JPS6350077U - - Google Patents
Info
- Publication number
- JPS6350077U JPS6350077U JP1987132360U JP13236087U JPS6350077U JP S6350077 U JPS6350077 U JP S6350077U JP 1987132360 U JP1987132360 U JP 1987132360U JP 13236087 U JP13236087 U JP 13236087U JP S6350077 U JPS6350077 U JP S6350077U
- Authority
- JP
- Japan
- Prior art keywords
- prober
- automatic
- points
- circuit
- scanner
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Description
第１図は従来例の説明図、第２図は本考案の実
施例の構成を示す説明図であり、図中、１はプリ
ント板、４はスキヤナ、５は試験機、７は回路、
８は接触点、１０はＣＰＵ、１１はプローバ駆動
テーブル、１２１〜１２３は自動プローバ、１３
１〜１３３は同リード線、１４はプローバ制御部
、１５はコネクタを示す。
FIG. 1 is an explanatory diagram of a conventional example, and FIG. 2 is an explanatory diagram showing the configuration of an embodiment of the present invention. In the figure, 1 is a printed board, 4 is a scanner, 5 is a testing machine, 7 is a circuit,
8 is a contact point, 10 is a CPU, 11 is a prober drive table, 12 1 to 12 3 are automatic probers, 13
1 to 13 3 are lead wires, 14 is a prober control unit, and 15 is a connector.
Claims (1)
査してインピーダンスを測定するインサーキツト
テスト装置において、 該プリント板上方に配線上の接触点に対し選択
的に位置が設定できる複数の自動プローバ１２を
有するプローバ駆動テーブル１１と、 測定時プリント板のテストの必要な箇所全てに
プローバ駆動テーブルの自動プローバを予め移動
させて接触させるプローバ制御部１４と、 プリント板のコネクタ端子を自動走査するスキ
ヤナ４と、 該スキヤナによつて組合わされた自動プローバ
とコネクタを用いて測定を行う試験機５を具備す
ることを特徴とするインサーキツトテスト装置。[Scope of Claim for Utility Model Registration] In an in-circuit test device that measures impedance by automatically scanning between the points to be measured on a printed circuit board under test 1, the circuit is selectively located above the printed board with respect to the contact points on the wiring. a prober drive table 11 having a plurality of automatic probers 12 that can be set; a prober control unit 14 that moves the automatic prober of the prober drive table in advance to contact all the points on the printed board that need to be tested during measurement; An in-circuit test device comprising a scanner 4 that automatically scans connector terminals, and a tester 5 that performs measurements using an automatic prober and connector combined by the scanner.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987132360U JPS6329261Y2 (en) | 1987-08-31 | 1987-08-31 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987132360U JPS6329261Y2 (en) | 1987-08-31 | 1987-08-31 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6350077U true JPS6350077U (en) | 1988-04-05 |
| JPS6329261Y2 JPS6329261Y2 (en) | 1988-08-05 |
Family
ID=31031674
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1987132360U Expired JPS6329261Y2 (en) | 1987-08-31 | 1987-08-31 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6329261Y2 (en) |
-
1987
- 1987-08-31 JP JP1987132360U patent/JPS6329261Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6329261Y2 (en) | 1988-08-05 |
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