JPS6420431A - Method and device for measuring fine particles - Google Patents

Method and device for measuring fine particles

Info

Publication number
JPS6420431A
JPS6420431A JP63083659A JP8365988A JPS6420431A JP S6420431 A JPS6420431 A JP S6420431A JP 63083659 A JP63083659 A JP 63083659A JP 8365988 A JP8365988 A JP 8365988A JP S6420431 A JPS6420431 A JP S6420431A
Authority
JP
Japan
Prior art keywords
flow direction
deflected
beams
range
parallel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63083659A
Other languages
Japanese (ja)
Inventor
Keiji Ashida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Chemical Co Ltd
Original Assignee
Sumitomo Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Chemical Co Ltd filed Critical Sumitomo Chemical Co Ltd
Priority to JP63083659A priority Critical patent/JPS6420431A/en
Priority to US07/185,135 priority patent/US4906094A/en
Publication of JPS6420431A publication Critical patent/JPS6420431A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02Investigating particle size or size distribution
    • G01N15/0205Investigating particle size or size distribution by optical means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03Cuvette constructions
    • G01N21/05Flow-through cuvettes
    • G01N2021/058Flat flow cell

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To measure the diameter of a particle with high accuracy by a simple optical system, by forming two parallel beams which are deflected a little in the direction intersecting orthogonally with the flow direction of a sample and the direction of a laser beam. CONSTITUTION:Plural parallel beams 2a, 2b are deflected each other in the direction intersecting orthogonally with the flow direction and the direction of a laser beam within a range in which beam spots are overlapped to each other in the flow direction of a sample fluid, and also, deflected by a prescribed distance in the flow direction, by allowing the laser beams whose intensity becomes higher gradually from the peripheral part to the inside in the peripheral part and in the vicinity of its inside, to have a prescribed intensity distribution, respectively. Among scattered light beams generated due to a fact that a fine particle crosses the parallel means, at least two scattered light beams generated continuously due to a fact that the same fine particle crosses successively are detected, based on the relation of a know flow velocity of the sample fluid and the interval of the parallel beams. From a ratio of a detected output value, a detection range is selected, and based on the detected output value within the range, the diameter of the particle is measured.
JP63083659A 1987-04-23 1988-04-05 Method and device for measuring fine particles Pending JPS6420431A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP63083659A JPS6420431A (en) 1987-04-23 1988-04-05 Method and device for measuring fine particles
US07/185,135 US4906094A (en) 1987-04-23 1988-04-22 Fine particle measuring method and system and a flow cell for use in the system

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP10101387 1987-04-23
JP63083659A JPS6420431A (en) 1987-04-23 1988-04-05 Method and device for measuring fine particles

Publications (1)

Publication Number Publication Date
JPS6420431A true JPS6420431A (en) 1989-01-24

Family

ID=26424693

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63083659A Pending JPS6420431A (en) 1987-04-23 1988-04-05 Method and device for measuring fine particles

Country Status (1)

Country Link
JP (1) JPS6420431A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0889318A1 (en) * 1997-07-02 1999-01-07 Palas GmbH Partikel-und Lasermesstechnik Process and device for testing aerosol particle size distribution
JP2008527366A (en) * 2005-01-14 2008-07-24 ユニデータ ヨーロッパ リミテッド Particulate matter detector
WO2016076037A1 (en) * 2014-11-14 2016-05-19 ソニー株式会社 Particle analysis device and particle analysis method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0889318A1 (en) * 1997-07-02 1999-01-07 Palas GmbH Partikel-und Lasermesstechnik Process and device for testing aerosol particle size distribution
JP2008527366A (en) * 2005-01-14 2008-07-24 ユニデータ ヨーロッパ リミテッド Particulate matter detector
WO2016076037A1 (en) * 2014-11-14 2016-05-19 ソニー株式会社 Particle analysis device and particle analysis method

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