JPS6351434U - - Google Patents

Info

Publication number
JPS6351434U
JPS6351434U JP14491886U JP14491886U JPS6351434U JP S6351434 U JPS6351434 U JP S6351434U JP 14491886 U JP14491886 U JP 14491886U JP 14491886 U JP14491886 U JP 14491886U JP S6351434 U JPS6351434 U JP S6351434U
Authority
JP
Japan
Prior art keywords
mark
pattern
semiconductor device
axis
alignment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14491886U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14491886U priority Critical patent/JPS6351434U/ja
Publication of JPS6351434U publication Critical patent/JPS6351434U/ja
Pending legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の実施例の位置合せマークの説
明図、第2図は基準マークが変化したときの説明
図、第3図は本考案の他の実施例、第4図は従来
例の位置合せマーク説明図である。 1,11……基準マーク、2,2′,3……位
置合せマーク、41……基準マーク、42……従
来の位置合せマーク。
Fig. 1 is an explanatory diagram of the alignment mark according to the embodiment of the present invention, Fig. 2 is an explanatory diagram when the reference mark changes, Fig. 3 is another embodiment of the present invention, and Fig. 4 is an illustration of the conventional example. FIG. 3 is an explanatory diagram of alignment marks. 1, 11... Reference mark, 2, 2', 3... Alignment mark, 41... Reference mark, 42... Conventional alignment mark.

Claims (1)

【実用新案登録請求の範囲】 (1) 十字形の第1マークと、この第1マークの
中心を通る軸に対して対称でこの軸に対する垂直
部分の大きさが中心側と外側の間で異なる部分を
有するパターンであつて、かつ第1マークと少く
とも2交点を持つ形状の第2マークを設けたこと
を特徴とする半導体装置用位置合せマーク。 (2) 上記第2マークは台形または三角形を4つ
集めた形状であることを特徴とする実用新案登録
請求の範囲第1項記載の半導体装置用位置合せマ
ーク。
[Claims for Utility Model Registration] (1) A cross-shaped first mark, which is symmetrical with respect to an axis passing through the center of the first mark, and the size of the portion perpendicular to this axis is different between the center side and the outside. What is claimed is: 1. An alignment mark for a semiconductor device, comprising a second mark having a pattern having a pattern and having at least two intersections with the first mark. (2) The alignment mark for a semiconductor device according to claim 1, wherein the second mark is in the shape of a trapezoid or a collection of four triangles.
JP14491886U 1986-09-20 1986-09-20 Pending JPS6351434U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14491886U JPS6351434U (en) 1986-09-20 1986-09-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14491886U JPS6351434U (en) 1986-09-20 1986-09-20

Publications (1)

Publication Number Publication Date
JPS6351434U true JPS6351434U (en) 1988-04-07

Family

ID=31055972

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14491886U Pending JPS6351434U (en) 1986-09-20 1986-09-20

Country Status (1)

Country Link
JP (1) JPS6351434U (en)

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