JPS64602Y2 - - Google Patents

Description

[Detailed explanation of the idea]

[Industrial Application Field] This invention relates to an image analysis illumination device that is optimal for use in an image analysis system. [Prior Art] In medicine, geology, metallurgy, etc., image analysis systems are used for structural analysis of structures, compositions, etc. This type of image analysis system scans the actual or photographed form of the test object using a sensor such as a television camera, and identifies the characteristics of the test object based on elements such as the shape, brightness, and hue of the image. It further includes a device and software for measuring the identified figure. The purpose of using such a system is to quantify and speed up image recognition and processing (measurement), which generally tend to rely on human subjectivity, and to extract and emphasize forms that are easy to communicate to a large number of people. It's about doing. This requires processing a large amount of information, and the system was not realized or advanced until recent years when electronic technology advanced. However, with the recent development of semiconductor technology and computer technology,
The performance of image analysis systems is rapidly improving, and the fields and purposes of use are expanding. Along with this, it has become necessary to improve systems that meet individual requirements. FIG. 1 is a block diagram showing an example of a general image analysis system. In this system, a test object SA placed on a sample support stand 2 is electronically scanned by a sensor 1 such as a television camera, and the scanning signal is stored in an image memory 3 as data.
A display device 4 such as a CRT is connected to the image memory 3 and is used for monitoring and image output. Also,
Information in the image memory 3 is sent to an arithmetic unit 5 consisting of a microcomputer or the like, where image input/output processing, storage processing, etc. are performed. A printer 6 is connected to the arithmetic device 5 to print out analysis results and the like. Furthermore, an operation panel 7 is connected to the arithmetic device 5, through which an operator specifies processing contents and the like. [Problem to be solved by the invention] When operating such an image analysis system, the test object SA is placed on the sample support stand 2,
The test object SA is uniformly irradiated with light from the illuminators 8a and 8b. The purpose of uniform irradiation is to accurately obtain brightness information of the test object. However, the inventors have experienced that such uniform illumination often results in inaccurate measurement results from image processing. in particular,
It is seen when measuring grain boundaries of crystals during metallographic analysis. That is, since the brightness of crystal grain boundaries on an image varies depending on the relative angle between the light source and the grain boundaries, depending on the irradiation angle, the grain boundaries may not be recognized as grain boundaries. Particularly, grain boundaries disappear when the test object is uniformly illuminated. An object of the present invention is to provide an illumination device for image analysis that enables accurate measurement in image processing. [Means for solving the problem] The present invention irradiates the test object with light in one direction at a time, and changes the irradiation position of this light continuously or intermittently, so that the grain boundaries become clear. It is designed to capture image signals at certain positions. That is, in order to achieve the above object, the present invention is arranged along the image receiving axis of the sensor on a circumference in which the distance to the test object can be adjusted, and is arranged continuously or one at a time from a plurality of selected directions. The present invention provides an illumination device for image analysis having an illuminator that irradiates light onto a test object in each direction. [Operation] Figures 2a and 2b are explanatory diagrams showing the principle of the present invention. In FIGS. 2a and 2b, the illumination lamp L revolves around the orbit OR above the test object SA. in this case,
The illumination lamp L continuously illuminates the test object SA no matter where it is located on the orbit OR. orbit
While moving the lamp L continuously or continuously on the OR, the state of the grain boundaries is monitored on the display device 4,
The image when the grain boundaries are most clear is imported into the system. However, this operation assumes manual operation. In order to further improve operability and efficiency, it is sufficient to automatically capture a plurality of images at a plurality of positions for one measurement of an initial image. In other words, the test object SA is sequentially illuminated from various directions, and images are captured each time and processed within the system to create, for example, a binarized image of grain boundaries (a 1-bit image digitized into only two bright and dark parts). It is stored in the image memory 3 as . The image memory 3 in this case needs to have an image memory for storing a plurality of initial images or an image memory for storing a plurality of binarized images. By forming an OR image or a NOR image of the captured binarized image, the complete appearance of grain boundaries can be recognized. To obtain the multiple images required for the above processing,
Although the sensor 1 may be moved with the light source at a fixed position, it is easier to rotate the irradiation light source. [Embodiment] FIG. 3 is a front sectional view showing an embodiment of the present invention, and FIG. 4 is a sectional view taken along the negative side of the embodiment of FIG. The illuminator 10 has a built-in lamp and a motor, and rotates around the inner circumference of the internal gear 11 while meshing with the internal gear 11 disposed above the test object SA. As shown in FIG. 5, the structure of the illuminator 10 includes a gear 12 meshing with an internal gear 11;
It consists of a motor 13 that drives the motor 13 and a lamp (not shown), and is slidably suspended from the rail 21. The power supply to the lamp and motor 13 is as follows:
A brush 14a provided on the upper part of the case of the illuminator 10,
14b and the sliding electrode 9 provided on the top surface of the rail 21
a, 9b. When the motor 13 is energized, the illuminator 10 begins to move on the circumferential surface of the internal gear 11 and rotates on a constant orbit. Therefore, the SA surface of the test object receives obliquely upward irradiation light from any direction within 360 degrees. Therefore, by capturing several images while the illuminator 10 is rotating, grain boundaries can be completely recognized. Note that the internal gear 11 and the illuminator 10 are
The irradiation direction for SA can be freely selected.
Its height can be arbitrarily adjusted using a stopper 22. Further, a hood 20 is provided between the internal gear 11 and the sample support stand 2 to block external light and support the internal gear 11. Examples of photographs of grain boundary images obtained by sequentially irradiating from three directions using this device are shown in FIGS. 6a, b, and c. Incidentally, FIG. 7 shows an example of an image taken using a uniform irradiation light source using a conventional irradiation device. As is clear from the comparison between FIGS. 6a to 6c and FIG. 7, the grain boundary images according to the present invention are superior in terms of clarity of grain boundaries. At the same time, according to each of FIGS. 6a to 6c, it can be seen that all grain boundaries cannot be detected by light irradiation from only one direction. Therefore, to completely understand the grain boundary image, it can be said that images obtained by irradiating light from a plurality of different directions are required. Next, the results of comparison between the number of crystal grains measured by the present invention and the number of crystal grains measured by a conventional device will be shown.

[Effect of idea]

According to the present invention, it is possible to perform image processing with high accuracy, which was difficult to process when using a conventional uniform light source.

[Brief explanation of the drawing]

FIG. 1 is a block diagram showing an example of a general image analysis system, FIG. 2 is an explanatory diagram showing the principle of the present invention, FIG. The figures are a cross-sectional view of the embodiment shown in FIG. 3 on the negative plane, FIG.
Figures a, b, and c are photographs showing the grain boundary state taken using the device of the present invention, and Fig. 7 is a photograph showing the grain boundary state according to the conventional example. 1...sensor, 2...sample support stand, 3...
Image memory, 4...Display device, 5...Arithmetic device,
6...Printer, 7...Operation panel, 9a, 9b...
Sliding electrode, 10...Illuminator, 11...Internal gear, 1
2...Gear, 13...Motor, 14a, 14b...
...Brush, 20...Hood, 21...Rail, 2
2...stoppa.

Claims (1)

[Claims for Utility Model Registration] An image analysis device that captures the actual or photographic form of a test object using a sensor and converts it into an image, and identifies the characteristics of the test object based on its shape, brightness, hue, etc. It has an illuminator that is arranged on a circumference along the image receiving axis and whose distance to the test object can be adjusted and irradiates the test object with light from one direction at a time from a plurality of continuous or selected directions. A lighting device for image analysis characterized by the following.