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National Institute of Advanced Industrial Science and Technology
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Agency of Industrial Science and Technology
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Application filed by Agency of Industrial Science and TechnologyfiledCriticalAgency of Industrial Science and Technology
Priority to JP57215916ApriorityCriticalpatent/JPS59105441A/ja
Publication of JPS59105441ApublicationCriticalpatent/JPS59105441A/ja
Publication of JPS6410219B2publicationCriticalpatent/JPS6410219B2/ja
Method and apparatus for using film density measurements of a radiograph to monitor the reproducibility of X-ray exposure parameters of a mammography unit