JPS6354076U - - Google Patents
Info
- Publication number
- JPS6354076U JPS6354076U JP14835086U JP14835086U JPS6354076U JP S6354076 U JPS6354076 U JP S6354076U JP 14835086 U JP14835086 U JP 14835086U JP 14835086 U JP14835086 U JP 14835086U JP S6354076 U JPS6354076 U JP S6354076U
- Authority
- JP
- Japan
- Prior art keywords
- test
- under test
- series
- tester
- value generating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
Description
第１図は本考案実施例の構成を示すブロツク構
成図。第２図は本考案実施例の動作を示すシーケ
ンス図。
１…試験値発生手段、２…接続手段、３…スケ
ジユーラ、４…測定結果表示手段、２１ａ〜２３
ａ…スイツチ、２１ｂ〜２３ｂ…操作コイル、３
１…プログラム手段、３２…開閉指令手段、３３
…進捗状態登録手段、３４…制御手段。
FIG. 1 is a block configuration diagram showing the configuration of an embodiment of the present invention. FIG. 2 is a sequence diagram showing the operation of the embodiment of the present invention. 1... Test value generation means, 2... Connection means, 3... Scheduler, 4... Measurement result display means, 21a to 23
a...Switch, 21b-23b...Operation coil, 3
1...Programming means, 32...Opening/closing command means, 33
...Progress status registration means, 34...Control means.
Claims (1)
よび切離する接続手段と を備えた試験器において、 一連の試験が実行されているひとつの被試験器
にかかわる接続手段が開路状態である期間を含む
期間にわたり他の被試験器を上記試験値発生手段
に接続するスケジユーラ手段 を備えたことを特徴とする試験器。[Scope of Claim for Utility Model Registration] A series of tests in a tester equipped with a test value generating means for generating a series of test conditions and a connecting means for connecting and disconnecting each of a plurality of devices under test to this means. A tester comprising scheduler means for connecting other devices under test to the test value generating means over a period including a period in which the connection means related to one device under test is in an open state. .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14835086U JPS6354076U (en) | 1986-09-26 | 1986-09-26 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14835086U JPS6354076U (en) | 1986-09-26 | 1986-09-26 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6354076U true JPS6354076U (en) | 1988-04-11 |
Family
ID=31062535
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14835086U Pending JPS6354076U (en) | 1986-09-26 | 1986-09-26 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6354076U (en) |
-
1986
- 1986-09-26 JP JP14835086U patent/JPS6354076U/ja active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS6447148U (en) | ||
| JPH0216076U (en) | ||
| JPH01152216U (en) | ||
| JPS6399278U (en) | ||
| SU1116452A1 (en) | Device for demonstrating model strain | |
| JPS63152571U (en) | ||
| JPS63165549U (en) | ||
| JPH0410598U (en) | ||
| JPH02675U (en) | ||
| JPS6291588U (en) | ||
| JPS61197572U (en) | ||
| JPH0414441U (en) | ||
| JPH02126451U (en) | ||
| JPS5970249U (en) | signal test equipment | |
| JPS6019978U (en) | Pin access circuit for package testing machine | |
| JPH02128969U (en) | ||
| JPS6325354U (en) | ||
| JPS5929776U (en) | Noise test equipment | |
| JPS642173U (en) | ||
| JPH01126647U (en) | ||
| JPS5859284U (en) | Abnormality detection device for remote monitoring and control equipment | |
| JPS593537U (en) | Semiconductor device inspection equipment probe card | |
| JPS6361046U (en) | ||
| JPS60141027U (en) | signal switching device | |
| JPS62135972U (en) |