JPS6459043A - Automatic fluorescent x-ray analysis system - Google Patents

Automatic fluorescent x-ray analysis system

Info

Publication number
JPS6459043A
JPS6459043A JP62215181A JP21518187A JPS6459043A JP S6459043 A JPS6459043 A JP S6459043A JP 62215181 A JP62215181 A JP 62215181A JP 21518187 A JP21518187 A JP 21518187A JP S6459043 A JPS6459043 A JP S6459043A
Authority
JP
Japan
Prior art keywords
samples
automatic
fluorescent
ray analyzer
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP62215181A
Other languages
Japanese (ja)
Other versions
JPH0643974B2 (en
Inventor
Akira Ubukawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NGK Insulators Ltd
Original Assignee
NGK Insulators Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NGK Insulators Ltd filed Critical NGK Insulators Ltd
Priority to JP62215181A priority Critical patent/JPH0643974B2/en
Priority to US07/235,560 priority patent/US4919342A/en
Priority to EP95115605A priority patent/EP0701120B1/en
Priority to DE3856530T priority patent/DE3856530T2/en
Priority to DE3855906T priority patent/DE3855906T2/en
Priority to EP88308030A priority patent/EP0306276B1/en
Publication of JPS6459043A publication Critical patent/JPS6459043A/en
Priority to US07/414,479 priority patent/US4993646A/en
Priority to US07/471,628 priority patent/US5137410A/en
Priority to US07/854,566 priority patent/US5257302A/en
Publication of JPH0643974B2 publication Critical patent/JPH0643974B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

PURPOSE:To enable the continuous and automatic analyses of many kinds of samples by using an automatic grinding device which can selectively grind many kinds of the samples. CONSTITUTION:The samples ground to prescribed grain sizes by the automatic grinding device are conveyed by a ground sample conveyor 2 to an automatic pressing device 3. The samples molded to a prescribed shape such as, for example, disk shape, in the automatic pressing device 3 are supplied to a fluorescent X-ray analyzer 5 via a partition wall which parts the fluorescent X-ray analyzer 5 and the pretreatment device consisting of the automatic grinding device 1 and the automatic pressing device 3 by a molded sample supply device 4. After the samples are once stored at need, the samples are mounted in the holder of a sample loader 9 by a holder attaching/detaching device 8. The samples are thereafter set to the fluorescent X-ray analyzer 5 by driving of the sample loader 9 and the fluorescent X-ray analysis operation is executed.
JP62215181A 1987-08-31 1987-08-31 X-ray fluorescence automatic analysis system Expired - Fee Related JPH0643974B2 (en)

Priority Applications (9)

Application Number Priority Date Filing Date Title
JP62215181A JPH0643974B2 (en) 1987-08-31 1987-08-31 X-ray fluorescence automatic analysis system
US07/235,560 US4919342A (en) 1987-08-31 1988-08-24 Method of pretreating a sample for X-ray fluorescence analysis
EP88308030A EP0306276B1 (en) 1987-08-31 1988-08-31 Method for vitrifying powdery and granular materials
DE3856530T DE3856530T2 (en) 1987-08-31 1988-08-31 Device for the treatment of powdered, granulated and conglomerated material with associated analysis method
DE3855906T DE3855906T2 (en) 1987-08-31 1988-08-31 Process for vitrifying powdered and granular materials
EP95115605A EP0701120B1 (en) 1987-08-31 1988-08-31 Powdery, granular and conglomerate material treating apparatus and analyzing method using the apparatus
US07/414,479 US4993646A (en) 1987-08-31 1989-09-29 Powdery, granular and conglomerate material treating apparatus
US07/471,628 US5137410A (en) 1987-08-31 1990-01-29 Material supply apparatus for transferring powdery, granular and conglomerated materials
US07/854,566 US5257302A (en) 1987-08-31 1992-03-20 Fluorescent X-ray analyzing system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62215181A JPH0643974B2 (en) 1987-08-31 1987-08-31 X-ray fluorescence automatic analysis system

Publications (2)

Publication Number Publication Date
JPS6459043A true JPS6459043A (en) 1989-03-06
JPH0643974B2 JPH0643974B2 (en) 1994-06-08

Family

ID=16668010

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62215181A Expired - Fee Related JPH0643974B2 (en) 1987-08-31 1987-08-31 X-ray fluorescence automatic analysis system

Country Status (1)

Country Link
JP (1) JPH0643974B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001021457A (en) * 1999-07-12 2001-01-26 Rigaku Industrial Co Analysis system with sample changer
JP2013083638A (en) * 2011-09-30 2013-05-09 Jx Nippon Mining & Metals Corp Sample analysis method and sample analysis system
KR20180073993A (en) * 2016-12-23 2018-07-03 주식회사 포스코 Manufacturing Apparatus for preparing slag sample
CN118443709A (en) * 2024-05-14 2024-08-06 阳新弘盛铜业有限公司 Automatic analysis system and control method for X-ray fluorescence spectrum for powder sample

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5230952U (en) * 1975-08-26 1977-03-04
JPS598145U (en) * 1982-07-07 1984-01-19 住友軽金属工業株式会社 Automatic pretreatment equipment for samples for X-ray analysis

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5230952U (en) * 1975-08-26 1977-03-04
JPS598145U (en) * 1982-07-07 1984-01-19 住友軽金属工業株式会社 Automatic pretreatment equipment for samples for X-ray analysis

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001021457A (en) * 1999-07-12 2001-01-26 Rigaku Industrial Co Analysis system with sample changer
JP2013083638A (en) * 2011-09-30 2013-05-09 Jx Nippon Mining & Metals Corp Sample analysis method and sample analysis system
KR20180073993A (en) * 2016-12-23 2018-07-03 주식회사 포스코 Manufacturing Apparatus for preparing slag sample
CN118443709A (en) * 2024-05-14 2024-08-06 阳新弘盛铜业有限公司 Automatic analysis system and control method for X-ray fluorescence spectrum for powder sample

Also Published As

Publication number Publication date
JPH0643974B2 (en) 1994-06-08

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees