JPS6443773A - Propagation delay testing method for logic circuit - Google Patents
Propagation delay testing method for logic circuitInfo
- Publication number
- JPS6443773A JPS6443773A JP62199053A JP19905387A JPS6443773A JP S6443773 A JPS6443773 A JP S6443773A JP 62199053 A JP62199053 A JP 62199053A JP 19905387 A JP19905387 A JP 19905387A JP S6443773 A JPS6443773 A JP S6443773A
- Authority
- JP
- Japan
- Prior art keywords
- propagation delay
- flop
- flip
- path
- trouble
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title abstract 2
- 230000000644 propagated effect Effects 0.000 abstract 1
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
PURPOSE:To easily test a propagation delay by setting an optional flip-flop in an optional state directly from the outside. CONSTITUTION:An input variation signal is propagated on a path 117 to be tested and appears at a D entrance pin of the flip-flop 104. The variation at the D entrance is inputted to the flip-flop 104 unless there is no trouble of propagation delay on the path 117 to be tested. If, however, there is delay trouble, the flip-flop does not change its state. Here, the state of the flip-flop 104 is scanned out so as to decide the trouble of propagation delay on the path 117. Namely, the flip-flop 104 is selected with a scan-address pin 112 to obtain the state of the flip-flop 104 on the scan-out pin 116. This value shows there is no propagation delay on the tested path 117 when it is a signal value after the variation at the output terminal of the object path 117, but indicates the trouble of propagation delay on the object path 117, and consequently the propagation delay can be tested.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62199053A JPS6443773A (en) | 1987-08-11 | 1987-08-11 | Propagation delay testing method for logic circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62199053A JPS6443773A (en) | 1987-08-11 | 1987-08-11 | Propagation delay testing method for logic circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6443773A true JPS6443773A (en) | 1989-02-16 |
Family
ID=16401326
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62199053A Pending JPS6443773A (en) | 1987-08-11 | 1987-08-11 | Propagation delay testing method for logic circuit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6443773A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0786489A4 (en) * | 1995-08-15 | 1998-04-29 | Dow Corning Asia Limited | Curable polymethylsilsesquioxane, method for curing the same and products of curing thereof |
| US5939500A (en) * | 1997-02-24 | 1999-08-17 | Dow Corning Asia, Ltd | Hydrogen-functional silylated polymethylsilsesquioxane |
| US6008310A (en) * | 1997-02-24 | 1999-12-28 | Dow Corning Asia, Ltd. | Silicone release coating compositions |
| US6675333B1 (en) | 1990-03-30 | 2004-01-06 | Texas Instruments Incorporated | Integrated circuit with serial I/O controller |
-
1987
- 1987-08-11 JP JP62199053A patent/JPS6443773A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6675333B1 (en) | 1990-03-30 | 2004-01-06 | Texas Instruments Incorporated | Integrated circuit with serial I/O controller |
| EP0786489A4 (en) * | 1995-08-15 | 1998-04-29 | Dow Corning Asia Limited | Curable polymethylsilsesquioxane, method for curing the same and products of curing thereof |
| US5939500A (en) * | 1997-02-24 | 1999-08-17 | Dow Corning Asia, Ltd | Hydrogen-functional silylated polymethylsilsesquioxane |
| US6008310A (en) * | 1997-02-24 | 1999-12-28 | Dow Corning Asia, Ltd. | Silicone release coating compositions |
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