JPS6463251A - Ion source for mass analyzer - Google Patents
Ion source for mass analyzerInfo
- Publication number
- JPS6463251A JPS6463251A JP62219323A JP21932387A JPS6463251A JP S6463251 A JPS6463251 A JP S6463251A JP 62219323 A JP62219323 A JP 62219323A JP 21932387 A JP21932387 A JP 21932387A JP S6463251 A JPS6463251 A JP S6463251A
- Authority
- JP
- Japan
- Prior art keywords
- porous member
- primary beam
- inlet pipe
- sample solution
- ion source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000012488 sample solution Substances 0.000 abstract 3
- 230000001678 irradiating effect Effects 0.000 abstract 2
- 239000000523 sample Substances 0.000 abstract 1
- 230000035945 sensitivity Effects 0.000 abstract 1
- 239000002904 solvent Substances 0.000 abstract 1
Landscapes
- Electron Tubes For Measurement (AREA)
Abstract
PURPOSE:To secure such an ion source that makes improvement in sensitivity promotable while preventing a memory phenomenon from occurring by connecting the tip of an inlet pipe to the end of a porous member. CONSTITUTION:An open end of an inlet pipe 7 is attached to an upper outer circumferential surface (end) of dislike porous member 10 whereby a sample solution S flows in the porous member along a primary beam irradiating surface A of the said porous member. The sample solution S taken out of the inlet pipe 7 flows inside the porous member 10 along the surface A, moving to the lower part, and then it goes out of the porous member 10. In a process of the movement, a solvent component in the sample solution is gasified, and thereby content of the sample component is going to increase. From the standpoint of equilibrium between travel speed and a degree of concentration, a primary beam passing hole 14 is set up in the central part, and if a primary beam irradiating area is restricted so as to cause a primary beam to be irradiated to this part alone, such efficient ionization that is much in the generated ion quantity is performable while preventing a memory phenomenon from occurring.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62219323A JPH0748372B2 (en) | 1987-09-02 | 1987-09-02 | Ion source for mass spectrometer |
| US07/136,141 US4818863A (en) | 1986-12-27 | 1987-12-21 | Ion source for use in a mass spectrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62219323A JPH0748372B2 (en) | 1987-09-02 | 1987-09-02 | Ion source for mass spectrometer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6463251A true JPS6463251A (en) | 1989-03-09 |
| JPH0748372B2 JPH0748372B2 (en) | 1995-05-24 |
Family
ID=16733669
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62219323A Expired - Fee Related JPH0748372B2 (en) | 1986-12-27 | 1987-09-02 | Ion source for mass spectrometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0748372B2 (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61116065U (en) * | 1984-12-28 | 1986-07-22 |
-
1987
- 1987-09-02 JP JP62219323A patent/JPH0748372B2/en not_active Expired - Fee Related
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61116065U (en) * | 1984-12-28 | 1986-07-22 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0748372B2 (en) | 1995-05-24 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |