JPS637903Y2 - - Google Patents
Info
- Publication number
- JPS637903Y2 JPS637903Y2 JP2496382U JP2496382U JPS637903Y2 JP S637903 Y2 JPS637903 Y2 JP S637903Y2 JP 2496382 U JP2496382 U JP 2496382U JP 2496382 U JP2496382 U JP 2496382U JP S637903 Y2 JPS637903 Y2 JP S637903Y2
- Authority
- JP
- Japan
- Prior art keywords
- measurement
- emitter
- base
- terminal
- guard electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005259 measurement Methods 0.000 description 39
- 238000010586 diagram Methods 0.000 description 5
- 238000009413 insulation Methods 0.000 description 4
- 239000000523 sample Substances 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 239000003822 epoxy resin Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 2
- 229920000647 polyepoxide Polymers 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 239000011800 void material Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2496382U JPS58127369U (ja) | 1982-02-24 | 1982-02-24 | Ｐｎｐトランジスタ用測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2496382U JPS58127369U (ja) | 1982-02-24 | 1982-02-24 | Ｐｎｐトランジスタ用測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58127369U JPS58127369U (ja) | 1983-08-29 |
| JPS637903Y2 true JPS637903Y2 (de) | 1988-03-08 |
Family
ID=30036939
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2496382U Granted JPS58127369U (ja) | 1982-02-24 | 1982-02-24 | Ｐｎｐトランジスタ用測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58127369U (de) |
-
1982
- 1982-02-24 JP JP2496382U patent/JPS58127369U/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS58127369U (ja) | 1983-08-29 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US3828256A (en) | Self contained test probe employing high input impedance | |
| US4884026A (en) | Electrical characteristic measuring apparatus | |
| US4587481A (en) | Arrangement for testing micro interconnections and a method for operating the same | |
| JPH06160457A (ja) | 回路板試験装置 | |
| JPH01165968A (ja) | ウエハプロービング装置 | |
| JPH0690243B2 (ja) | テストピースの抵抗を測定する回路 | |
| JPS637903Y2 (de) | ||
| JP2858390B2 (ja) | 縦型半導体装置の特性測定方法 | |
| US4683422A (en) | Low voltage continuity tester | |
| JP3238135B2 (ja) | 電池式電圧測定装置のための自動電源ターンオン回路 | |
| CN110895290A (zh) | 一种适用于ate测试的皮安级小电流测试电路 | |
| JP2847309B2 (ja) | プローブ装置 | |
| JPS58101434A (ja) | プロ−ブカ−ド | |
| CN102279290B (zh) | 一种测试机台吸盘 | |
| JP3076245B2 (ja) | 検査ピンおよび検査装置 | |
| JP3227207B2 (ja) | 半導体装置およびその測定方法 | |
| JPH0217342Y2 (de) | ||
| JP2526212Y2 (ja) | Ｉｃソケット | |
| JP3201611B2 (ja) | フォールト作動デバイス用プローブ | |
| JPS5942707Y2 (ja) | ハンドリング装置の電極子 | |
| JPH0543479Y2 (de) | ||
| KR20010110157A (ko) | 모니터용 저항 소자 및 저항 소자의 상대적 정밀도의 측정방법 | |
| JPS6135701B2 (de) | ||
| JPS61280580A (ja) | ハンドリング装置の電極子 | |
| JPH02166746A (ja) | 測定装置 |