる2つの基板バイアス
発生回路と、前記2つの基板バイアス発生回路の内の能
力の大きな基板バイアス発生回路の動作を、本体LSI
回路の動作状態に応じて、制御する制御回路と、前記制
御回路の動作を抑えるフリップフロップとからなり、電
源投入時からリセット信号が加わるまでの間、フリップ
フロップの所定初期状態によって、前記制御回路の動作
を抑え、それとともに、能力の大きな基板バイアス発生
回路を動作させることにより、電源投入時に素早(基板
電位を一定値にすることができる。
Effects of the Invention As described above, the present invention has two substrate bias generating circuits with different capabilities, and the operation of the substrate bias generating circuit with the larger capability among the two substrate bias generating circuits can be performed on the main body LSI.
It consists of a control circuit that controls the circuit according to the operating state of the circuit, and a flip-flop that suppresses the operation of the control circuit. By suppressing this operation and at the same time operating a high-capacity substrate bias generation circuit, it is possible to quickly (substrate potential) to a constant value when the power is turned on.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の基板バイアス回路を示すブ
ロック図、第2図は従来例の構成を示すブロック図であ
る。 1.2・・・・・・第一、第二の基板バイアス発生回路
、3・・・・・・制御回路、4・・・・・・入力端子、
5・・・・・・フリップフロップ、6・・・・・・リセ
ット端子。
FIG. 1 is a block diagram showing a substrate bias circuit according to an embodiment of the present invention, and FIG. 2 is a block diagram showing the configuration of a conventional example. 1.2...First and second substrate bias generation circuits, 3...Control circuit, 4...Input terminal,
5...Flip-flop, 6...Reset terminal.

Claims (1)

【特許請求の範囲】[Claims]  基板バイアス発生回路と、前記基板バイアス発生回路
の動作を制御する制御回路と、電源投入時からリセット
信号が加わるまでの間、前記制御回路の動作を抑えるフ
リップフロップとをそなえたことを特徴とする集積回路
装置。
The device is characterized by comprising a substrate bias generation circuit, a control circuit that controls the operation of the substrate bias generation circuit, and a flip-flop that suppresses the operation of the control circuit from when the power is turned on until a reset signal is applied. Integrated circuit device.
JP61172076A 1986-07-22 1986-07-22 Integrated circuit device Pending JPS6328058A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61172076A JPS6328058A (en) 1986-07-22 1986-07-22 Integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61172076A JPS6328058A (en) 1986-07-22 1986-07-22 Integrated circuit device

Publications (1)

Publication Number Publication Date
JPS6328058A true JPS6328058A (en) 1988-02-05

Family

ID=15935094

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61172076A Pending JPS6328058A (en) 1986-07-22 1986-07-22 Integrated circuit device

Country Status (1)

Country Link
JP (1) JPS6328058A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0512861A (en) * 1991-07-04 1993-01-22 Mitsubishi Electric Corp Semiconductor memory device
US5469099A (en) * 1992-06-17 1995-11-21 Mitsubishi Denki Kabushiki Kaisha Power-on reset signal generator and operating method thereof

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS599729A (en) * 1982-07-07 1984-01-19 Mitsubishi Electric Corp Semiconductor device
JPS6195561A (en) * 1984-10-17 1986-05-14 Fujitsu Ltd Semiconductor integrated circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS599729A (en) * 1982-07-07 1984-01-19 Mitsubishi Electric Corp Semiconductor device
JPS6195561A (en) * 1984-10-17 1986-05-14 Fujitsu Ltd Semiconductor integrated circuit

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0512861A (en) * 1991-07-04 1993-01-22 Mitsubishi Electric Corp Semiconductor memory device
US5469099A (en) * 1992-06-17 1995-11-21 Mitsubishi Denki Kabushiki Kaisha Power-on reset signal generator and operating method thereof

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