JPS6444870A - Testing jig - Google Patents

Testing jig

Info

Publication number
JPS6444870A
JPS6444870A JP62202741A JP20274187A JPS6444870A JP S6444870 A JPS6444870 A JP S6444870A JP 62202741 A JP62202741 A JP 62202741A JP 20274187 A JP20274187 A JP 20274187A JP S6444870 A JPS6444870 A JP S6444870A
Authority
JP
Japan
Prior art keywords
lsi
contact
pin
terminal
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62202741A
Other languages
Japanese (ja)
Inventor
Ryoichi Chiba
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP62202741A priority Critical patent/JPS6444870A/en
Publication of JPS6444870A publication Critical patent/JPS6444870A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE:To obtain a testing jig requiring no labor in continuously holding the contact of the pin terminal of a multipolar LSI and the probe of a measuring device during a test period, by making it possible to bring the probe of the measuring device into contact with the pin terminal of the multipolar LSI mounted on a printed circuit board by positioning said probe only by fixing and pressing the same to the package of the LSI. CONSTITUTION:A main body 1 having a recessed part and a plurality of the contact ins 2 mounted to the main body 1 are mounted. The main body 1 is positioned so as to engage the outer periphery of the package of an LSI 4 with the recessed part and pressed to the package of the LSI 4 by a fixing jig 5 to bring each pin 2 into contact with each pin terminal 41 of the LSI 4. A notch is provided to the leading end of each of the pins 2 and the terminal 41 is inserted in said notch to correct the positional shift of the pin 2 in a lateral direction. Further, a flange is provided to each of the pins 2 and pressed downwardly by the spring in the main body to elastically bring each of the pins 2 into contact with the terminals 41. The probe 61 of a measuring device 6 is mounted to the terminal of the pin 2 brought into contact with the terminal 41 to be monitored among the terminals of the LSI 4.
JP62202741A 1987-08-14 1987-08-14 Testing jig Pending JPS6444870A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62202741A JPS6444870A (en) 1987-08-14 1987-08-14 Testing jig

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62202741A JPS6444870A (en) 1987-08-14 1987-08-14 Testing jig

Publications (1)

Publication Number Publication Date
JPS6444870A true JPS6444870A (en) 1989-02-17

Family

ID=16462392

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62202741A Pending JPS6444870A (en) 1987-08-14 1987-08-14 Testing jig

Country Status (1)

Country Link
JP (1) JPS6444870A (en)

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