JPS647247A - Multiprocessor system - Google Patents

Multiprocessor system

Info

Publication number
JPS647247A
JPS647247A JP16348187A JP16348187A JPS647247A JP S647247 A JPS647247 A JP S647247A JP 16348187 A JP16348187 A JP 16348187A JP 16348187 A JP16348187 A JP 16348187A JP S647247 A JPS647247 A JP S647247A
Authority
JP
Japan
Prior art keywords
common memory
slave processor
data
timer
abnormality
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16348187A
Other languages
Japanese (ja)
Inventor
Takayuki Koshi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Komatsu Ltd
Original Assignee
Komatsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Komatsu Ltd filed Critical Komatsu Ltd
Priority to JP16348187A priority Critical patent/JPS647247A/en
Publication of JPS647247A publication Critical patent/JPS647247A/en
Pending legal-status Critical Current

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  • Multi Processors (AREA)

Abstract

PURPOSE:To easily design a software by detecting that the abnormal condition of a slave processor is generated with the output of the data of a prescribed value to the data bus of a common memory. CONSTITUTION:A timer 11 set by a slave processor in a prescribed period, a logical gate 12 to control a covalent memory 1 to an impossible condition for reading and writing at the time-out time of the timer 11 and a resistance 13 to set the data output at a prescribed value when the common memory 1 is in the impossible condition for reading and writing are equipped. When a data output obtained by an access to the common memory 1 is a prescribed value a master processor detects it as a slave processor abnormality. Namely, when an abnormality is generated in the slave processor, a time-out is obtained without resetting the timer and an access to the common memory is executed by the master processor to data transmitting and receiving as needed. However, the common memory is controlled to the impossible condition for reading and writing. Accordingly, to detect the abnormality of the slave processor, it is not necessary to provide a special input and output gate and a software is easily designed.
JP16348187A 1987-06-30 1987-06-30 Multiprocessor system Pending JPS647247A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16348187A JPS647247A (en) 1987-06-30 1987-06-30 Multiprocessor system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16348187A JPS647247A (en) 1987-06-30 1987-06-30 Multiprocessor system

Publications (1)

Publication Number Publication Date
JPS647247A true JPS647247A (en) 1989-01-11

Family

ID=15774694

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16348187A Pending JPS647247A (en) 1987-06-30 1987-06-30 Multiprocessor system

Country Status (1)

Country Link
JP (1) JPS647247A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5157484A (en) * 1989-10-23 1992-10-20 Vision Iii Imaging, Inc. Single camera autosteroscopic imaging system
US5347363A (en) * 1991-07-25 1994-09-13 Kabushiki Kaisha Toshiba External lead shape measurement apparatus for measuring lead shape of semiconductor package by using stereoscopic vision

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5157484A (en) * 1989-10-23 1992-10-20 Vision Iii Imaging, Inc. Single camera autosteroscopic imaging system
US5347363A (en) * 1991-07-25 1994-09-13 Kabushiki Kaisha Toshiba External lead shape measurement apparatus for measuring lead shape of semiconductor package by using stereoscopic vision

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