JPS6474468A - Testing device for integrated circuit - Google Patents

Testing device for integrated circuit

Info

Publication number
JPS6474468A
JPS6474468A JP62233109A JP23310987A JPS6474468A JP S6474468 A JPS6474468 A JP S6474468A JP 62233109 A JP62233109 A JP 62233109A JP 23310987 A JP23310987 A JP 23310987A JP S6474468 A JPS6474468 A JP S6474468A
Authority
JP
Japan
Prior art keywords
test
pattern
test pattern
derivative
storage part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62233109A
Other languages
Japanese (ja)
Inventor
Sadaaki Tanaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP62233109A priority Critical patent/JPS6474468A/en
Publication of JPS6474468A publication Critical patent/JPS6474468A/en
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE:To measure a main grade and derivative grades simultaneously by plural measurement parts without increasing its storage capacity by providing a pattern name conversion part between a control part and a storage part and converting test pattern names which are used for a function test by the measurement parts. CONSTITUTION:When a test pattern is written in a pattern storage part 4 through an input/output part 1, written test pattern names are stored previously in a pattern name storage part 10M corresponding to the measurement parts and when the control part 2 reads a test program out of a storage part 3, a judgement part 10J judges whether the test program is for the derivative grades which are different only in test pattern name or not and when so, the pattern name conversion part 10 changes only the part of the test pattern name for the main grade where is described in the test pattern into the test pattern for the derivative grades registered previously in the pattern name storage part 10M corresponding to a measurement part which conducts the test and then outputs the program to the control part 2.
JP62233109A 1987-09-16 1987-09-16 Testing device for integrated circuit Pending JPS6474468A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62233109A JPS6474468A (en) 1987-09-16 1987-09-16 Testing device for integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62233109A JPS6474468A (en) 1987-09-16 1987-09-16 Testing device for integrated circuit

Publications (1)

Publication Number Publication Date
JPS6474468A true JPS6474468A (en) 1989-03-20

Family

ID=16949913

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62233109A Pending JPS6474468A (en) 1987-09-16 1987-09-16 Testing device for integrated circuit

Country Status (1)

Country Link
JP (1) JPS6474468A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009294046A (en) * 2008-06-04 2009-12-17 Fujitsu Ltd Integrated circuit board with jtag (joint test action group) function

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009294046A (en) * 2008-06-04 2009-12-17 Fujitsu Ltd Integrated circuit board with jtag (joint test action group) function

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