JPS642155U

JPS642155U -

Info

Publication number: JPS642155U
Application number: JP9643887U
Authority: JP
Priority date: 1987-06-23
Filing date: 1987-06-23
Publication date: 1989-01-09

Description

[Brief explanation of the drawing]

第１図は本考案形材探傷用探触子追従機構の一
実施例の構成を示す側面図、第２図は従来の形材
探傷用探触子追従装置の一例を示す斜視図である
。２……フレーム、４……エアシリンダ、６……
ロツド、８ａ，８ｂ……アーム、１０……連結棒
、１２……球面座軸受、１４……探触子保持部、
１６……ローラ、１８……探触子、２０……被検
材倣い機構、２２……支軸、２４……倣いローラ
、２４……フレーム保持部、２６……加圧シリン
ダ、２８……ピストン、４０……連結部材、５０
……昇降機構、５２……昇降棹、５４……モータ
、５６……運動変換機構、５８……駆動回路、５
９……光電スイツチ、６０……速度信号形成手段
。 FIG. 1 is a side view showing the structure of an embodiment of the probe tracking mechanism for flaw detection of a shaped material according to the present invention, and FIG. 2 is a perspective view showing an example of a conventional probe tracking device for flaw detection of a shaped material. 2... Frame, 4... Air cylinder, 6...
Rod, 8a, 8b... Arm, 10... Connecting rod, 12... Spherical seat bearing, 14... Probe holding part,
16... Roller, 18... Probe, 20... Test material copying mechanism, 22... Support shaft, 24... Copying roller, 24... Frame holding section, 26... Pressure cylinder, 28... Piston, 40... Connection member, 50
...Lifting mechanism, 52... Lifting pole, 54... Motor, 56... Movement conversion mechanism, 58... Drive circuit, 5
9...Photoelectric switch, 60...Speed signal forming means.

Claims

[Scope of Claim for Utility Model Registration] (1) A structure in which the probe holder is lowered by an elevating mechanism in accordance with the approach of the material to be inspected, and the probe holder follows the surface of the material to be inspected for flaw detection. In the probe tracking mechanism for material flaw detection, a test material copying mechanism equipped with a copying roller is arranged on the test material entry side near the probe holding section, and the test material tracing mechanism is provided with a copying roller. The probe holding section is connected to the copying mechanism so that it moves in conjunction with the sample copying mechanism, and a speed signal for controlling the descending speed of the probe holding section of the lifting mechanism is transmitted to the copying roller. A probe for detecting flaws in a shaped material, characterized in that a speed signal forming means for detecting and forming a rotational speed is arranged, and the probe is lowered in accordance with the conveyance speed of the test material in the probe holding part. Following mechanism. (2) A shape material flaw detection probe according to claim 1, wherein the speed signal forming means includes a pulse generator that generates pulses in proportion to the number of rotations of the copying roller. Following mechanism.