JPS6420824A - Subjective refraction device - Google Patents

Subjective refraction device

Info

Publication number
JPS6420824A
JPS6420824A JP62179725A JP17972587A JPS6420824A JP S6420824 A JPS6420824 A JP S6420824A JP 62179725 A JP62179725 A JP 62179725A JP 17972587 A JP17972587 A JP 17972587A JP S6420824 A JPS6420824 A JP S6420824A
Authority
JP
Japan
Prior art keywords
disk
prisms
spherical lens
prism
measuring optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62179725A
Other languages
Japanese (ja)
Other versions
JP2585611B2 (en
Inventor
Akihiro Hayashi
Yoshikuni Hosoi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidek Co Ltd
Original Assignee
Nidek Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nidek Co Ltd filed Critical Nidek Co Ltd
Priority to JP62179725A priority Critical patent/JP2585611B2/en
Publication of JPS6420824A publication Critical patent/JPS6420824A/en
Application granted granted Critical
Publication of JP2585611B2 publication Critical patent/JP2585611B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Eye Examination Apparatus (AREA)

Abstract

PURPOSE:To make a prism measuring optical system detachable, by such a simple mechanism that a pair of prisms are arranged on a rotary disk. CONSTITUTION:An auxiliary lens disk 4A, a strong spherical lens disk 5 and a weak spherical lens disk 6 are arranged to a shaft 3 being the center of rotation and a plurality of auxiliary lenses 7, a strong spherical lens 8 and a weak spherical lens 9 are arranged on the same circumference of a circle of each of the disk. A positive astigmatism lens disk 12 and a negative astigmatism lens disk 13 are provided to a measuring optical shaft 1 being the center of rotation in a rotatable manner and astigmatism lenses 14, 5 are arranged to each of the disks. Prisms 18, 19 are arranged on prism disk 20, 21 rotatable around the measuring optical shaft 1 and prism refractive forces are continuously changed by the relative change of both prisms in the rotary direction.
JP62179725A 1987-07-16 1987-07-16 Subjective optometry device Expired - Lifetime JP2585611B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62179725A JP2585611B2 (en) 1987-07-16 1987-07-16 Subjective optometry device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62179725A JP2585611B2 (en) 1987-07-16 1987-07-16 Subjective optometry device

Publications (2)

Publication Number Publication Date
JPS6420824A true JPS6420824A (en) 1989-01-24
JP2585611B2 JP2585611B2 (en) 1997-02-26

Family

ID=16070780

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62179725A Expired - Lifetime JP2585611B2 (en) 1987-07-16 1987-07-16 Subjective optometry device

Country Status (1)

Country Link
JP (1) JP2585611B2 (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0277229A (en) * 1988-09-13 1990-03-16 Topcon Corp subjective ophthalmoscope
EP1308123A3 (en) * 2001-10-31 2004-02-04 Nidek Co., Ltd. Optometric apparatus
JP2004229999A (en) * 2003-01-31 2004-08-19 Nidek Co Ltd Optometry device
JP2006129949A (en) * 2004-11-02 2006-05-25 Nidek Co Ltd Optometer
JP2007061529A (en) * 2005-09-02 2007-03-15 Nidek Co Ltd Optometry equipment
WO2007125955A1 (en) 2006-04-28 2007-11-08 Nidek Co., Ltd. Vision testing system
JP2008272101A (en) * 2007-04-26 2008-11-13 Topcon Corp A subjective optometry device

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5819223A (en) * 1981-07-22 1983-02-04 ボ−シユ・アンド・ロム・インコ−パレイテイド Ophthalmic metering instrument
JPS5944237A (en) * 1982-09-03 1984-03-12 株式会社ニコン Self-feeling eye inspecting apparatus
JPS60193436A (en) * 1984-03-16 1985-10-01 株式会社トプコン vision testing device
JPS61139747A (en) * 1984-12-12 1986-06-27 Canon Inc Particle analysis device
JPS62175238A (en) * 1986-01-28 1987-07-31 Mitsubishi Electric Corp Onboard type sound source approach informing device

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5819223A (en) * 1981-07-22 1983-02-04 ボ−シユ・アンド・ロム・インコ−パレイテイド Ophthalmic metering instrument
US4500180A (en) * 1981-07-22 1985-02-19 Bausch & Lomb Incorporated Motorized refraction apparatus
JPS5944237A (en) * 1982-09-03 1984-03-12 株式会社ニコン Self-feeling eye inspecting apparatus
JPS60193436A (en) * 1984-03-16 1985-10-01 株式会社トプコン vision testing device
JPS61139747A (en) * 1984-12-12 1986-06-27 Canon Inc Particle analysis device
JPS62175238A (en) * 1986-01-28 1987-07-31 Mitsubishi Electric Corp Onboard type sound source approach informing device

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0277229A (en) * 1988-09-13 1990-03-16 Topcon Corp subjective ophthalmoscope
EP1308123A3 (en) * 2001-10-31 2004-02-04 Nidek Co., Ltd. Optometric apparatus
JP2004229999A (en) * 2003-01-31 2004-08-19 Nidek Co Ltd Optometry device
JP2006129949A (en) * 2004-11-02 2006-05-25 Nidek Co Ltd Optometer
JP2007061529A (en) * 2005-09-02 2007-03-15 Nidek Co Ltd Optometry equipment
EP1920710A4 (en) * 2005-09-02 2009-07-01 Nidek Kk VIEW CONTROL APPARATUS
WO2007125955A1 (en) 2006-04-28 2007-11-08 Nidek Co., Ltd. Vision testing system
EP2005878A4 (en) * 2006-04-28 2009-04-22 Nidek Kk VISUAL EXAMINATION SYSTEM
JP2008272101A (en) * 2007-04-26 2008-11-13 Topcon Corp A subjective optometry device

Also Published As

Publication number Publication date
JP2585611B2 (en) 1997-02-26

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