JPS6430272A - Thin film transistor - Google Patents
Thin film transistorInfo
- Publication number
- JPS6430272A JPS6430272A JP62186830A JP18683087A JPS6430272A JP S6430272 A JPS6430272 A JP S6430272A JP 62186830 A JP62186830 A JP 62186830A JP 18683087 A JP18683087 A JP 18683087A JP S6430272 A JPS6430272 A JP S6430272A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- film
- transparent conductor
- metal
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
Landscapes
- Liquid Crystal (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Thin Film Transistor (AREA)
Abstract
PURPOSE:To simplify a manufacturing process by a method wherein a gate electrode or source and drain electrodes provided on the side of a picture element electrode directly above a substrate is (are) composed of a double-layer structure (double-layer structures) of a transparent conductor layer and a metal layer (transparent conductor layers and metal layers). CONSTITUTION:A transparent conductor layer 12 is formed over the whole surface of a transparent substrate 1 and a metal layer 13 is formed on it. Then the transparent conductor layer 12 and the metal layer 13 are etched and patterned into the forms of a picture element electrode 3 and a gate electrode 2. Then a silicon nitride layer to be a gate insulating film 4 and an amorphous silicon hydride layer to be a semiconductor layer 5 are successively formed over the whole surface and further a phosphorus-doped amorphous silicon hydride layer to be an n<+>type layer 6 is formed and those layers are etched to be patterned and, at the same time, to form a contact hole 9. Then an aluminum layer to be a source electrode 7 and a drain electrode 8 is formed and then the metal film 13, the silicon nitride film, the amorphous silicon hydride film and the like are removed by etching and a passivation film 10 and a light shield 11 are formed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62186830A JPS6430272A (en) | 1987-07-27 | 1987-07-27 | Thin film transistor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62186830A JPS6430272A (en) | 1987-07-27 | 1987-07-27 | Thin film transistor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6430272A true JPS6430272A (en) | 1989-02-01 |
Family
ID=16195360
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62186830A Pending JPS6430272A (en) | 1987-07-27 | 1987-07-27 | Thin film transistor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6430272A (en) |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04190330A (en) * | 1990-11-26 | 1992-07-08 | Semiconductor Energy Lab Co Ltd | Driving method for display device |
| US5905555A (en) * | 1990-11-26 | 1999-05-18 | Semiconductor Energy Laboratory Co., Ltd. | Active matrix type electro-optical device having leveling film |
| US5956105A (en) * | 1991-06-14 | 1999-09-21 | Semiconductor Energy Laboratory Co., Ltd. | Electro-optical device and method of driving the same |
| US6004831A (en) * | 1991-09-25 | 1999-12-21 | Semiconductor Energy Laboratory Co., Ltd. | Method for fabricating a thin film semiconductor device |
| US6013928A (en) * | 1991-08-23 | 2000-01-11 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device having interlayer insulating film and method for forming the same |
| US6195139B1 (en) | 1992-03-04 | 2001-02-27 | Semiconductor Energy Laboratory Co., Ltd. | Electro-optical device |
| US6242758B1 (en) | 1994-12-27 | 2001-06-05 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device employing resinous material, method of fabricating the same and electrooptical device |
| US6778231B1 (en) | 1991-06-14 | 2004-08-17 | Semiconductor Energy Laboratory Co., Ltd. | Electro-optical display device |
| US6975296B1 (en) | 1991-06-14 | 2005-12-13 | Semiconductor Energy Laboratory Co., Ltd. | Electro-optical device and method of driving the same |
| US7569408B1 (en) | 1991-03-06 | 2009-08-04 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for forming the same |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6180188A (en) * | 1984-09-27 | 1986-04-23 | 株式会社東芝 | Drive circuit substratefor display and manufacture thereof |
| JPS61188968A (en) * | 1985-02-15 | 1986-08-22 | Sharp Corp | Thin film transistor |
-
1987
- 1987-07-27 JP JP62186830A patent/JPS6430272A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6180188A (en) * | 1984-09-27 | 1986-04-23 | 株式会社東芝 | Drive circuit substratefor display and manufacture thereof |
| JPS61188968A (en) * | 1985-02-15 | 1986-08-22 | Sharp Corp | Thin film transistor |
Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5905555A (en) * | 1990-11-26 | 1999-05-18 | Semiconductor Energy Laboratory Co., Ltd. | Active matrix type electro-optical device having leveling film |
| JPH04190330A (en) * | 1990-11-26 | 1992-07-08 | Semiconductor Energy Lab Co Ltd | Driving method for display device |
| US7569408B1 (en) | 1991-03-06 | 2009-08-04 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for forming the same |
| US6778231B1 (en) | 1991-06-14 | 2004-08-17 | Semiconductor Energy Laboratory Co., Ltd. | Electro-optical display device |
| US5956105A (en) * | 1991-06-14 | 1999-09-21 | Semiconductor Energy Laboratory Co., Ltd. | Electro-optical device and method of driving the same |
| US6975296B1 (en) | 1991-06-14 | 2005-12-13 | Semiconductor Energy Laboratory Co., Ltd. | Electro-optical device and method of driving the same |
| US6013928A (en) * | 1991-08-23 | 2000-01-11 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device having interlayer insulating film and method for forming the same |
| US6004831A (en) * | 1991-09-25 | 1999-12-21 | Semiconductor Energy Laboratory Co., Ltd. | Method for fabricating a thin film semiconductor device |
| US6979840B1 (en) | 1991-09-25 | 2005-12-27 | Semiconductor Energy Laboratory Co., Ltd. | Thin film transistors having anodized metal film between the gate wiring and drain wiring |
| US6618105B2 (en) | 1992-03-04 | 2003-09-09 | Semiconductor Energy Laboratory Co., Ltd. | Electro-optical device |
| US7123320B2 (en) | 1992-03-04 | 2006-10-17 | Semiconductor Energy Laboratory Co., Ltd. | Electro-optical device |
| US6195139B1 (en) | 1992-03-04 | 2001-02-27 | Semiconductor Energy Laboratory Co., Ltd. | Electro-optical device |
| US8035773B2 (en) | 1992-03-04 | 2011-10-11 | Semiconductor Energy Laboratory Co., Ltd. | Electro-optical device |
| US6429053B1 (en) | 1994-12-27 | 2002-08-06 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device method of fabricating same, and, electrooptical device |
| US6242758B1 (en) | 1994-12-27 | 2001-06-05 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device employing resinous material, method of fabricating the same and electrooptical device |
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