JPS6425018A - Measuring device of temperature - Google Patents

Measuring device of temperature

Info

Publication number
JPS6425018A
JPS6425018A JP18095587A JP18095587A JPS6425018A JP S6425018 A JPS6425018 A JP S6425018A JP 18095587 A JP18095587 A JP 18095587A JP 18095587 A JP18095587 A JP 18095587A JP S6425018 A JPS6425018 A JP S6425018A
Authority
JP
Japan
Prior art keywords
shield
magnetic field
sensor
temperature
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18095587A
Other languages
Japanese (ja)
Other versions
JPH0682075B2 (en
Inventor
Shunji Yamamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP18095587A priority Critical patent/JPH0682075B2/en
Publication of JPS6425018A publication Critical patent/JPS6425018A/en
Publication of JPH0682075B2 publication Critical patent/JPH0682075B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Measuring Magnetic Variables (AREA)

Abstract

PURPOSE:To enable the accurate measurement of temperature even in a magnetic field and to enable the specification of limits of measurement, by enclosing a sensor with a magnetic shield formed of an oxide superconductor and by providing a one-turn coil therefor. CONSTITUTION:A magnetic shield 21 formed of a cylindrical oxide superconductor is so provided as to enclose a sensor 10 for which a germanium resistor is used, and a one-turn coil 22 is provided inside the shield. When an external magnetic field 23 is applied to the loop of the shield 21 whose temperature is lower than a critical temperature, a shielding current for the shield 21 flows, a magnetic field inside the loop turns to be zero, and the sensor 10 can execute precise measurement of temperature in the environment wherein the magnetic field is never imparted. When the magnetic field 23 turns strong and reaches a certain value, on the other hand, the superconducting state of the superconductor is broken down and it transfers to normal conduction. Thereby the shielding current in the shield 21 is eliminated, a magnetic flux invades into the loop of the shield 21, and the sensor 10 is exposed to the magnetic field. Accordingly, a voltage is generated in the one-turn coil 22 according to a prescribed formula, and the precise limits of measurement of the sensor can be determined by observing said voltage.
JP18095587A 1987-07-22 1987-07-22 Temperature measuring device Expired - Fee Related JPH0682075B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18095587A JPH0682075B2 (en) 1987-07-22 1987-07-22 Temperature measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18095587A JPH0682075B2 (en) 1987-07-22 1987-07-22 Temperature measuring device

Publications (2)

Publication Number Publication Date
JPS6425018A true JPS6425018A (en) 1989-01-27
JPH0682075B2 JPH0682075B2 (en) 1994-10-19

Family

ID=16092197

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18095587A Expired - Fee Related JPH0682075B2 (en) 1987-07-22 1987-07-22 Temperature measuring device

Country Status (1)

Country Link
JP (1) JPH0682075B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03146496A (en) * 1989-10-31 1991-06-21 Shinetsu Sekiei Kk Silica glass crucible for pulling silicon single crystal and method for inspecting the same
EP0467391A3 (en) * 1990-07-20 1992-03-18 Tokyo Electron Limited Plasma apparatus, and method and system for extracting electrical signal of member to which high-frequency-wave is applied
US5202820A (en) * 1991-12-16 1993-04-13 Ford Motor Company Saturable inductor protection circuit for inductive load driver
JPH08283092A (en) * 1995-12-18 1996-10-29 Shinetsu Quartz Prod Co Ltd Inspection method of silica glass crucible for pulling silicon single crystal
CN104215355A (en) * 2014-09-04 2014-12-17 中国科学院电工研究所 System of online temperature monitoring for high-temperature superconducting tape

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6939841B2 (en) 2019-04-22 2021-09-22 ダイキン工業株式会社 Air conditioning system

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03146496A (en) * 1989-10-31 1991-06-21 Shinetsu Sekiei Kk Silica glass crucible for pulling silicon single crystal and method for inspecting the same
EP0467391A3 (en) * 1990-07-20 1992-03-18 Tokyo Electron Limited Plasma apparatus, and method and system for extracting electrical signal of member to which high-frequency-wave is applied
US5147497A (en) * 1990-07-20 1992-09-15 Tokyo Electron Limited Plasma apparatus, and method and system for extracting electrical signal of member to which high-frequency wave is applied
US5202820A (en) * 1991-12-16 1993-04-13 Ford Motor Company Saturable inductor protection circuit for inductive load driver
JPH08283092A (en) * 1995-12-18 1996-10-29 Shinetsu Quartz Prod Co Ltd Inspection method of silica glass crucible for pulling silicon single crystal
CN104215355A (en) * 2014-09-04 2014-12-17 中国科学院电工研究所 System of online temperature monitoring for high-temperature superconducting tape

Also Published As

Publication number Publication date
JPH0682075B2 (en) 1994-10-19

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees