JPS646751A - Quantification of inclusion and deposit - Google Patents
Quantification of inclusion and depositInfo
- Publication number
- JPS646751A JPS646751A JP62142442A JP14244287A JPS646751A JP S646751 A JPS646751 A JP S646751A JP 62142442 A JP62142442 A JP 62142442A JP 14244287 A JP14244287 A JP 14244287A JP S646751 A JPS646751 A JP S646751A
- Authority
- JP
- Japan
- Prior art keywords
- time
- rays
- measurement
- characteristic
- conversion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
PURPOSE:To measure the kinds, numbers and sizes of inclusions and deposits existing in a sample to be analyzed, quantitatively in a short time, by subjecting a plurality of measured values of the intensity of characteristic X-rays and a measured value of the intensity of reflection electrons to picture analysis simultaneously. CONSTITUTION:When the intensities of reflection electrons and characteristic X-rays are measured separately, the measuring conditions of an X-ray microanalyzer are so set that a current value ImuA of the characteristic X-rays is 10<-3> through 10 while an electron beam application time msec for one picture element is 1<-1> through 1,000, and that a current value ImuA of the reflection electrons is 10<-5> through 1 while the electron beam application time msec in nT0 through 10. herein mark T0 denotes an AD conversion time msec for converting an analog signal into a digital signal, and (n) the number of times of AD conversion for a picture element. Since the AD conversion time is 0.05msec and the number of times of the AD conversion is 1-5 generally, a time for measurement of the reflection electrons is 0.25msec even when it is long, and so it is much shorter than one required for measurement of the characteristic X-rays. Therefore the time for measurement of the reflection electrons is not varied even when the time of application thereof is made long, and thus the measurement is completed in a short time.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62142442A JPS646751A (en) | 1987-02-28 | 1987-06-08 | Quantification of inclusion and deposit |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4656887 | 1987-02-28 | ||
| JP62142442A JPS646751A (en) | 1987-02-28 | 1987-06-08 | Quantification of inclusion and deposit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS646751A true JPS646751A (en) | 1989-01-11 |
Family
ID=26386666
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62142442A Pending JPS646751A (en) | 1987-02-28 | 1987-06-08 | Quantification of inclusion and deposit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS646751A (en) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5934863A (en) * | 1982-08-19 | 1984-02-25 | Shuzo Nakazono | Preparation of extract component from biological raw material |
| JPS5934864A (en) * | 1982-08-19 | 1984-02-25 | Shuzo Nakazono | Preparation of tasting component from biological raw material |
| JP2002062270A (en) * | 2000-08-21 | 2002-02-28 | Jeol Ltd | Surface analysis data display method in surface analyzer using electron beam |
| JP2004163135A (en) * | 2002-11-11 | 2004-06-10 | Jeol Ltd | X-ray analyzer |
| JP2007155515A (en) * | 2005-12-06 | 2007-06-21 | Jeol Ltd | Particle analysis method and apparatus |
| JP2017142242A (en) * | 2016-02-05 | 2017-08-17 | 住友金属鉱山株式会社 | Method for analyzing simple sulfur distribution |
| JP2018072120A (en) * | 2016-10-27 | 2018-05-10 | 新日鐵住金株式会社 | Steel inclusion identification method |
| JP2019120622A (en) * | 2018-01-09 | 2019-07-22 | 日本製鉄株式会社 | Particulate classification device, quality evaluation device, electron beam device, particulate classification method, quality evaluation method, and program |
-
1987
- 1987-06-08 JP JP62142442A patent/JPS646751A/en active Pending
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5934863A (en) * | 1982-08-19 | 1984-02-25 | Shuzo Nakazono | Preparation of extract component from biological raw material |
| JPS5934864A (en) * | 1982-08-19 | 1984-02-25 | Shuzo Nakazono | Preparation of tasting component from biological raw material |
| JP2002062270A (en) * | 2000-08-21 | 2002-02-28 | Jeol Ltd | Surface analysis data display method in surface analyzer using electron beam |
| JP2004163135A (en) * | 2002-11-11 | 2004-06-10 | Jeol Ltd | X-ray analyzer |
| JP2007155515A (en) * | 2005-12-06 | 2007-06-21 | Jeol Ltd | Particle analysis method and apparatus |
| JP2017142242A (en) * | 2016-02-05 | 2017-08-17 | 住友金属鉱山株式会社 | Method for analyzing simple sulfur distribution |
| JP2018072120A (en) * | 2016-10-27 | 2018-05-10 | 新日鐵住金株式会社 | Steel inclusion identification method |
| JP2019120622A (en) * | 2018-01-09 | 2019-07-22 | 日本製鉄株式会社 | Particulate classification device, quality evaluation device, electron beam device, particulate classification method, quality evaluation method, and program |
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