JPS6444452U - - Google Patents
Info
- Publication number
- JPS6444452U JPS6444452U JP14026587U JP14026587U JPS6444452U JP S6444452 U JPS6444452 U JP S6444452U JP 14026587 U JP14026587 U JP 14026587U JP 14026587 U JP14026587 U JP 14026587U JP S6444452 U JPS6444452 U JP S6444452U
- Authority
- JP
- Japan
- Prior art keywords
- scratch
- pulses
- flaw
- pulse
- removal circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 claims description 5
- 238000007689 inspection Methods 0.000 claims description 4
- 238000005259 measurement Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 5
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Manufacturing Optical Record Carriers (AREA)
Description
第１図および第２図は本考案の光デイスク検査
装置の一実施例を示す構成図およびその動作波形
図、第３図および第４図は従来の光デイスク検査
装置の一例を示す構成図およびその動作波形図で
ある。
１……光デイスク、２……スピンドルモータ、
３……測定ヘツド、４……傷パルス発生回路、５
……第１のカウンタ、６……第２のカウンタ、７
……ゲート回路、８……傷パルス除去回路、９…
…切換えスイツチ。
1 and 2 are block diagrams and operational waveform diagrams showing one embodiment of the optical disk inspection device of the present invention, and FIGS. 3 and 4 are block diagrams and diagrams showing an example of conventional optical disk inspection devices. It is an operation waveform diagram. 1... Optical disk, 2... Spindle motor,
3... Measuring head, 4... Scratch pulse generation circuit, 5
...First counter, 6...Second counter, 7
...Gate circuit, 8...Flaw pulse removal circuit, 9...
...changeover switch.
Claims (1)
位に傷の検出を行ない検出した傷長の総和により
各セクタの良否を判別するようにした光デイスク
検査装置において、測定ヘツドからの出力信号を
一定の基準レベルと比較して傷パルスを発生する
傷パルス発生回路と、この傷パルスの中からパル
ス幅が一定値以下の傷パルスを除去する傷パルス
除去回路と、この傷パルス除去回路を通過した傷
パルスの数をカウントする第１のカウンタと、こ
の傷パルス除去回路を通過した傷パルスによりク
ロツク信号のカウントが制御される第２のカウン
タとを具備し、前記第２のカウンタにおけるカウ
ント値から傷長の総和を求めるようにしてなる光
デイスク検査装置。 In an optical disk inspection device that detects flaws in sectors separated by a preformat section and determines the quality of each sector based on the sum of the detected flaw lengths, the output signal from the measurement head is compared with a certain reference level. A scratch pulse generation circuit that generates scratch pulses, a scratch pulse removal circuit that removes scratch pulses whose pulse width is below a certain value from among these scratch pulses, and a scratch pulse removal circuit that calculates the number of scratch pulses that have passed through this scratch pulse removal circuit. It comprises a first counter for counting, and a second counter whose clock signal count is controlled by the flaw pulses that have passed through the flaw pulse removal circuit, and the total flaw length is calculated from the count value of the second counter. Optical disk inspection equipment that meets your needs.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14026587U JPS6444452U (en) | 1987-09-14 | 1987-09-14 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14026587U JPS6444452U (en) | 1987-09-14 | 1987-09-14 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6444452U true JPS6444452U (en) | 1989-03-16 |
Family
ID=31404277
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14026587U Pending JPS6444452U (en) | 1987-09-14 | 1987-09-14 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6444452U (en) |
-
1987
- 1987-09-14 JP JP14026587U patent/JPS6444452U/ja active Pending
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