JPS6371659A - 検針ユニツト - Google Patents
検針ユニツトInfo
- Publication number
- JPS6371659A JPS6371659A JP61216634A JP21663486A JPS6371659A JP S6371659 A JPS6371659 A JP S6371659A JP 61216634 A JP61216634 A JP 61216634A JP 21663486 A JP21663486 A JP 21663486A JP S6371659 A JPS6371659 A JP S6371659A
- Authority
- JP
- Japan
- Prior art keywords
- inspecting
- stylus
- holders
- holder
- insulating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61216634A JPS6371659A (ja) | 1986-09-12 | 1986-09-12 | 検針ユニツト |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61216634A JPS6371659A (ja) | 1986-09-12 | 1986-09-12 | 検針ユニツト |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6371659A true JPS6371659A (ja) | 1988-04-01 |
| JPH0516747B2 JPH0516747B2 (2) | 1993-03-05 |
Family
ID=16691508
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61216634A Granted JPS6371659A (ja) | 1986-09-12 | 1986-09-12 | 検針ユニツト |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6371659A (2) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6144212A (en) * | 1997-10-21 | 2000-11-07 | Mitsubishi Denki Kabushiki Kaisha | Vertical needle type probe card, method of manufacturing thereof, method of replacing defective probe needle and test method of wafer using the probe card |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS547816U (2) * | 1977-06-18 | 1979-01-19 |
-
1986
- 1986-09-12 JP JP61216634A patent/JPS6371659A/ja active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS547816U (2) * | 1977-06-18 | 1979-01-19 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6144212A (en) * | 1997-10-21 | 2000-11-07 | Mitsubishi Denki Kabushiki Kaisha | Vertical needle type probe card, method of manufacturing thereof, method of replacing defective probe needle and test method of wafer using the probe card |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0516747B2 (2) | 1993-03-05 |
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