JPS644013A - Formation of substrate - Google Patents
Formation of substrateInfo
- Publication number
- JPS644013A JPS644013A JP62158905A JP15890587A JPS644013A JP S644013 A JPS644013 A JP S644013A JP 62158905 A JP62158905 A JP 62158905A JP 15890587 A JP15890587 A JP 15890587A JP S644013 A JPS644013 A JP S644013A
- Authority
- JP
- Japan
- Prior art keywords
- bonded
- faces
- wafers
- curved
- right angles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P90/00—Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
- H10P90/19—Preparing inhomogeneous wafers
- H10P90/1904—Preparing vertically inhomogeneous wafers
- H10P90/1906—Preparing SOI wafers
- H10P90/1914—Preparing SOI wafers using bonding
Landscapes
- Recrystallisation Techniques (AREA)
Abstract
PURPOSE:To eliminate a part not bonded when substrates are to be bonded by a method wherein faces to be bonded of the substrates are curved in such a way that convex faces are faced at right angles or at a prescribed angle to each other, the faced convex faces are brought into contact with each other and, after that, both faces are bonded while the curved faces are respectively restored to a plane. CONSTITUTION:Two disk-shaped wafers 1 and 2 to be bonded are prepared; a force is exerted on these wafers 1, 2; the wafers are deformed and curved to be U-shaped in such a way that faces to be bonded become mutually convex faces 1a, 2a and that the mutually convex faces 1a, 2a are faced at right angles or at nearly right angles to each other. Then, the convex faces 1a, 2a of the wafers 1, 2 which have been curved to be U-shaped are initially brought into contact with each other near the center A in such a way that they are faced at right angles or at nearly right angles to each other. In succession, a curved state is released, and the wafers 1, 2 are respectively restored to a plane state and are superposed; they are heated and are bonded. A contact part is extended radially from the center A or from a point-like contact position near the center; a surrounding gas such as the air or the like is expelled; accordingly, the two wafers 1, 2 are bonded closely to each other.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62158905A JPS644013A (en) | 1987-06-26 | 1987-06-26 | Formation of substrate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62158905A JPS644013A (en) | 1987-06-26 | 1987-06-26 | Formation of substrate |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS644013A true JPS644013A (en) | 1989-01-09 |
Family
ID=15681919
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62158905A Pending JPS644013A (en) | 1987-06-26 | 1987-06-26 | Formation of substrate |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS644013A (en) |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH042560A (en) * | 1990-04-17 | 1992-01-07 | Komatsu Ltd | Wheeled vehicle slip preventing device and method thereof |
| US5300175A (en) * | 1993-01-04 | 1994-04-05 | Motorola, Inc. | Method for mounting a wafer to a submount |
| US5827343A (en) * | 1994-10-13 | 1998-10-27 | Engelke; Heinrich | Process for changing the bend of anodically bonded flat composite bodies made of glass and metal or semiconductor materials |
| EP0899778A3 (en) * | 1997-08-27 | 2001-03-21 | Canon Kabushiki Kaisha | Apparatus and method for pressing two substrates together |
| FR2848336A1 (en) * | 2002-12-09 | 2004-06-11 | Commissariat Energie Atomique | METHOD FOR MAKING A STRESS STRUCTURE FOR DISSOCIATING |
| US7176108B2 (en) | 2002-11-07 | 2007-02-13 | Soitec Silicon On Insulator | Method of detaching a thin film at moderate temperature after co-implantation |
| US7229899B2 (en) | 1997-12-30 | 2007-06-12 | Commissariat A L'energie Atomique | Process for the transfer of a thin film |
| US7439092B2 (en) | 2005-05-20 | 2008-10-21 | Commissariat A L'energie Atomique | Thin film splitting method |
| US7772087B2 (en) | 2003-12-19 | 2010-08-10 | Commissariat A L'energie Atomique | Method of catastrophic transfer of a thin film after co-implantation |
| JP2015515111A (en) * | 2011-12-29 | 2015-05-21 | コミサリア ア エナジー アトミック エ オックス エナジーズ オルタネティヴ | Method for manufacturing a multilayer structure on a substrate |
-
1987
- 1987-06-26 JP JP62158905A patent/JPS644013A/en active Pending
Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH042560A (en) * | 1990-04-17 | 1992-01-07 | Komatsu Ltd | Wheeled vehicle slip preventing device and method thereof |
| US5300175A (en) * | 1993-01-04 | 1994-04-05 | Motorola, Inc. | Method for mounting a wafer to a submount |
| US5827343A (en) * | 1994-10-13 | 1998-10-27 | Engelke; Heinrich | Process for changing the bend of anodically bonded flat composite bodies made of glass and metal or semiconductor materials |
| EP0899778A3 (en) * | 1997-08-27 | 2001-03-21 | Canon Kabushiki Kaisha | Apparatus and method for pressing two substrates together |
| US6451670B1 (en) | 1997-08-27 | 2002-09-17 | Canon Kabushiki Kaisha | Substrate processing apparatus, substrate support apparatus, substrate processing method, and substrate fabrication method |
| US6706618B2 (en) | 1997-08-27 | 2004-03-16 | Canon Kabushiki Kaisha | Substrate processing apparatus, substrate support apparatus, substrate processing method, and substrate fabrication method |
| US7229899B2 (en) | 1997-12-30 | 2007-06-12 | Commissariat A L'energie Atomique | Process for the transfer of a thin film |
| US7176108B2 (en) | 2002-11-07 | 2007-02-13 | Soitec Silicon On Insulator | Method of detaching a thin film at moderate temperature after co-implantation |
| WO2004064146A1 (en) * | 2002-12-09 | 2004-07-29 | Commissariat A L'energie Atomique | Method for making a stressed structure designed to be dissociated |
| FR2848336A1 (en) * | 2002-12-09 | 2004-06-11 | Commissariat Energie Atomique | METHOD FOR MAKING A STRESS STRUCTURE FOR DISSOCIATING |
| US7772087B2 (en) | 2003-12-19 | 2010-08-10 | Commissariat A L'energie Atomique | Method of catastrophic transfer of a thin film after co-implantation |
| US7439092B2 (en) | 2005-05-20 | 2008-10-21 | Commissariat A L'energie Atomique | Thin film splitting method |
| JP2015515111A (en) * | 2011-12-29 | 2015-05-21 | コミサリア ア エナジー アトミック エ オックス エナジーズ オルタネティヴ | Method for manufacturing a multilayer structure on a substrate |
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