JPS6446662A - Driver - Google Patents

Driver

Info

Publication number
JPS6446662A
JPS6446662A JP7794288A JP7794288A JPS6446662A JP S6446662 A JPS6446662 A JP S6446662A JP 7794288 A JP7794288 A JP 7794288A JP 7794288 A JP7794288 A JP 7794288A JP S6446662 A JPS6446662 A JP S6446662A
Authority
JP
Japan
Prior art keywords
photoconductors
conductors
conductor
photoconductor
lines
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7794288A
Other languages
English (en)
Inventor
Deemensu Giyuntaa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Corp
Original Assignee
Siemens Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Corp filed Critical Siemens Corp
Publication of JPS6446662A publication Critical patent/JPS6446662A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/78—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used using opto-electronic devices, i.e. light-emitting and photoelectric devices electrically- or optically-coupled
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
    • H03K17/941—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated using an optical detector

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Toxicology (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Electronic Switches (AREA)
JP7794288A 1987-03-31 1988-03-29 Driver Pending JPS6446662A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE3710597 1987-03-31

Publications (1)

Publication Number Publication Date
JPS6446662A true JPS6446662A (en) 1989-02-21

Family

ID=6324412

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7794288A Pending JPS6446662A (en) 1987-03-31 1988-03-29 Driver

Country Status (3)

Country Link
US (1) US4904067A (ja)
EP (1) EP0286814A3 (ja)
JP (1) JPS6446662A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004506205A (ja) * 2000-08-05 2004-02-26 ボテスト　ジュステムス　ゲーエムベーハー プリント基板の機能性をテストする方法と装置

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI79209C (fi) * 1986-03-19 1989-11-10 Kone Oy Anordning foer styrning av en trefasig inverter som matar vaexelstroemmotorn vid en hiss.
DE19654504C2 (de) * 1996-12-18 2003-08-21 X Fab Semiconductor Foundries Verfahren und Vorrichtung zum Prüfen integrierter Schaltkreise
DE19707325B8 (de) * 1997-02-12 2006-06-01 X-Fab Semiconductor Foundries Ag Verfahren zum Prüfen integrierter Schaltkreise
GB2400506A (en) * 2003-03-03 2004-10-13 Gareth Monkman A binary or analogue opto-isolator using an undoped GaAs photoconductor
AT507322B1 (de) * 2008-10-07 2011-07-15 Nanoident Technologies Ag Schaltvorrichtung zur elektrischen kontaktprüfung
DE102016209258A1 (de) * 2016-05-27 2017-11-30 Technische Universität Dresden Vorrichtung und Verfahren zum variablen elektrischen Verschalten von auf einem Substrat angeordneten Bauteilen

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2813983A (en) * 1955-08-24 1957-11-19 Louise B Hammar Size discriminating radiation detector
US3191040A (en) * 1959-06-08 1965-06-22 Ibm Photoconductive matrix switching plugboard
US3505527A (en) * 1967-04-06 1970-04-07 Bell Telephone Labor Inc Electronic drive circuit employing successively enabled multistate impedance elements
US3628088A (en) * 1969-07-18 1971-12-14 Larry J Schmersal High-voltage interface address circuit and method for gas discharge panel
US3666966A (en) * 1970-07-21 1972-05-30 Wolfgang Joseph Buss Electronic switch
DE2547938C3 (de) * 1975-10-25 1981-11-05 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Verfahren zur Prüfung von Leitungen in Geräten der Nachrichtentechnik und Schaltungsanordnung zur Durchführung des Verfahrens
US4124280A (en) * 1977-06-07 1978-11-07 The United States Of America As Represented By The Secretary Of The Army Acoustic-optic technique for processing many signals simultaneously
US4126834A (en) * 1977-06-27 1978-11-21 Gte Sylvania Incorporated Bulk wave bragg cell
JPS5793907U (ja) * 1980-11-26 1982-06-09
FR2516325B1 (fr) * 1981-11-10 1986-05-02 Pecile Dario Circuit d'adressage multiplexe utilisant des composants micro-optoelectroniques
US4509045A (en) * 1982-07-01 1985-04-02 Sperry Corporation Low cost addressing system for AC plasma panels
DE3231598A1 (de) * 1982-08-25 1984-03-01 Siemens AG, 1000 Berlin und 8000 München Verfahren und vorrichtung zur elektrischen pruefung von mikroverdrahtungen
US4639092A (en) * 1984-10-30 1987-01-27 Westinghouse Electric Corp. Acousto-optic dispersive light filter
US4722596A (en) * 1986-05-13 1988-02-02 Sperry Corporation Acousto-optic analyzer with dynamic signal compression

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004506205A (ja) * 2000-08-05 2004-02-26 ボテスト　ジュステムス　ゲーエムベーハー プリント基板の機能性をテストする方法と装置

Also Published As

Publication number Publication date
EP0286814A2 (de) 1988-10-19
US4904067A (en) 1990-02-27
EP0286814A3 (de) 1990-03-21

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