JPS6454231A - Measurement of surface reflection for transparent material - Google Patents

Measurement of surface reflection for transparent material

Info

Publication number
JPS6454231A
JPS6454231A JP21006887A JP21006887A JPS6454231A JP S6454231 A JPS6454231 A JP S6454231A JP 21006887 A JP21006887 A JP 21006887A JP 21006887 A JP21006887 A JP 21006887A JP S6454231 A JPS6454231 A JP S6454231A
Authority
JP
Japan
Prior art keywords
light
reflected light
sample
reflected
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP21006887A
Other languages
Japanese (ja)
Inventor
Takeo Murakoshi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP21006887A priority Critical patent/JPS6454231A/en
Publication of JPS6454231A publication Critical patent/JPS6454231A/en
Pending legal-status Critical Current

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  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To enable measurement of a surface reflection of an object to be measured such as transparent glass without requiring a pretreatment thereof, by shielding reflected light from the back of an object to be measured structurally to make reflected light alone from the surface thereof incident into a detector. CONSTITUTION:Light irradiated from a light source 1 is focused with a concave mirror 2 to irradiate the surface of a sample 6 with an imaging lens 4 through a fine clearance 3. The sample 6 is set at an opening of an integrating sphere 5 slightly inclined to the optical axis of an irradiation light and the irradiation light is introduced at the other opening thereof. The integrating sphere 5 is provided with a window to admit light into a photodetector 7. The irradiation light is reflected partially from the surface A of the sample 6 while being transmitted partially therethrough and further reflected from the back B thereof while the rest thereof passes through the back face thereof. When an imaging point of the irradiation light is set near the point C at which the back reflected light passes through the surface of the sample, an interval in the luminous flux outer diameter between the surface reflected light and the back reflected light is the greatest near the C of the surface. Thus, a blade tip of a shielding plate 8 is placed near the point C to shield the back reflected light, thereby enabling separation and measurement of the surface reflection of the object being measured from the back reflection thereof.
JP21006887A 1987-08-26 1987-08-26 Measurement of surface reflection for transparent material Pending JPS6454231A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21006887A JPS6454231A (en) 1987-08-26 1987-08-26 Measurement of surface reflection for transparent material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21006887A JPS6454231A (en) 1987-08-26 1987-08-26 Measurement of surface reflection for transparent material

Publications (1)

Publication Number Publication Date
JPS6454231A true JPS6454231A (en) 1989-03-01

Family

ID=16583288

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21006887A Pending JPS6454231A (en) 1987-08-26 1987-08-26 Measurement of surface reflection for transparent material

Country Status (1)

Country Link
JP (1) JPS6454231A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03172728A (en) * 1989-11-30 1991-07-26 Hoya Corp Reflectivity measurement device for light-transmissive member
JP2014215152A (en) * 2013-04-25 2014-11-17 日本分光株式会社 Integrating spher and reflection light measurement method
CN107064070A (en) * 2017-05-02 2017-08-18 北京奥博泰科技有限公司 A kind of device and method for being used to measure the transmittance and reflectivity of double glazing
CN105699333B (en) * 2016-03-15 2018-08-21 中国科学技术大学 The measurement method that environment surface reflectivity is composed in a kind of visible light diffusion communication

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54133180A (en) * 1978-04-06 1979-10-16 Olympus Optical Co Ltd Reflectance measuring apparatus
JPS5960229A (en) * 1982-09-29 1984-04-06 Shimadzu Corp Integrating sphere reflectance measuring device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54133180A (en) * 1978-04-06 1979-10-16 Olympus Optical Co Ltd Reflectance measuring apparatus
JPS5960229A (en) * 1982-09-29 1984-04-06 Shimadzu Corp Integrating sphere reflectance measuring device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03172728A (en) * 1989-11-30 1991-07-26 Hoya Corp Reflectivity measurement device for light-transmissive member
JP2014215152A (en) * 2013-04-25 2014-11-17 日本分光株式会社 Integrating spher and reflection light measurement method
CN105699333B (en) * 2016-03-15 2018-08-21 中国科学技术大学 The measurement method that environment surface reflectivity is composed in a kind of visible light diffusion communication
CN107064070A (en) * 2017-05-02 2017-08-18 北京奥博泰科技有限公司 A kind of device and method for being used to measure the transmittance and reflectivity of double glazing
CN107064070B (en) * 2017-05-02 2018-10-26 北京奥博泰科技有限公司 A kind of device and method for measuring the transmittance and reflectivity of hollow glass

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