JPS644067A - Manufacture of semiconductor device - Google Patents

Manufacture of semiconductor device

Info

Publication number
JPS644067A
JPS644067A JP62159306A JP15930687A JPS644067A JP S644067 A JPS644067 A JP S644067A JP 62159306 A JP62159306 A JP 62159306A JP 15930687 A JP15930687 A JP 15930687A JP S644067 A JPS644067 A JP S644067A
Authority
JP
Japan
Prior art keywords
grow
oxide film
layer
type
epitaxial layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62159306A
Other languages
Japanese (ja)
Inventor
Atsushi Nakano
Daisaku Kobayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP62159306A priority Critical patent/JPS644067A/en
Publication of JPS644067A publication Critical patent/JPS644067A/en
Pending legal-status Critical Current

Links

Landscapes

  • Bipolar Transistors (AREA)
  • Bipolar Integrated Circuits (AREA)

Abstract

PURPOSE:To make an epitaxial layer on a first burial layer uniform and to form a second burial layer in desired depth, by making the epitaxial layer grow after the forming of the first burial layer and providing anisotropic etching to a fixed depth for a part where a second burial layer is formed, by making a thin oxide film grow so as to form a second burial layer, and then by removing the oxide film and then making an epitaxial layer grow. CONSTITUTION:A silicon oxide film 2 is made to grow on a P type silicon substrate 1, and selective patterning is used to bury a first N type burial layer 3 into a silicon opening part under an atmosphere of oxygen. After a silicon oxide film 2 is removed, an N type first epitaxial layer 4 is made to grow and heat oxidation is performed to make an silicon oxide film 5 grow. A similar method is used to perform selective patterning, and the N type epitaxial layer 4 is etched to a degree so as to form a recessed part by anisotropic dry etching. Next heat oxidation processing is used to make a thin silicon oxide film 6 on the N type epitaxial layer 4, and afterwards ion implantation of the N type impurities is performed to form a second N type burial layer 7. Next the thin silicon oxide film 6 formed in the preceding process is removed by a hydrofluoric acid solution and so an epitaxial layer 8 is made to grow.
JP62159306A 1987-06-25 1987-06-25 Manufacture of semiconductor device Pending JPS644067A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62159306A JPS644067A (en) 1987-06-25 1987-06-25 Manufacture of semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62159306A JPS644067A (en) 1987-06-25 1987-06-25 Manufacture of semiconductor device

Publications (1)

Publication Number Publication Date
JPS644067A true JPS644067A (en) 1989-01-09

Family

ID=15690920

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62159306A Pending JPS644067A (en) 1987-06-25 1987-06-25 Manufacture of semiconductor device

Country Status (1)

Country Link
JP (1) JPS644067A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5869796A (en) * 1997-02-05 1999-02-09 Mitsubishi Denki Kabushiki Kaisha Contact device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5869796A (en) * 1997-02-05 1999-02-09 Mitsubishi Denki Kabushiki Kaisha Contact device

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