JPS6352046A - アイソト−プ蛍光ｘ線分析装置 - Google Patents

アイソト−プ蛍光ｘ線分析装置

Info

Publication number: JPS6352046A
Authority: JP; Japan
Prior art keywords: conical; hole; isotope; pedestal; shutter
Prior art date: 1986-06-17
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Pending

Application number

JP62148894A

Other languages

English (en)

Japanese (ja)

Inventor

ヤセン・スタメノフ・スタメノフ

ペユ・フリストフ・ペエフ

サチョ・アタナソフ・セボフ

ペトコ・イワノフ・ペトコフ

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

INSUCHI KUBETONA METARUAGIA

INSUCHI PO KUBETONA METARUAGIA

Original Assignee

INSUCHI KUBETONA METARUAGIA

INSUCHI PO KUBETONA METARUAGIA

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1986-06-17

Filing date

1987-06-15

Publication date

1988-03-05

1987-06-15 Application filed by INSUCHI KUBETONA METARUAGIA, INSUCHI PO KUBETONA METARUAGIA filed Critical INSUCHI KUBETONA METARUAGIA

1988-03-05 Publication of JPS6352046A publication Critical patent/JPS6352046A/ja

Status Pending legal-status Critical Current

Links

230000005284 excitation Effects 0.000 claims description 28
230000001681 protective effect Effects 0.000 claims description 20
NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 15
238000004458 analytical method Methods 0.000 claims description 11
238000004876 x-ray fluorescence Methods 0.000 claims description 9
230000000155 isotopic effect Effects 0.000 claims description 5
238000011835 investigation Methods 0.000 claims description 4
230000002093 peripheral effect Effects 0.000 claims 1
230000005855 radiation Effects 0.000 description 5
238000005259 measurement Methods 0.000 description 3
229910052729 chemical element Inorganic materials 0.000 description 2
238000000921 elemental analysis Methods 0.000 description 2
XEEYBQQBJWHFJM-BJUDXGSMSA-N Iron-55 Chemical compound [55Fe] XEEYBQQBJWHFJM-BJUDXGSMSA-N 0.000 description 1
238000002441 X-ray diffraction Methods 0.000 description 1
LXQXZNRPTYVCNG-YPZZEJLDSA-N americium-241 Chemical compound [241Am] LXQXZNRPTYVCNG-YPZZEJLDSA-N 0.000 description 1
BDOSMKKIYDKNTQ-OIOBTWANSA-N cadmium-109 Chemical compound [109Cd] BDOSMKKIYDKNTQ-OIOBTWANSA-N 0.000 description 1
235000009508 confectionery Nutrition 0.000 description 1
239000007789 gas Substances 0.000 description 1
239000001307 helium Substances 0.000 description 1
229910052734 helium Inorganic materials 0.000 description 1
SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
239000011261 inert gas Substances 0.000 description 1
239000007788 liquid Substances 0.000 description 1
239000000463 material Substances 0.000 description 1
238000000034 method Methods 0.000 description 1
239000000203 mixture Substances 0.000 description 1
239000000843 powder Substances 0.000 description 1
239000004065 semiconductor Substances 0.000 description 1
239000007787 solid Substances 0.000 description 1

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence

Landscapes

Physics & Mathematics (AREA)
Health & Medical Sciences (AREA)
Life Sciences & Earth Sciences (AREA)
Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Biochemistry (AREA)
General Health & Medical Sciences (AREA)
General Physics & Mathematics (AREA)
Immunology (AREA)
Pathology (AREA)
Analysing Materials By The Use Of Radiation (AREA)
Measurement Of Radiation (AREA)

JP62148894A 1986-06-17 1987-06-15 アイソト−プ蛍光ｘ線分析装置 Pending JPS6352046A (ja)

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
BG8675382A BG44997A1 (2)	1986-06-17	1986-06-17
BG75382		1986-06-17

Publications (1)

Publication Number	Publication Date
JPS6352046A true JPS6352046A (ja)	1988-03-05

Family

ID=3917411

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP62148894A Pending JPS6352046A (ja)	1986-06-17	1987-06-15	アイソト−プ蛍光ｘ線分析装置

Country Status (8)

Country	Link
JP (1)	JPS6352046A (2)
AU (1)	AU595615B2 (2)
BG (1)	BG44997A1 (2)
DD (1)	DD283532A7 (2)
DE (1)	DE3718764A1 (2)
FI (1)	FI871633A7 (2)
FR (1)	FR2600165B1 (2)
GB (1)	GB2192277B (2)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US1385784A (en) *	1919-06-25	1921-07-26	Chalmers G Hall	Drift-compensating device for airships
US3511989A (en) *	1967-02-21	1970-05-12	Solomon Lazarevich Yakubovich	Device for x-ray radiometric determination of elements in test specimens
US3889113A (en) *	1973-05-03	1975-06-10	Columbia Scient Ind Inc	Radioisotope-excited, energy-dispersive x-ray fluorescence apparatus
US4063089A (en) *	1976-11-24	1977-12-13	The United States Of America As Represented By The United States Energy Research And Development Administration	X-ray chemical analyzer for field applications
CA1132262A (en) *	1979-10-26	1982-09-21	Archibald H.C.P. Gillieson	Method and apparatus for evaluating notes

1986
- 1986-06-17 BG BG8675382A patent/BG44997A1/xx unknown
1987
- 1987-04-14 FI FI871633A patent/FI871633A7/fi not_active IP Right Cessation
- 1987-05-25 FR FR878707324A patent/FR2600165B1/fr not_active Expired - Fee Related
- 1987-06-02 DD DD87303438A patent/DD283532A7/de not_active IP Right Cessation
- 1987-06-04 DE DE19873718764 patent/DE3718764A1/de not_active Withdrawn
- 1987-06-12 AU AU74157/87A patent/AU595615B2/en not_active Ceased
- 1987-06-15 JP JP62148894A patent/JPS6352046A/ja active Pending
- 1987-06-17 GB GB8714194A patent/GB2192277B/en not_active Expired - Fee Related

Also Published As

Publication number	Publication date
FI871633A0 (fi)	1987-04-14
GB2192277B (en)	1990-01-31
FR2600165A1 (fr)	1987-12-18
AU595615B2 (en)	1990-04-05
FI871633A7 (fi)	1989-04-13
DE3718764A1 (de)	1987-12-23
DD283532A7 (de)	1990-10-17
BG44997A1 (2)	1989-03-15
AU7415787A (en)	1987-12-24
FR2600165B1 (fr)	1990-08-03
GB2192277A (en)	1988-01-06
GB8714194D0 (en)	1987-07-22

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