JPS644586B2 - - Google Patents
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- Publication number
- JPS644586B2 JPS644586B2 JP11068785A JP11068785A JPS644586B2 JP S644586 B2 JPS644586 B2 JP S644586B2 JP 11068785 A JP11068785 A JP 11068785A JP 11068785 A JP11068785 A JP 11068785A JP S644586 B2 JPS644586 B2 JP S644586B2
- Authority
- JP
- Japan
- Prior art keywords
- processing strain
- artificial diamond
- applying
- width
- diamond film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Chemical Vapour Deposition (AREA)
Description
〔産業上の利用分野〕
この発明は、炭化タングステン(以下WCで示
す)基超硬合金部材の表面に、微細組織を有し、
かつ密着性のすぐれた人工ダイヤモンド皮膜を析
出形成する方法に関するものである。
〔従来の技術〕
一般に、WCを主成分とし、結合相形成成分と
してCoやNiなどの金属成分を含有するWC基超
硬合金部材の表面に人工ダイヤモンド皮膜を析出
形成することはよく知られるところである。
これらの人工ダイヤモンド皮膜の析出形成には
多数の方法が提案されているが、この中で反応混
合ガスを加熱し、活性化する手段として、
(a) 熱電子放射材、
(b) 高周波によるプラズマ放電、
(c) マイクロ波によるプラズマ放電、
以上(a)〜(c)のいずれかを採用する方法が代表的方
法として注目されている。
すなわち、上記(a)方法は、第1図に概略説明図
で示されるように、石英製反応容器1内の上部に
開口する反応混合ガス導入管2によつて導入され
た、主として炭化水素と水素からなる反応混合ガ
スを、熱電子放射材としての例えば金属タングス
テン製フイラメント3および台板4上に支持され
たWC基超硬合金部材5を通して下方に流し、こ
の間反応容器1内の雰囲気圧力を0.1〜300torrに
保持すると共に、フイラメント3を1500〜2500℃
に加熱して、反応混合ガスの加熱活性化と、フイ
ラメント位置より所定間隔をもつて下方に配置さ
れた部材5の表面温度の300〜1300℃の範囲内の
温度への加熱をはかり、この状態で所定時間の反
応を行なうことにより部材5の表面に人工ダイヤ
モンド皮膜を析出形成するものであり、例えば特
開昭58−91100号公報に記載される方法がこの方
法に相当する方法である。
また、上記(b)方法は、同じく第2図に概略説明
図で示されるように、石英製反応容器1内の中央
部に部材5を置き、この反応容器1の一方側に設
けた反応混合ガス導入管2から主として炭化水素
と水素からなる反応混合ガスを流入し、一方反応
容器1の他方側から排気し、この間、反応容器1
内の雰囲気圧力を数torr〜数10torrに保持すると
共に、反応容器1の中央外周部に設けた高周波コ
イル6に、例えば周波数:13.56MHz、出力:
500Wの条件を付加して反応容器1内の部材5の
周囲にプラズマ放電を誘起させ、このプラズマ放
電によつて反応混合ガスの加熱活性化と部材表面
温度の上昇をはかり、この状態で所定時間の反応
を行なうことにより、部材の表面に人工ダイヤモ
ンド皮膜を析出形成するものであり、例えば特開
昭58−135117号公報に記載される方法がこれに相
当する方法である。
さらに、上記(c)方法は、同様に第3図に概略説
明図で示されるように、石英製反応容器1内の中
央部に部材5を置き、この反応容器1の上方に設
けた反応混合ガス導入管2から、主として炭化水
素と水素からなる反応混合ガスを流入させ、一方
反応容器1の下方から排気し、この間、反応容器
1内の雰囲気圧力を0.1〜300torrに保持し、さら
に反応容器1の中央外周部に設けた導波管7を通
して供給された、例えば2450MHzのマイクロ波を
プラズマ調整用プランジヤ8によつて調整して、
反応容器1内の部材5の周囲にプラズマ放電を発
生させ、このプラズマ放電によつて反応混合ガス
の加熱活性化と部材表面温度の上昇をはかり、こ
の状態で所定時間の反応を行うことにより、部材
の表面に人工ダイヤモンド皮膜を析出形成するも
のであり、例えば特開昭58−110494号公報に記載
される方法がこの方法に相当する方法である。
〔発明が解決しようとする問題点〕
しかし、これらの人工ダイヤモンド皮膜析出形
成方法においては、いずれも共通して反応初期に
WC基超硬合金部材の表面に析出するダイヤモン
ド結晶核の数が少なく、一方人工ダイヤモンドは
この結晶核を中心に成長し、膜状を呈するように
なるものであるため、析出形成した人工ダイヤモ
ンド皮膜は、組織が粗く、部材表面への密着性に
劣るものであつた。
〔問題点を解決するための手段〕
そこで、本発明者等は、上述のような観点か
ら、WC基超硬合金部材の表面に、微細な結晶組
織を有し、かつ密着性のすぐれた人工ダイヤモン
ド皮膜を析出形成すべく研究を行なつた結果、
WC基超硬合金部材の表面に人工ダイヤモンド皮
膜を析出形成するに先だつて、前処理として前記
部材の表面に予め加工歪を加え、かつその研削砥
石による加工歪の割合を、加工歪付与前後の前記
部材におけるWCの(100)結晶面の回折線をX
線回折により観察して、その半価幅を求め、
加工歪付与後の回折線の半価幅/加工歪付与前の回折
線の半価幅=1.1〜2、を
満足するものとしておくと、初期において人工ダ
イヤモンドの結晶核が著しく増大するようにな
り、この結果形成された人工ダイヤモンド皮膜
は、微細組織にして、密着性のすぐれたものにな
るという知見を得たのである。
したがつて、この発明は、上記知見にもとづい
てなされたものであつて、主成分が炭化水素と水
素からなり、かつ熱電子放射材、高周波によるプ
ラズマ放電、あるいはマイクロ波によるプラズマ
放電などにより活性化された加熱反応混合ガスの
流れの中に、加熱されたWC基超硬合金部材を置
くことによつて、前記部材の表面に人工ダイヤモ
ンド皮膜を形成するに先だつて、前処理として前
記部材の表面に予め研削砥石による加工歪を加え
ておき、かつこの加工歪の割合を、加工歪付与前
後の前記部材におけるWCの(100)結晶面の回
折線をX線回折により観察して、その半価幅を求
め、
加工歪付与後の回折線の半価幅/加工歪付与前の回折
線の半価幅=1.1〜2、を
満足するものとした点に特徴を有するものであ
る。
なお、この発明の方法において、部材表面への
研削砥石による加工歪の付与は通常鋼材などの比
較的軟質材の研削に用いられている炭化けい素砥
石や、さらにダイヤモンド砥石を用いるのが実用
的である。
また、この発明の方法において、加工歪の割合
を、加工歪付与前の回折線の半価幅に対する割合
で1.1〜2としたのは、その割合が1.1未満では、
上記の作用に所望の効果が得られず、一方その割
合が2を越えると歪量が大きくなりすぎて部材に
割れが発生するようになるという理由によるもの
である。
〔実施例〕
つぎに、この発明の方法を実施例により具体的
に説明する。
部材として、Co:6重量%、WC:残りからな
る組成をもち、かつ平面:12.7mm□×厚さ:3.5
mmの寸法をもつたWC基超硬合金チツプを用意
し、このチツプの表面に対して、それぞれ第1表
に示される各種の砥石を用いて種々の加工歪を加
え、ついで、このチツプ表面における加工歪の割
合を測定するために、これをX線回折にかけ、前
記チツプにおけるWCの(100)結晶面の回折線
を観察して、その半価幅を求め、この結果にもと
づいて加工歪付与前の回折線の半価幅に対する割
合(加工歪の割合)を算出し、さらに前記チツプ
表面の10点平均表面粗さRZを測定し、引続いて、
これらのチツプを、加工歪のないチツプと共に、
第1図〜第3図に示される装置にそれぞれ装入
し、第1図に示される装置では、
反応容器1:外径30mmφの石英管、
反応混合ガス組成:CH4/H2=0.01、
反応混合ガス流量:300ml/min、
金属タングステン製フイラメント3とチツプ5
の表面間の距離:30mm、
フイラメント3の加熱温度:2000℃、
反応容器1内の真空度:20torr、
の条件で、また第2図に示される装置では、
反応容器1:外径50mmφの石英管、
反応混合ガス組成:CH4/H2=0.01、
高周波コイル6への印加条件(周波数:
13.56MHz、出力:2KW)、
反応容器1内の真空度:20torr、
の条件で、さらに第3図に示される装置では、
反応容器1:外径30mmφの石英管、
反応混合ガス組成:CH4/H2=0.03、
マイクロ波:2450MHz(出力:500W)、
反応容器1内の真空度:30torr、
の条件で人工ダイヤモンド皮膜の形成を行ない、
いずれの場合も反応開始1時間後のチツプ表面に
占める人工ダイヤモンドの面積率を測定し、かつ
反応をチツプ表面全体が人工ダイヤモンドによつ
て覆われた時点、すなわち人工ダイヤモンドの面
積率が100%に達した時点で終了させ、その反応
時間を測定することによつて本発明法1〜7およ
び比較法1、2をそれぞれ実施した。
ついで、この結果形成された人工ダイヤモンド
皮膜の平均結晶粒径を測定すると共に、この結果
のチツプを切削チツプとして用い、
被削材:Al合金(Si:2%含有)、
切削速度:500m/min、
送り:0.1mm/rev.、
切込み:1.5mm、
[Industrial Application Field] This invention provides a tungsten carbide (hereinafter referred to as WC)-based cemented carbide member having a microstructure on its surface,
The present invention also relates to a method for depositing and forming an artificial diamond film with excellent adhesion. [Prior Art] Generally, it is well known that an artificial diamond film is deposited and formed on the surface of a WC-based cemented carbide member containing WC as a main component and metal components such as Co and Ni as binder phase forming components. be. Many methods have been proposed for the precipitation formation of these artificial diamond films, among which methods for heating and activating the reaction mixture gas include (a) thermionic emitters, and (b) plasma using high frequency waves. (c) Plasma discharge using microwaves A method employing any of the above (a) to (c) is attracting attention as a typical method. That is, as shown in the schematic illustration in FIG. A reaction mixture gas consisting of hydrogen is caused to flow downward through a WC-based cemented carbide member 5 supported on a metal tungsten filament 3 as a thermionic emitting material and a base plate 4, and during this time the atmospheric pressure in the reaction vessel 1 is maintained. While maintaining the temperature at 0.1 to 300 torr, heat the filament 3 at 1500 to 2500℃.
The reactant mixture gas is activated by heating, and the surface temperature of the member 5 placed below the filament position at a predetermined interval is heated to a temperature within the range of 300 to 1300°C. An artificial diamond film is deposited and formed on the surface of the member 5 by carrying out a reaction for a predetermined period of time. For example, the method described in Japanese Patent Application Laid-Open No. 1983-91100 is a method corresponding to this method. In addition, in the method (b) above, as shown in the schematic explanatory diagram in FIG. A reaction mixture gas consisting mainly of hydrocarbons and hydrogen is introduced from the gas introduction pipe 2 and exhausted from the other side of the reaction vessel 1. During this time, the reaction vessel 1 is
While maintaining the internal atmospheric pressure at several torr to several tens of torr, a high-frequency coil 6 provided at the center outer circumference of the reaction vessel 1 is connected to a high-frequency coil 6 with a frequency of 13.56 MHz and an output of, for example,
Plasma discharge is induced around the member 5 in the reaction vessel 1 by applying a 500W condition, and this plasma discharge is used to heat and activate the reaction mixture gas and increase the member surface temperature, and is maintained in this state for a specified period of time. An artificial diamond film is precipitated and formed on the surface of a member by carrying out the following reaction. For example, the method described in JP-A-58-135117 is a method corresponding to this method. Furthermore, in the above method (c), as similarly shown in the schematic diagram in FIG. A reaction mixture gas consisting mainly of hydrocarbons and hydrogen is introduced from the gas introduction pipe 2, and exhausted from the bottom of the reaction vessel 1. During this time, the atmospheric pressure inside the reaction vessel 1 is maintained at 0.1 to 300 torr, and For example, a 2450 MHz microwave supplied through a waveguide 7 provided at the central outer circumference of
Plasma discharge is generated around the member 5 in the reaction vessel 1, and this plasma discharge heats and activates the reaction mixture gas and increases the member surface temperature, and the reaction is carried out for a predetermined period of time in this state. This method involves depositing and forming an artificial diamond film on the surface of a member, and for example, the method described in Japanese Patent Application Laid-open No. 110494/1983 is a method corresponding to this method. [Problems to be solved by the invention] However, all of these artificial diamond film precipitation formation methods have a common problem in the early stage of the reaction.
The number of diamond crystal nuclei precipitated on the surface of the WC-based cemented carbide member is small, while artificial diamond grows around these crystal nuclei and takes on a film-like appearance. had a rough structure and poor adhesion to the surface of the member. [Means for solving the problem] Therefore, from the above-mentioned viewpoint, the present inventors created an artificial material having a fine crystal structure and excellent adhesion on the surface of a WC-based cemented carbide member. As a result of research to form a diamond film by precipitation,
Prior to depositing and forming an artificial diamond film on the surface of a WC-based cemented carbide member, machining strain is applied to the surface of the member as a pretreatment, and the rate of machining strain caused by the grinding wheel is measured before and after applying the machining strain. The diffraction line of the (100) crystal plane of WC in the above member is
Observe by line diffraction to find the half-width, and assume that the half-width of the diffraction line after applying the processing strain/the half-width of the diffraction line before applying the processing strain = 1.1 to 2. They discovered that the crystal nuclei of artificial diamonds increase significantly in the initial stage, and that the resulting artificial diamond film has a fine structure and excellent adhesion. Therefore, the present invention has been made based on the above knowledge, and consists of hydrocarbons and hydrogen as main components, and is activated by a thermionic emitting material, plasma discharge by high frequency, plasma discharge by microwave, etc. By placing a heated WC-based cemented carbide member in a flow of a heated reaction mixture gas, the member is pre-treated prior to forming an artificial diamond film on the surface of the member. A machining strain is applied to the surface in advance by a grinding wheel, and the ratio of this machining strain is determined by observing the diffraction lines of the (100) crystal plane of WC in the member before and after applying the machining strain by X-ray diffraction. This method is characterized in that the width at half maximum of the diffraction line after applying processing strain/the width at half maximum of the diffraction line before applying processing strain = 1.1 to 2. In addition, in the method of this invention, it is practical to use a silicon carbide grindstone, which is normally used for grinding comparatively soft materials such as steel, or a diamond grindstone to apply processing strain to the surface of the member using a grinding wheel. It is. In addition, in the method of the present invention, the ratio of processing strain to the half width of the diffraction line before applying processing strain is set to 1.1 to 2. If the ratio is less than 1.1,
This is because the desired effect cannot be obtained from the above action, and on the other hand, if the ratio exceeds 2, the amount of strain becomes too large and cracks will occur in the member. [Example] Next, the method of the present invention will be specifically explained with reference to Examples. As a member, it has a composition consisting of Co: 6% by weight and WC: the remainder, and plane: 12.7mm x thickness: 3.5
A WC-based cemented carbide chip with dimensions of In order to measure the percentage of processing strain, this is subjected to X-ray diffraction, the diffraction line of the (100) crystal plane of WC in the chip is observed, its half width is determined, and based on this result, processing strain is applied. Calculate the ratio of the half width of the previous diffraction line (ratio of processing strain), further measure the 10-point average surface roughness R Z of the chip surface, and then:
These chips, together with chips without processing distortion,
In the apparatus shown in Fig. 1, reaction vessel 1: quartz tube with an outer diameter of 30 mmφ, reaction mixture gas composition: CH 4 /H 2 = 0.01, Reaction mixed gas flow rate: 300ml/min, metal tungsten filament 3 and chip 5
Under the following conditions: distance between surfaces of 30 mm, heating temperature of filament 3: 2000℃, degree of vacuum in reaction vessel 1: 20 torr, and in the apparatus shown in Figure 2, reaction vessel 1: quartz with an outer diameter of 50 mmφ tube, reaction mixture gas composition: CH 4 /H 2 = 0.01, application conditions to high frequency coil 6 (frequency:
13.56MHz, output: 2KW), degree of vacuum in reaction vessel 1: 20 torr, and in the apparatus shown in Figure 3, reaction vessel 1: quartz tube with outer diameter of 30 mmφ, reaction mixture gas composition: CH 4 /H 2 = 0.03, microwave: 2450MHz (output: 500W), degree of vacuum in reaction vessel 1: 30torr, The artificial diamond film was formed under the following conditions.
In either case, the area ratio of the artificial diamond on the chip surface was measured 1 hour after the start of the reaction, and the reaction was stopped when the entire chip surface was covered with the artificial diamond, that is, the area ratio of the artificial diamond was 100%. Methods 1 to 7 of the present invention and Comparative Methods 1 and 2 were carried out by measuring the reaction time. Next, the average grain size of the artificial diamond film formed as a result was measured, and the resulting chip was used as a cutting chip. Work material: Al alloy (Si: 2% content), cutting speed: 500 m/min. , Feed: 0.1mm/rev., Depth of cut: 1.5mm,
【表】【table】
【表】
切削時間:20分、
の条件でAl合金角材の断続切削試験を行ない、
試験切刃数:10本のうちの皮膜剥離切刃数を測定
した。これらの結果を第1表に示した。
また、第4図には、比較法1の加工歪のないチ
ツプ表面のWC結晶面(100)の回折線が示され、
第5図には、本発明法2の加工歪を加えたチツプ
表面の同回折線が示されており、その半価幅はい
ずれも角度で現われている。
〔発明の効果〕
第1表に示される結果から、比較法1の加工歪
のないチツプ表面、および比較法2の加工歪があ
つても、その量が少なすぎるチツプ表面に対して
は、粗大結晶組織をもち、かつ剥離し易い人工ダ
イヤモンド皮膜しか形成することができず、さら
にその皮膜の形成も遅いものであるのに対して、
本発明法1〜7においては、人工ダイヤモンド皮
膜の形成が速く、このことは初期における結晶核
の生成数の著しい増加を意味し、かつ微細結晶構
造を有し、密着性のすぐれた人工ダイヤモンド皮
膜が形成されることが明らかである。
上述のように、この発明の方法によれば、WC
基超硬合金部材の表面に、前処理として予め研削
砥石による加工歪を加えておくことによつて、微
細結晶構造を有し、かつ密着性のすぐれた人工ダ
イヤモンド皮膜を速い析出速度で形成することが
できるのである。[Table] Cutting time: 20 minutes, interrupted cutting test of Al alloy square material was conducted under the following conditions.
Number of test cutting edges: The number of cutting edges from which the film was peeled out of 10 was measured. These results are shown in Table 1. In addition, FIG. 4 shows the diffraction line of the WC crystal plane (100) on the chip surface without processing distortion of Comparative Method 1.
FIG. 5 shows the same diffraction lines of the chip surface subjected to processing strain according to method 2 of the present invention, and the half widths thereof are expressed in angles. [Effects of the Invention] From the results shown in Table 1, it can be seen that for the chip surface with no machining distortion in Comparative Method 1 and the chip surface with too small amount of machining distortion in Comparative Method 2, In contrast, only artificial diamond films that have a crystalline structure and are easy to peel off can be formed, and the film formation is also slow.
In Methods 1 to 7 of the present invention, the artificial diamond film is formed quickly, which means that the number of crystal nuclei generated at the initial stage is significantly increased, and the artificial diamond film has a fine crystal structure and excellent adhesion. is clearly formed. As mentioned above, according to the method of this invention, WC
By applying processing strain using a grinding wheel as a pretreatment to the surface of the base cemented carbide member, an artificial diamond film with a microcrystalline structure and excellent adhesion is formed at a high precipitation rate. It is possible.
第1図、第2図、および第3図はいずれも人工
ダイヤモンド皮膜の析出形成装置を示す概略説明
図、第4図は比較法1の加工歪のないチツプ表面
のWC結晶面(100)のX線回折線を示す図、第
5図は本発明法2の加工歪のあるチツプ表面の同
X線回折線を示す図である。
1…反応容器、2…反応混合ガス導入管、3…
熱電子放射材としてのフイラメント、4…台板、
5…部材、6…高周波コイル、7…導波管。
Figures 1, 2, and 3 are all schematic explanatory diagrams showing an apparatus for depositing artificial diamond films, and Figure 4 shows the WC crystal plane (100) on the chip surface without processing distortion in Comparative Method 1. FIG. 5 is a diagram showing the X-ray diffraction lines of the chip surface with processing distortion according to method 2 of the present invention. 1... Reaction container, 2... Reaction mixed gas introduction pipe, 3...
Filament as thermionic emitting material, 4...base plate,
5... Member, 6... High frequency coil, 7... Waveguide.
Claims (1)
子放射材、高周波によるプラズマ放電、あるいは
マイクロ波によるプラズマ放電などにより活性化
された加熱反応混合ガスの流れの中に、加熱され
た炭化タングステン基超硬合金部材を置くことに
よつて、前記部材の表面に人工ダイヤモンド皮膜
を析出形成するに先だつて、前処理として前記部
材の表面に予め研削砥石による加工歪を加え、そ
の加工歪の割合が、加工歪付与前後の前記部材に
おける炭化タングステンの(100)結晶面の回折
線をX線回折により観察して、その半価幅を求
め、 加工歪付与後の回折線の半価幅/加工歪付与前の回折線
の半価幅=1.1〜2、を満 足することを特徴とする人工ダイヤモンド皮膜の
析出形成方法。[Claims] 1. In the flow of a heated reaction mixture whose main components are hydrocarbon and hydrogen and which have been activated by a thermionic radiation material, plasma discharge by high frequency, plasma discharge by microwave, etc. By placing a heated tungsten carbide-based cemented carbide member, prior to depositing and forming an artificial diamond film on the surface of the member, applying processing strain to the surface of the member in advance with a grinding wheel as a pretreatment, The rate of the processing strain can be determined by observing the diffraction lines of the (100) crystal plane of tungsten carbide in the member before and after applying the processing strain using X-ray diffraction, and determining the half-width of the diffraction line after applying the processing strain. A method for depositing and forming an artificial diamond film, which satisfies the following: width at half maximum/width at half maximum of a diffraction line before applying processing strain = 1.1 to 2.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11068785A JPS61270372A (en) | 1985-05-23 | 1985-05-23 | Formation of artificial diamond film by deposition |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11068785A JPS61270372A (en) | 1985-05-23 | 1985-05-23 | Formation of artificial diamond film by deposition |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61270372A JPS61270372A (en) | 1986-11-29 |
| JPS644586B2 true JPS644586B2 (en) | 1989-01-26 |
Family
ID=14541900
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11068785A Granted JPS61270372A (en) | 1985-05-23 | 1985-05-23 | Formation of artificial diamond film by deposition |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61270372A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02272374A (en) * | 1989-04-13 | 1990-11-07 | Tokyo Electron Ltd | Semiconductor checking device |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10310494A (en) * | 1996-05-31 | 1998-11-24 | Ngk Spark Plug Co Ltd | Method for manufacturing superhard member with diamond coating film |
| JP4373294B2 (en) * | 2004-07-09 | 2009-11-25 | 日本碍子株式会社 | Die for forming honeycomb structure and method for manufacturing the same |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6086096A (en) * | 1983-10-18 | 1985-05-15 | Natl Inst For Res In Inorg Mater | Membrane diamond precipitation method |
| JPS61124573A (en) * | 1984-11-21 | 1986-06-12 | Toshiba Tungaloy Co Ltd | Diamond-coated base material and its production |
-
1985
- 1985-05-23 JP JP11068785A patent/JPS61270372A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02272374A (en) * | 1989-04-13 | 1990-11-07 | Tokyo Electron Ltd | Semiconductor checking device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61270372A (en) | 1986-11-29 |
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